LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 10th DAY OF March, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
N.E. Chemcat Corporation: See--
Nagata, Makoto; and Hihara, Takashi
07501105 Cl. 423-213.2.
N.V. Organon: See--
Gossen, Jan Albert; and Van den Boogaart, Paul
07501273 Cl. 435-227.
Na, Byong-Do: See--
Jung, Ok-Sun; Kang, Hee-Chul; Na, Byong-Do; Hwang, Young-Jin; Lee, Do-Woo; Kim, Yong-Hwan; and Seo, Hee-Ju
07501590 Cl. 177-52.
Nabetani, Toshihisa; Adachi, Tomoko; Tandai, Tomoya; Nonin, Katsuya; and Kaburaki, Satoshi, to Kabushiki Kaisha Toshiba Radio communication apparatus, method and program
07502330 Cl. 370-252.
Nabors, C. David: See--
Schleuning, David; Nabors, C. David; and Austin, R. Russel
07502398 Cl. 372-36.
Nabtesco Corporation: See--
Noda, Hideki; Murakami, Masao; Uno, Koji; Matsushita, Kentaro; Hamano, Takubi; Saito, Takeshi; and Sato, Yasushi
07501588 Cl. 174-382.
Nadeau, Jr., Bruce E.: See--
Rock, Kelly P.; and Nadeau, Jr., Bruce E.
07500464 Cl. 123-251.
Nafie, Mohammed: See--
Dabak, Anand G.; Schmidl, Timothy M.; and Nafie, Mohammed
07502591 Cl. 455-41.2.
Nagafuji, Pamela: See--
Bannister, Thomas; Celatka, Cassandra; Chandrakumar, Nizal S.; Deng, Hongfeng; Guo, Zihong; Jin, Lei; Lazarova, Tsvetelina; Lin, Jian; Moe, Scott T.; Nagafuji, Pamela; Navia, Manuel; Ripka, Amy; Rynkiewicz, Michael J.; Spear, Kerry L.; Stickler, James E.; and Xie, Roger
07501404 Cl. 514-210.02.
Nagai, Hideo; to Panasonic Corporation Semiconductor light emitting device, lighting module, illumination apparatus, surface mount LED, and bullet LED
07501657 Cl. 257-79.
Nagai, Hiroyuki: See--
Ishikawa, Makoto; Tsurumaki, Hirokazu; Kikuchi, Masahiro; and Nagai, Hiroyuki
07501896 Cl. 330-296.
Nagai, Ryozo: See--
Kadowaki, Takashi; Yamauchi, Toshimasa; Nagai, Ryozo; and Kamon, Junji
07501490 Cl. 530-350.
Nagai, Takeshi; Kikuchi, Yoshihiro; and Masuda, Tadaaki, to Kabushiki Kaisha Toshiba Data transmission apparatus and method
07502975 Cl. 714-717.
Nagai, Yuki: See--
Ishizaki, Hideaki; Takahashi, Wataru; Ushiro, Kuniko; and Nagai, Yuki
07500755 Cl. 353-28.
Nagamine, Takatomo: See--
Miura, Satoshi; Nagamine, Takatomo; Mito, Yumiko; and Ueshima, Jun
07502077 Cl. 348-691.
Nagamune, Teruyuki; Miyake, Jun; Miyake, Masato; and Kato, Koichi, to National Institute of Advanced Industrial Science and Technology Immobilized cells and liposomes and method of immobilizing the same
07501280 Cl. 435-325.
Nagano, Motohiko: See--
Kawamoto, Yoji; Ishiguro, Ryuji; Ezura, Yuichi; and Nagano, Motohiko
07503073 Cl. 726-27.
Naganuma, Kaori; to Sony Corporation Semiconductor laser assembly
07502397 Cl. 372-36.
Nagasaka, Masahiko: See--
Zenpo, Toshihiko; Kato, Yusuke; Asano, Norihiro; Nagasaka, Masahiko; Nishikawa, Kazuyuki; and Tanaka, Motoyasu
07500840 Cl. 425-4R.
Nagashima, Kenji; to Funai Electric Co., Ltd. Diffraction grating for plural wavelengths, optical pickup apparatus and optical disk apparatus using diffraction grating for plural wavelengths
07502301 Cl. 369-112.11.
Nagata, deceased, Katsuaki; and Nagata, legal representative, Yoshiko, to Naltec, Inc. Method of preparing bit map
07502144 Cl. 358-3.27.
Nagata, Kiyoshi: See--
Inuzuka, Yukio; Nagata, Kiyoshi; and Yagi, Satoshi
07500820 Cl. 415-55.1.
Nagata, legal representative, Yoshiko: See--
Nagata, deceased, Katsuaki
07502144 Cl. 358-3.27.
Nagata, Makoto; and Hihara, Takashi, to N.E. Chemcat Corporation NOx reduction catalyst having excellent low-temperature characteristics
07501105 Cl. 423-213.2.
Nagel, Willi: See--
Baumann, Dietmar; Hofmann, Dirk; Vollert, Herbert; Nagel, Willi; Henke, Andreas; Foitzik, Bertram; and Goetzelmann, Bernd
07502973 Cl. 714-47.
Nagravision S.A.: See--
Kudelski, Henri; Le Buhan, Corinne; and Moreillon, Guy
07502473 Cl. 380-233.
Naik, Jarpla Pura; Desikacharya Sampathu, Sathyagalam Ranganatha; Madhava-Naidu, Madeneni; and Sowbhagya, Halagur Bogegowda, to Council of Scientific and Industrial Research Process for the preparation of colorant from oleoresin
07501141 Cl. 426-540.
Nair, Balakrishnan V.; to Delphi Technologies, Inc. Optimization by using output drivers for discrete input interface
07502963 Cl. 714-25.
Naito, Yutaka; Aoki, Kazuo; Abe, Masatomi; and Kaneko, Kazuya, to Alps Electric Co., Ltd. Magnetic core using amorphous soft magnetic alloy
07501925 Cl. 336-233.
Naka, Yoji; Senba, Takehiko; and Manabe, Mitsuo, to FUJIFILM Corporation Driving device and optical instrument
07501741 Cl. 310-328.
Nakabayashi, Katsuyuki: See--
Eto, Takuya; Ikemura, Kazuhiro; Toyoda, Eiji; Nakabayashi, Katsuyuki; and Tsukahara, Daisuke
07501711 Cl. 257-787.
Nakabayashi, Takaya; and Fujii, Akiyoshi, to Sharp Kabushiki Kaisha Pattern formation substrate and method for pattern formation
07501156 Cl. 427-256.
Nakabe, Futoshi: See--
Ueda, Eiji; Kawano, Shinji; and Nakabe, Futoshi
07503051 Cl. 719-313.
Nakadate, Mami; and Itoh, Nobutaka, to Fujitsu Limited Device, method and program for optimization analysis
07502714 Cl. 702-182.
Nakagawa, Hirotaka; Yamamoto, Masayuki; and Kaneda, Yasunori, to Hitachi, Ltd. Method, device and program for managing volume
07502907 Cl. 711-170.
Nakagawa, Keiji: See--
Hikida, Takahisa; Nakagawa, Keiji; and Yasukawa, Hiroyuki
07501044 Cl. 162-358.4.
Nakagawa, Masamichi: See--
Okamoto, Shusaku; Nakagawa, Masamichi; Morimura, Atsushi; Mizusawa, Kazufumi; Iisaka, Atsushi; and Yoshida, Takashi
07502048 Cl. 348-148.
Nakagawa, Matsuyoshi: See--
Fujisawa, Takeshi; and Nakagawa, Matsuyoshi
07501474 Cl. 525-68.
Nakagawa, Shigeru; to International Business Machines Corporation VCSEL for high speed lower power optical link
07501294 Cl. 438-22.
Nakagawa, Shouichi; and Yamashita, Michihiro, to Kabushiki Kaisha Toshiba X-ray CT apparatus and medical data communication link system
07502438 Cl. 378-15.
Nakagi, Wataru: See--
Takeuchi, Osamu; Ito, Eiji; and Nakagi, Wataru
07501182 Cl. 428-423.1.
Nakagomi, Hiroshi: See--
Higaki, Akiharu; and Nakagomi, Hiroshi
07500663 Cl. 270-58.12.
Nakaguchi, Tomonori: See--
Ishikawa, Teruhisa; Osawa, Yoshiki; Funaki, Mitsuru; Nakaguchi, Tomonori; and Nishimori, Junya
07501201 Cl. 429-162.
Nakahara, Naoto; to Hoya Corporation Focus detection method and focus detection apparatus
07502065 Cl. 348-353.
Nakai, Kiyoshi: See--
Fuji, Yukio; Asano, Isamu; Kawagoe, Tsuyoshi; and Nakai, Kiyoshi
07502252 Cl. 365-163.
Nakai, Sadao: See--
Kawashima, Toshiyuki; Kanabe, Tadashi; Nakai, Sadao; and Kan, Hirofumi
07502396 Cl. 372-34.
Nakajima, Fumio; Negishi, Toshihiro; and Uehara, Masahiro, to Mitsuba Corporation Miniature motor
07501736 Cl. 310-239.
Nakajima, Kaiyo: See--
Mishima, Yoshitaka; and Nakajima, Kaiyo
07500969 Cl. 604-385.201.
Nakajima, Shigeto; to NEC Electronics Corporation Power supply apparatus
07501716 Cl. 307-38.
Nakajima, Takahiro; Gyobu, Shoichi; and Taguchi, Hiroaki, to Toyo Boseki Kabushiki Kaisha Polymerization catalyst for polyester production, polyester, and process for producing polyester
07501373 Cl. 502-150.
Nakajima, Takeaki: See--
Kobayashi, Kazuhiro; Nakajima, Takeaki; Hokazono, Shoichi; Murabayashi, Shinya; Yamazaki, Hideharu; Hirose, Kenji; Kumakura, Takeshi; and Terata, Shukoh
07500473 Cl. 123-509.
Nakajima, Yoshinori: See--
Yuki, Osamu; Nakajima, Yoshinori; and Kondo, Shigeki
07502000 Cl. 345-77.
Nakamura, Hikaru; to Alpine Electronics, Inc. Vehicle navigation apparatus and method with traveling direction indication at guidance intersection
07502685 Cl. 701-211.
Nakamura, Hirofumi; to Fuji Xerox Co., Ltd. Inkjet recording head and inkjet recording device
07500734 Cl. 347-68.
Nakamura, Hiroyuki: See--
Nishimura, Kazunori; Igaki, Tsutomu; Matsunami, Ken; and Nakamura, Hiroyuki
07501917 Cl. 333-195.
Nakamura, Kiyoharu: See--
Otomo, Akihiro; and Nakamura, Kiyoharu
07500725 Cl. 303-119.3.
Nakamura, Kozo: See--
Okude, Mariko; Kamiwaki, Tadashi; Endo, Yoshinori; Hiroshige, Hideo; and Nakamura, Kozo
07502674 Cl. 701-36.
Nakamura, Mitsuaki; to Sharp Kabushiki Kaisha Network terminal, network system, method of controlling network terminal, and program
07502381 Cl. 370-432.
Nakamura, Osamu: See--
Hamada, Takashi; Murakami, Satoshi; Yamazaki, Shunpei; Nakamura, Osamu; Kajiwara, Masayuki; Koezuka, Junichi; and Takayama, Toru
07501671 Cl. 257-223.
Nakamura, Shuji: See--
Nishino, Takeshi; Nakamura, Shuji; Kiryu, Koichi; and Kobayashi, Kazuo
07502013 Cl. 345-157.
Nishino, Takeshi; Nakamura, Shuji; Kiryu, Koichi; and Kobayashi, Kazuo
07502014 Cl. 345-157.
Nakamura, Tomoyuki: See--
Sasabayashi, Takehisa; Ishihara, Masayuki; Nakamura, Tomoyuki; and Sano, Harunobu
07501371 Cl. 501-138.
Nakane, Hiroshi: See--
Hayashi, Yasuhiro; Nakane, Hiroshi; and Sugiyama, Kazumi
07502286 Cl. 369-44.32.
Nakane, Naoki: See--
Tokumoto, Yoshitomo; Takayama, Shingo; Nozaki, Mikio; and Nakane, Naoki
07500408 Cl. 73-862.334.
Nakanishi, Ryuta: See--
Tanaka, Tetsuya; Okabayashi, Hazuki; Nakanishi, Ryuta; Kiyohara, Tokuzo; Yamamoto, Takao; and Kaneko, Keisuke
07502887 Cl. 711-128.
Nakano, Hiroaki: See--
Rosin, Robert; Hsu, P. Robert; Sonoda, Yumie; Niijima, Makoto; and Nakano, Hiroaki
07503057 Cl. 725-44.
Nakano, Kazuyuki; Tanaka, Youichi; Saitoh, Hiroyoshi; and Hada, Junichi, to Panasonic Corporation Illumination device, recognizing device with the illumination device, and part mounting device
07502170 Cl. 359-627.
Nakano, Shuusaku: See--
Ohmori, Yutaka; Sakamoto, Michie; Nakano, Shuusaku; Konishi, Takahisa; and Umemoto, Seiji
07501165 Cl. 428-1.3.
Nakano, Yuichiro; and Hara, Takahiro, to Kyowa Hakko Food Specialities Co., Ltd. Liquid food/drink containing fat-soluble vitamin and method of stabilizing fat-soluble vitamin
07501138 Cl. 426-72.
Nakao, Kengo; and Fujiyama, Norihito, to Denso Corporation Ignition coil having plug cap
07501923 Cl. 336-90.
Nakao, Yoshizumi; Toyoda, Takashi; and Masaki, Yasuo, to Funai Electric Co., Ltd. Compound-eye imaging device
07501610 Cl. 250-208.1.
Nakashima, Atsuhisa; to Brother Kogyo Kabushiki Kaisha Image forming apparatus
07500664 Cl. 271-10.1.
Nakashima, Shigeo: See--
Sato, Takehiko; and Nakashima, Shigeo
07502553 Cl. 396-55.
Nakata, Hiroshi; Kageyama, Nobuyuki; Iwata, Koji; Shimizu, Tetsuo; and Kami, Chikara, to JFE Steel Corporation Hot-rolled steel strip for high strength electric resistance welding pipe and manufacturing method thereof
07501030 Cl. 148-320.
Nakata, Yohei; Inoue, Keisuke; and Sakata, Junichiro, to Sony Corporation Information processing apparatus, information processing method, and storage medium
07502657 Cl. 700-94.
Nakatani, Masaya; Oka, Hiroaki; and Emoto, Fumiaki, to Panasonic Corporation Extracellular potential measuring device and method for fabricating the same
07501278 Cl. 435-288.4.
Nakaya, Kazuyoshi; to Murata Manufacturing Co., Ltd Module-testing device
07502706 Cl. 702-117.
Nakayaka, Susumu: See--
Takahashi, Akeshi; Yoshikawa, Tomio; Huang, Baiying; Nozawa, Shigekazu; Nakayaka, Susumu; Koharagi, Haruo; and Kikuchi, Satoshi
07501734 Cl. 310-216.
Nakayama, Hideo: See--
Kuwata, Yasuaki; Nakayama, Hideo; Murakami, Akemi; Ishii, Ryoji; and Mukoyama, Naotaka
07502566 Cl. 398-182.
Nakayama, Hiroshi; Takeuchi, Atsushi; and Arima, Mitsuo, to Sony Corporation Optical recording medium
07502308 Cl. 369-275.4.
Nakayama, Keisuke: See--
Hiroi, Yoshiomi; Kishioka, Takahiro; Nakayama, Keisuke; and Sakamoto, Rikimaru
07501229 Cl. 430-325.
Nakayama, Masayoshi: See--
Mabuchi, Hiroyuki; Nakayama, Masayoshi; and Ooyoshi, Hirobumi
07502579 Cl. 399-267.
Nakazawa, Fumihiko: See--
Katsuki, Takashi; Sano, Satoshi; Takahashi, Yuji; and Nakazawa, Fumihiko
07502015 Cl. 345-173.
Nally, Martin P.: See--
Berg, Daniel C.; Fraenkel, Michael L.; Nally, Martin P.; Rich, Lawrence S.; and Schacher, Ritchard L.
07503034 Cl. 717-120.
Naltec, Inc.: See--
Nagata, deceased, Katsuaki
07502144 Cl. 358-3.27.
Nam, Jeong W.: See--
Barbee, Steven G.; Nam, Jeong W.; Ontalus, Viorel; and Song, Yuusheng
07502658 Cl. 700-109.
Nam, Kyung-tai: See--
Jeon, Young-jun; and Nam, Kyung-tai
07502055 Cl. 348-231.2.
Nam, Seung Hee: See--
Ahn, Byung Chul; Yoo, Soon Sung; Kwon, Oh Nam; Chang, Youn Gyoung; Cho, Heung Lyul; Nam, Seung Hee; and Oh, Jae Young
07501298 Cl. 438-30.
Namdev, Nivedita D.: See--
Lapierre, Jean-Marc; Namdev, Nivedita D.; Ashwell, Mark A.; France, Dennis S.; Wu, Hui; Hutchins, Patrick M.; Tandon, Manish; Liu, Yanbin; Link, Jeff S.; Ali, Syed M.; Brassard, Chris J.; Nicewonger, Robb B.; Filikov, Anton; and Carazza, Rebecca J.
07501430 Cl. 514-275.
Namiki, Hideo; and Oomori, Yoshiaki, to NEC Corporation Wireless communication terminal and control method thereof
07502613 Cl. 455-435.1.
Nanogen Recognomics GmbH: See--
Miculka, Christian; Windhab, Norbert; Brandstetter, Tilmann; and Burdinski, Gerhard
07501506 Cl. 536-26.9.
Nanometrics Incorporated: See--
Raymond, Chris; Hummel, Steve; and Liu, Sean
07502101 Cl. 356-237.1.
Nanosys, Inc.: See--
Heald, David L.; Cruden, Karen Chu; Duan, Xiangfeng; Liu, Chao; and Parce, J. Wallace
07501315 Cl. 438-128.
Naoe, Hitoshi: See--
Osawa, Shohei; Naoe, Hitoshi; Fukae, Fumihiro; and Sakai, Koji
07502612 Cl. 455-426.2.
Nappa, Mario J.: See--
Minor, Barbara Haviland; Nappa, Mario J.; and Leck, Thomas J.
07501074 Cl. 252-68.
Nappa, Michael J.: See--
Nappa, Thomas P.; and Nappa, Michael J.
07500968 Cl. 604-349.
Nappa, Thomas P.; and Nappa, Michael J. Unidirectional urine collection reservoir
07500968 Cl. 604-349.
Nara, Takashi: See--
Joichi, Norio; Takahashi, Atsushi; Peng, Youbao; Sasamoto, Yoshihito; Katayama, Yoshiki; and Nara, Takashi
07502045 Cl. 347-238.
Narayan, Vishwanath: See--
Bou-Ghannam, Akram; and Narayan, Vishwanath
07502822 Cl. 709-203.
Narayanaswami, Chandrasekhar; Raghunath, Mandayam Thondanur; Caceres, Ramon; and Berger, Stefan, to International Business Machines Corporation Sensor for imaging inside equipment
07502068 Cl. 348-373.
Nardini, Lewis: See--
Agarwala, Manisha; Nardini, Lewis; and Anderson, Timothy D.
07502727 Cl. 703-23.
Narendar, Yeshwanth; and Buckley, Richard F., to Saint-Gobain Ceramics & Plastics, Inc. High purity silicon carbide wafer boats
07501370 Cl. 501-88.
Narikiyo, Takahisa: See--
Ono, Yasuhiro; Saka, Masaki; Oda, Ayumu; and Narikiyo, Takahisa
07502046 Cl. 347-242.
Narishima, Hidetaka: See--
Hanamura, Teruhisa; Narishima, Hidetaka; and Yajima, Takashi
07500660 Cl. 267-273.
Narita, Shusuke; Takagi, Toshihiro; Miyagawa, Tatsuo; Inui, Yasuhiro; and Katayama, Takahiro, to Funai Electric Co., Ltd. Television signal receiver and mobile phone equipped with the same
07502074 Cl. 348-559.
Narumi, Kaoru; to K. K. Kyokutoseiki Foam molding apparatus
07500839 Cl. 425-4R.
Narus, Michael; and Henley, Michael E., to Great Lakes Dart Mfg, Muskego Air hockey table
07500671 Cl. 273-126A.
Naruse, Hideto; to Epson Toyocom Corporation Piezoelectric oscillator
07501746 Cl. 310-365.
Narvel, James; to Monsanto Technology LLC Soybean variety 4852004
07501560 Cl. 800-312.
Nashner, Lewis M.; to Natus Medical Incorporated Diagnosing and training the gaze stabilization system
07500752 Cl. 351-210.
Nasukawa, Toshimichi: See--
Hirai, Hideaki; Nasukawa, Toshimichi; and Umeki, Kazuhiro
07502300 Cl. 369-112.07.
Nataraj, Shankar; Broekhuis, Robert Roger; Garg, Diwakar; He, Xiaoyi; and Li, Xianming Jimmy, to Air Products and Chemicals, Inc. Process for generating synthesis gas using catalyzed structured packing
07501078 Cl. 252-373.
Nathal, Michael V.: See--
Noebe, Ronald D.; Draper, Susan L.; Nathal, Michael V.; and Garg, Anita
07501032 Cl. 148-402.
National Chiao Tung University: See--
Chen, Szu-Hung; Lien, Yi-Chung; and Chang, Yi Edward
07501348 Cl. 438-706.
National Chung Hsing University: See--
Chen, Chuan-Mu; Cheng, Winston T. K.; and Chen, Hsiao-Ling
07501554 Cl. 800-14.
National Health Research Institutes: See--
Chern, Jyh-Haur; Shih, Shin-Ru; Chen, Chiung-Tong; Chang, Chih-Shiang; Lee, Chung-Chi; Lee, Yen-Chun; and Tai, Chia-Liang
07501445 Cl. 514-341.
National Institute of Advanced Industrial Science & Technology: See--
Nagamune, Teruyuki; Miyake, Jun; Miyake, Masato; and Kato, Koichi
07501280 Cl. 435-325.
Ohsaki, Hitoshi; and Takai, Toshinori
07503060 Cl. 726-1.
Yamane, Takashi; and Kosaka, Ryo
07500404 Cl. 73-861.355.
National Institute of Radiological Sciences: See--
Moritake, Takashi; Koizumi, Hiroto; and Ono, Hironobu
07500785 Cl. 378-203.
National Semiconductor Corporation: See--
Fitting, Andrew; and Maida, Michael
07501860 Cl. 326-84.
National Taipei University of Technology: See--
Chen, Liang-Chia; Tsung, Tshih; Sun, Jen-Yan; and Lin, Hong-Ming
07501095 Cl. 422-100.
National Yunlin University of Science and Technology: See--
Chou, Jung-Chuan; Yen, Chin-Hsien; and Lai, Yi-Ting
07501258 Cl. 435-18.
Nationwide Children's Hospital, Inc.: See--
Bakaletz, Lauren O.; and Munson, Jr., Robert S.
07501131 Cl. 424-242.1.
Natori, Katsuaki; Yamazaki, Soichi; Yamakawa, Koji; and Kanaya, Hiroyuki, to Kabushiki Kaisha Toshiba Semiconductor device and method of manufacturing the same
07501675 Cl. 257-295.
Natter, Brantley; and Plate, Herbert, to Kostal Kontakt Systems GmbH Electrical connector
07500865 Cl. 439-362.
Natus Medical Incorporated: See--
Natzle, Wesley: See--
Funk, Merritt; Sundararajan, Radha; Prager, Daniel Joseph; and Natzle, Wesley
07502709 Cl. 702-127.
Natzle, Wesley C.: See--
Horak, David V.; Natzle, Wesley C.; Funk, Merritt L.; Lally, Kevin J.; and Prager, Daniel
07502660 Cl. 700-121.
Naudet, Jacky; Rivory, Aude; and Gaignon, Gael, to Snecma Device for maintaining and positioning harnesses on a turbo-jet engine
07500644 Cl. 248-68.1.
Naveh, Alon: See--
Rotem, Efraim; Lamdan, Oren; and Naveh, Alon
07502948 Cl. 713-300.
Navia, Manuel: See--
Bannister, Thomas; Celatka, Cassandra; Chandrakumar, Nizal S.; Deng, Hongfeng; Guo, Zihong; Jin, Lei; Lazarova, Tsvetelina; Lin, Jian; Moe, Scott T.; Nagafuji, Pamela; Navia, Manuel; Ripka, Amy; Rynkiewicz, Michael J.; Spear, Kerry L.; Stickler, James E.; and Xie, Roger
07501404 Cl. 514-210.02.
Naya, Masayuki; and Mukai, Atsushi, to FUJIFILM Corporation Sensor including porous body with metal particles loaded in the pores of the body and measuring apparatus using the same
07501649 Cl. 257-9.
Nayak, Ashok B.; and Decot, James M., to Certance LLC Head actuator design for a low profile tape drive
07502196 Cl. 360-75.
Nayak, Nitin R.: See--
Bhaskaran, Kumar; Gallego, Guillermo; Huang, Ying; Leung, Ying T.; Nayak, Nitin R.; and Ramaswamy, Sanjay E.
07503032 Cl. 717-104.
nCipher Corporation Ltd.: See--
Blakley, George Robert; Findley, Randall; Goble, Richard; Herrington, Scott; and Stein, Kyle
07502468 Cl. 380-46.
NCR Corporation: See--
Ross, Gary A.; Van Demark, Michael J.; and McCouaig, Simon J.
07501646 Cl. 250-559.39.
Nebel, Gerhard: See--
Baglin, Thomas Jean Ludovic; Missoni, Albert; and Nebel, Gerhard
07501718 Cl. 307-43.
NEC Corporation: See--
Azami, Takeshi; Kasuya, Daisuke; Iijima, Sumio; Yoshitake, Tsutomu; Kubo, Yoshimi; and Yudasaka, Masako
07501024 Cl. 117-109.
Hashimoto, Yoshiyuki; and Sato, Junya
07501584 Cl. 174-259.
Namiki, Hideo; and Oomori, Yoshiaki
07502613 Cl. 455-435.1.
NEC Display Solutions Ltd.: See--
NEC Electronics Corporation: See--
Matsuda, Tomoko; and Kitajima, Hiroshi
07501317 Cl. 438-142.
Morishita, Yoshiaki; and Oh, Nobuteru
07501707 Cl. 257-777.
NEC Laboratories America, Inc.: See--
Lajolo, Marcello; and Garg, Subhek
07502378 Cl. 370-413.
Nectogroup S.r.l.: See--
Needham, Duane: See--
Giles, Durham Kenimer; and Needham, Duane
07502665 Cl. 700-241.
Neely, James Scott: See--
Chaudhry, Rajat; Neely, James Scott; and Stasiak, Daniel Lawrence
07503025 Cl. 716-6.
Negishi, Toshihiro: See--
Nakajima, Fumio; Negishi, Toshihiro; and Uehara, Masahiro
07501736 Cl. 310-239.
Neidrich, Jason M.: See--
Sudak, Paul G.; Adams, Robert L.; Neidrich, Jason M.; Jacobs, Simon Joshua; Wesneski, Lisa Ann; Wills, Linda M.; Carter, William D.; and Frederic, Judith C.
07502155 Cl. 359-248.
Neil, Michael J.: See--
Schran, Adam; and Neil, Michael J.
07502797 Cl. 707-10.
Neisch, Daniel: See--
Bouzas, Horacio R.; Brady, Jim; Neisch, Daniel; McVean, Jason; and Virine, Lev
07502771 Cl. 706-45.
Nelson, Daniel M.: See--
Behrends, Derick G.; Christensen, Todd A.; Hebig, Travis R.; and Nelson, Daniel M.
07502276 Cl. 365-230.02.
Nelson, Jimmie P.; and Johnson, Stephen D., to Cass Construction, Inc. Compaction wheel system and method
07500804 Cl. 404-128.
Nelson, Jr., George Rodney: See--
Hoffmann, John E.; Nelson, Jr., George Rodney; Riley, Daniel I.; Rouphael, Antoine J.; and Proctor, Jr., James A.
07502424 Cl. 375-316.
Nelson, Lionel M.; Lax, Ronald G.; Doelling, Eric N.; Liu, Jinfang; Muller, Peter H.; Boucher, Ryan P.; and Reo, Michael L., to Koninklijke Philips Electronics N.V. Magnetic force devices, systems, and methods for resisting tissue collapse within the pharyngeal conduit
07500484 Cl. 128-897.
Nemirovski, Guerman G.: See--
Ngia, Lester S. H.; Vlach, Christopher F.; and Nemirovski, Guerman G.
07502484 Cl. 381-320.
Nemirovsky, Adolfo: See--
Nemirovsky, Mario; Sankar, Narendra; Nemirovsky, Adolfo; and Musoll, Enric
07502876 Cl. 710-22.
Nemirovsky, Mario; Sankar, Narendra; Nemirovsky, Adolfo; and Musoll, Enric, to MIPS Technologies, Inc. Background memory manager that determines if data structures fits in memory with memory state transactions map
07502876 Cl. 710-22.
Nemoto, Hiroshi: See--
Enomoto, Akio; Kawamura, Kenji; Kitoh, Kenshin; Yoshida, Toshihiro; Nemoto, Hiroshi; and Otsubo, Shinji
07501202 Cl. 429-170.
Nemoto, Kouichi: See--
Watanabe, Kyoichi; and Nemoto, Kouichi
07501206 Cl. 429-210.
Nemoto Kyorindo Co., Ltd.: See--
Nemoto, Shigeru; to Nemoto Kyorindo Co., Ltd. Chemical liquid injection system detecting mount and dismount of chemical liquid syringe to and from chemical liquid injector
07500961 Cl. 604-151.
Nenov, Iliyan N.; and Tankov, Nikolai D., to SAP Aktiengesellschaft Transaction polymorphism
07503050 Cl. 719-311.
Nerok LLC: See--
Ness Inventions, Inc.: See--
Ness, Jeffrey A.; to Ness Inventions, Inc. Apparatus and method for forming retaining wall blocks with variable depth flanges
07500845 Cl. 425-193.
Nessim, Christine A. Abdel Messih: See--
Boulos, Maher I.; Jurewicz, Jerzy W.; and Nessim, Christine A. Abdel Messih
07501599 Cl. 219-121.36.
Neste Oil Oj: See--
Koivusalmi, Eija; and Moilanen, Juha
07501546 Cl. 585-327.
Nettekoven, Matthias: See--
Gobbi, Luca; Knust, Henner; Malherbe, Parichehr; Nettekoven, Matthias; Pinard, Emmanuel; Roche, Olivier; and Rogers-Evans, Mark
07501541 Cl. 564-156.
Han, Bo; Knust, Henner; Nettekoven, Matthias; Ratni, Hasane; and Wu, Xihan
07501422 Cl. 514-254.05.
Nettleton-Hammond, John Henry: See--
Bysouth, Stephen Robert; Hite, III, Sidney Wilson; Nettleton-Hammond, John Henry; Bergström, Karin Ingegärd; Bohara, Amrish; Landham, Rowena Roshanthi; and Lukkari, Ingrid Gunborg
07501094 Cl. 422-63.
Network Appliance, Inc.: See--
del Rosario, Ramon Z.; and Wynne, Stephen A.
07502964 Cl. 714-25.
NeuCo, Inc.: See--
Lefebvre, Wesley Curt; and Kohn, Daniel W.
07500437 Cl. 110-186.
Neuerburg, Horst: See--
Hironimus, Jeannot; Neuerburg, Horst; Stutzmann, Olivier; and Bonnin, David
07500341 Cl. 56-6.
Neuromed Technologies, Inc.: See--
Snutch, Terrance P.; and Baillie, David L.
07501263 Cl. 435-69.1.
Neuwald, Peter Robert: See--
McBlain, Thomas Joseph; Book, Nancy Ann; Gruchala, Carol Shifrin; Moy, William M.; and Neuwald, Peter Robert
07502457 Cl. 379-210.01.
Nevid, Jeffrey S.: See--
Rathus, Spencer A.; Nevid, Jeffrey S.; and Fichner-Rathus, Lois
07500596 Cl. 235-375.
New, Levi: See--
Graham, William; New, Levi; and Case, Wayne Arthur
07500830 Cl. 416-186R.
New York University: See--
New Zealand Dairy Board: See--
Bhaskar, Ganugapati Vijaya; and Kells, Brian Ashley
07501143 Cl. 426-580.
Newbury, Terence: See--
Voss, John Daniel; and Newbury, Terence
07501918 Cl. 333-254.
Newman, Diane: See--
Colgin, Mark A.; Bealer, John F.; Donnelly, Richard; and Newman, Diane
07501256 Cl. 435-7.1.
Newman, Jonathan S.: See--
Pandit, Bhalchandra S.; Daniels, Bradford R.; Truher, III, James W.; Snover, Jeffrey P.; and Newman, Jonathan S.
07503038 Cl. 717-126.
Newsome, Christopher; Li, Shunpu; Kugler, Thomas; and Russell, David, to Seiko Epson Corporation Method of depositing polythiophene semiconductor on a substrate
07501308 Cl. 438-99.
NewSouth Innovations Pty Limited: See--
Day, Anthony Ivan; Arnold, Alan Peter; and Blanch, Rodney John
07501523 Cl. 548-303.4.
Newton, III, Charles P.: See--
Garrow, Gary R.; Newton, III, Charles P.; Weir, Patrick E.; West, II, David P.; and Wetzer, Michael
07502744 Cl. 705-1.
NexGen Semi Holding, Inc.: See--
Zani, Michael John; Bennahmias, Mark Joseph; Mayse, Mark Anthony; and Scott, Jeffrey Winfield
07501644 Cl. 250-492.21.
Nextio Inc.: See--
Pettey, Christopher J.
07502370 Cl. 370-389.
Neysadurai, Anura: See--
Chen, Qijun; Lakdawala, Rahul V.; Neysadurai, Anura; and Scharnberg, Donald G.
07502947 Cl. 713-300.
Ng, Bill K.: See--
Butaric, Frank; Ng, Bill K.; Ramer, Marc; Stoeckel, Dieter; Mast, Gregory; Davila, Luis A.; and Solovay, Kenneth S.
07500988 Cl. 623-1.16.
Ng, Yee S.; and Logel, Robert C., to Eastman Kodak Company Method and apparatus for printing using a tandem electrostatographic printer
07502582 Cl. 399-296.
Ngia, Lester S. H.; Vlach, Christopher F.; and Nemirovski, Guerman G., to Think-A-Move, Ltd. Ear sensor assembly for speech processing
07502484 Cl. 381-320.
NGK Insulators, Ltd.: See--
Enomoto, Akio; Kawamura, Kenji; Kitoh, Kenshin; Yoshida, Toshihiro; Nemoto, Hiroshi; and Otsubo, Shinji
07501202 Cl. 429-170.
Kondo, Jungo; Kondo, Atsuo; Aoki, Kenji; and Mitomi, Osamu
07502530 Cl. 385-2.
Noro, Takashi; and Kaneko, Takahisa
07501160 Cl. 427-425.
Takahashi, Hironori; Hosokawa, Hirofumi; Kondo, Yoshimasa; and Hironaga, Masayuki
07500847 Cl. 425-380.
Nguyen, Melanie: See--
Hui, Jonathan; and Nguyen, Melanie
07502808 Cl. 707-102.
Nguyen, Philip D.: See--
Weaver, Jim D.; Slabaugh, Billy F.; Hanes, Jr., Robert E.; van Batenburg, Diederik; Parker, Mark A.; Blauch, Matthew E.; Stegent, Neil A.; Nguyen, Philip D.; and Welton, Thomas D.
07500519 Cl. 166-281.
Nguyen, Philip D.; and Rickman, Richard D., to Halliburton Energy Services, Inc. Methods of enhancing uniform placement of a resin in a subterranean formation
07500521 Cl. 166-295.
Nguyen, Thao: See--
Hurtado, Tony; Yan, Wentao; Guo, Lin; Hawks, Chris; Brunnett, Don; Nguyen, Thao; Oswald, Richard; and Schreck, Erhard
07502205 Cl. 360-294.7.
Nguyen, Tranquoc Thebao: See--
Bassler, Brad; Nguyen, Tranquoc Thebao; Peker, Atakan; and Opie, David
07500987 Cl. 623-1.15.
Nguyen, Trung D.: See--
Patel, Pragna Subhash; Nguyen, Trung D.; Burke, Charles Pence; and DeNardo, Jr., George Frank
07500793 Cl. 385-94.
Nicewonger, Robb B.: See--
Lapierre, Jean-Marc; Namdev, Nivedita D.; Ashwell, Mark A.; France, Dennis S.; Wu, Hui; Hutchins, Patrick M.; Tandon, Manish; Liu, Yanbin; Link, Jeff S.; Ali, Syed M.; Brassard, Chris J.; Nicewonger, Robb B.; Filikov, Anton; and Carazza, Rebecca J.
07501430 Cl. 514-275.
Nichols, Jeremy S.: See--
Hurlock, Steven T.; Kun, Stephen; Johnson, Robert A.; Nichols, Jeremy S.; and Nilson, Arthur J.
07502728 Cl. 703-23.
Nichols, Walter A.; Gupta, Rajiv; Faison, Gene G.; and Cox, Kenneth A., to Philip Morris USA Inc. Aerosol generators and methods for producing aerosols
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Nicholson, Benjamin T.: See--
Cooper, Jr., Gary W.; Nicholson, Benjamin T.; Sullins, Patrick H.; and Sutton, Brett A.
07500635 Cl. 242-588.6.
Nicholson, Keith Michael: See--
Golding, Colin; and Nicholson, Keith Michael
07500622 Cl. 239-657.
Niclass, Cristiano: See--
Charbon, Edoardo; and Niclass, Cristiano
07501628 Cl. 250-338.4.
Nicolaides, Lena: See--
Salnik, Alex; Nicolaides, Lena; and Opsal, Jon
07502104 Cl. 356-237.2.
Niculae, Marian: See--
Popescu-Stanesti, Vlad; Niculae, Marian; and Bucur, Constantin
07501720 Cl. 307-66.
Nidec Sankyo Corporation: See--
Hirasawa, Kenji; Ishikawa, Kazutoshi; and Kitazawa, Yasuhiro
07500609 Cl. 235-449.
Nidek Co., Ltd.: See--
Nidus Medical, LLC: See--
Niedenbruck, Matthias: See--
Tormo I Blasco, Jordi; Blettner, Carsten; Müller, Bernd; Gewehr, Markus; Grammenos, Wassilios; Grote, Thomas; Rheinheimer, Joachim; Schäfer, Peter; Schieweck, Frank; Schwögler, Anja; Wagner, Oliver; Niedenbruck, Matthias; Scherer, Maria; Strathmann, Siegfried; Schöfl, Ulrich; and Stierl, Reinhard
07501383 Cl. 504-100.
Niedermann, Benno: See--
Heinrich, Siegfried; Padovan, Sascha; Binder, Ulrich; and Niedermann, Benno
07500508 Cl. 164-312.
Niehsen, Wolfgang: See--
Focke, Thomas; Niehsen, Wolfgang; Mustaklem, Jeries; Suhling, Frank; and Mueller, Mario
07501980 Cl. 342-174.
Nielsen, Erik Vind; to Müller Martini Holding AG Stack-forming arrangement
07500819 Cl. 414-790.
Niemann, Holger: See--
Juenemann, Thorsten; Doerr, Bernd; Niemann, Holger; and Hagman, Per
07500458 Cl. 123-179.3.
Niemeier, Manuela: See--
Westhoff, Elke; Niemeier, Manuela; Stübbe, Winfried; and Poppe, Andreas
07501480 Cl. 528-27.
Nienaber, Gerhard: See--
Diekhans, Norbert; Brunnert, Andreas; Meyer Zu Helligen, Lars Peter; and Nienaber, Gerhard
07502678 Cl. 701-50.
Niggemeier, Tim: See--
Barowski, Harry; Gemmeke, Tobias; Niggemeier, Tim; and Pflueger, Thomas
07502918 Cl. 712-226.
Nihei, Yasukazu: See--
Mita, Tsuyoshi; and Nihei, Yasukazu
07500728 Cl. 347-12.
Nii, Koji; Obayashi, Shigeki; Makino, Hiroshi; Ishibashi, Koichiro; and Shinohara, Hirofumi, to Renesas Technology Corp. Semiconductor memory device
07502275 Cl. 365-226.
Niijima, Makoto: See--
Rosin, Robert; Hsu, P. Robert; Sonoda, Yumie; Niijima, Makoto; and Nakano, Hiroaki
07503057 Cl. 725-44.
Niitsuma, Kazuhiro; and Nishikawa, Masakazu, to FUJIFILM Corporation Method of magnetic transfer and stopping slave medium rotation
07502184 Cl. 360-17.
Nijmeijer, Arian: See--
Den Boestert, Johannes Leendert Willem Cornelis; Haan, Johannes Pieter; and Nijmeijer, Arian
07501062 Cl. 210-638.
Nike, Inc.: See--
Nikon Corporation: See--
Nilson, Arthur J.: See--
Hurlock, Steven T.; Kun, Stephen; Johnson, Robert A.; Nichols, Jeremy S.; and Nilson, Arthur J.
07502728 Cl. 703-23.
Nilsson, Eddie: See--
Asbrink, Perry; Nilsson, Eddie; and Sternby, Jan Peter
07500958 Cl. 604-6.1.
Nilsson, Jan: See--
Börjeson, Henrik; and Nilsson, Jan
07501792 Cl. 320-106.
Nilsson, Lars Johan Albinsson: See--
Varnham, Malcolm Paul; Zervas, Mikhail Nicholaos; Payne, David Neil; and Nilsson, Lars Johan Albinsson
07502391 Cl. 372-6.
NIMCO Corporation: See--
Bachner, Jerry G.; and Anchor, David R.
07500940 Cl. 493-87.
Nippon Mextron, Limited: See--
Yoshida, Tamotsu; and Okabe, Jun
07501466 Cl. 524-284.
Nippon Steel Corporation: See--
Takeuchi, Satoshi; Okamoto, Riki; and Ito, Kazuhito
07501031 Cl. 148-320.
Nisca Corporation: See--
Higaki, Akiharu; and Nakagomi, Hiroshi
07500663 Cl. 270-58.12.
Nishi, Kazuo; Takayama, Toru; and Goto, Yuugo, to Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method of manufacturing thereof
07501306 Cl. 438-69.
Nishi, Kiyohiko: See--
Ohto, Chikara; Obata, Shusei; Muramatsu, Masayoshi; Nishi, Kiyohiko; and Totsuka, Kazuhiko
07501268 Cl. 435-155.
Nishida, Katsunori; and Kubo, Tomoyuki, to Brother Kogyo Kabushiki Kaisha Inkjet recording apparatus
07500730 Cl. 347-18.
Nishida, Yasutaka: See--
Sawaguchi, Hideki; Nishida, Yasutaka; Takano, Hisashi; and Tsuchinaga, Hiroyuki
07502189 Cl. 360-65.
Nishide, Tetsuhiro: See--
Yatsushiro, Daisuke; and Nishide, Tetsuhiro
07500409 Cl. 74-89.4.
Nishiguchi, Masayuki: See--
Abe, Mototsugu; and Nishiguchi, Masayuki
07502547 Cl. 386-95.
Nishii, Mikito; Arai, Hiroyuki; Sakai, Tsutomu; and Kondo, Mitsuru, to Toyota Jidosha Kabushiki Kaisha Coolant and cooling system
07501196 Cl. 429-26.
Nishii, Teruyuki; to Canon Kabushiki Kaisha Communication apparatus
07502740 Cl. 704-260.
Nishikawa, Kazuyuki: See--
Zenpo, Toshihiko; Kato, Yusuke; Asano, Norihiro; Nagasaka, Masahiko; Nishikawa, Kazuyuki; and Tanaka, Motoyasu
07500840 Cl. 425-4R.
Nishikawa, Masakazu: See--
Niitsuma, Kazuhiro; and Nishikawa, Masakazu
07502184 Cl. 360-17.
Nishikawa, Takeo: See--
Matsushita, Tomohiko; Aoyama, Shigeru; Nishikawa, Takeo; Tsuda, Yuko; Norioka, Shigemi; and Wazawa, Tetsuichi
07501241 Cl. 435-6.
Nishikawa, Tomomasa: See--
Akiba, Yoshitaka; Nishikawa, Tomomasa; Yamamoto, Kunio; Ohtsu, Shinki; and Fujisawa, Haruhisa
07500587 Cl. 227-10.
Nishikawa, Toru: See--
Hayami, Isao; Nishikawa, Toru; Tateyanagi, Masaya; and Tanaka, Syouichi
07501617 Cl. 250-239.
Nishimori, Eiji; to Fujitsu Microelectronics Limited DC-DC converter control circuit and DC-DC converter control method
07501806 Cl. 323-284.
Nishimori, Junya: See--
Ishikawa, Teruhisa; Osawa, Yoshiki; Funaki, Mitsuru; Nakaguchi, Tomonori; and Nishimori, Junya
07501201 Cl. 429-162.
Nishimura, Joji; to Seiko Epson Corporation Liquid crystal device and electronic apparatus
07502084 Cl. 349-114.
Nishimura, Kazunori; Igaki, Tsutomu; Matsunami, Ken; and Nakamura, Hiroyuki, to Panasonic Corporation Surface acoustic wave filter
07501917 Cl. 333-195.
Nishimura, Shunsuke; to Canon Kabushiki Kaisha Image forming apparatus capable of detecting and/or locating a fault, image forming system, and method of controlling the image forming apparatus
07502570 Cl. 399-8.
Nishimura, Takayuki: See--
Abe, Yasushi; Yagishita, Takahiro; Kadowaki, Yukio; and Nishimura, Takayuki
07502488 Cl. 382-100.
Nishimura, Takeshi; to Fuji Xerox Co., Ltd. Image forming apparatus and method, and image forming system
07502139 Cl. 358-1.9.
Nishino, Takeshi; Nakamura, Shuji; Kiryu, Koichi; and Kobayashi, Kazuo, to Fujitsu Component Limited Pointing device
07502013 Cl. 345-157.
Nishino, Takeshi; Nakamura, Shuji; Kiryu, Koichi; and Kobayashi, Kazuo, to Fujitsu Component Limited Pointing device
07502014 Cl. 345-157.
Nishitani, Mikihiko: See--
Hashimoto, Jun; Kitagawa, Masatoshi; Nishitani, Mikihiko; Terauchi, Masaharu; and Yamamoto, Shinichi
07501763 Cl. 313-587.
Nishiyama, Nobuhiko: See--
Hu, Martin H; Nishiyama, Nobuhiko; and Zah, Chung-En
07502394 Cl. 372-26.
Nishiyama, Yoshinori; and Kobayashi, Ayumu, to Alps Electric Co., Ltd. Angular light guide with fringed portion
07500774 Cl. 362-551.
Nishizawa, Akinori: See--
Miyaji, Wakaki; Nishizawa, Akinori; and Higashino, Kyoko
07501727 Cl. 310-68D.
Nishizawa, Hidetake: See--
Momose, Hiroaki; Kitazawa, Tatsuya; and Nishizawa, Hidetake
07502527 Cl. 382-284.
Nishizawa, Yoh: See--
Mori, Tomoaki; Miyamoto, Masahiko; and Nishizawa, Yoh
07500925 Cl. 473-345.
Nissan Chemical Industries, Ltd.: See--
Hiroi, Yoshiomi; Kishioka, Takahiro; Nakayama, Keisuke; and Sakamoto, Rikimaru
07501229 Cl. 430-325.
Nissan Diesel Motor Co., Ltd.: See--
Hirata, Kiminobu; Masaki, Nobuhiko; and Miyata, Tatsuji
07500356 Cl. 60-286.
Masuda, Kouji; Hirata, Kiminobu; and Masaki, Nobuhiko
07500355 Cl. 60-286.
Nissan Motor Co., Ltd.: See--
Hamada, Takahiro; Mabuchi, Yutaka; Kano, Makoto; and Azuma, Yuuji
07500472 Cl. 123-467.
Hirooka, Kenichi; Mizuno, Kazutoshi; Takahashi, Motoshi; and Ono, Kousuke
07500712 Cl. 296-146.6.
Ogawa, Junpei; Miyazawa, Tomonori; Okada, Yoshio; Ikeuchi, Jun; and Yamaguchi, Masashi
07500417 Cl. 74-579E.
Shimamura, Osamu; Watanabe, Kyoichi; Horie, Hideaki; Tanjou, Yuuji; and Abe, Takaaki
07501203 Cl. 429-179.
Watanabe, Kyoichi; and Nemoto, Kouichi
07501206 Cl. 429-210.
Nisshin Steel Co., Ltd.: See--
Suzaki, Tsunetoshi; Hirata, Kentaro; and Higo, Yuichi
07501029 Cl. 148-307.
Nissin Kogyo Co., Ltd.: See--
Noguchi, Toru; and Magario, Akira
07501459 Cl. 523-346.
Nistler, Juergen; Renz, Wolfgang; and Vester, Markus, to Siemens Aktiengesellschaft Cylindrical magnetic resonance antenna
07501823 Cl. 324-318.
Nitta Corporation: See--
Morimoto, Hideo
07500406 Cl. 73-862.044.
Nitta, Kyoya: See--
Okazaki, Tsutomu; Okada, Daisuke; Nitta, Kyoya; Tanaka, Toshihiro; Kato, Akira; Matsui, Toshikazu; Ishii, Yasushi; Hisamoto, Digh; and Yasui, Kan
07502257 Cl. 365-185.05.
Nitta, Shoichi; and Matsuo, Masahiro, to Ricoh Company, Ltd. DC-DC converting method and apparatus
07501802 Cl. 323-259.
Nitto Denko Corporation: See--
Eto, Takuya; Ikemura, Kazuhiro; Toyoda, Eiji; Nakabayashi, Katsuyuki; and Tsukahara, Daisuke
07501711 Cl. 257-787.
Funada, Yasuhito; and Ishii, Jun
07501581 Cl. 174-254.
Miki, Yosuke; and Ohwaki, Yasuhito
07500780 Cl. 374-144.
Ohmori, Yutaka; Sakamoto, Michie; Nakano, Shuusaku; Konishi, Takahisa; and Umemoto, Seiji
07501165 Cl. 428-1.3.
Saito, Junichi; Hanatani, Akinori; and Akemi, Hitoshi
07501358 Cl. 442-151.
Umemoto, Seiji; Ariyoshi, Toshihiko; and Suzuki, Takao
07502081 Cl. 349-63.
Niva, Lori: See--
Mitchell, Syne; Tomlin, G. Scott; Niva, Lori; and Lindenburg, Matthew J.
07502867 Cl. 709-246.
Nivanh, Dan S.: See--
Rae, John J.; Radcliffe, Nathaniel J.; Stone, Daniel J.; Garner, Trent E.; Hooley, Brad S.; Horacek, Robert J.; Lacey, Sam G.; Brunski, Jeff D.; Schaeffer, Kevin; Carlyle, Scott A.; Chien, Stephen C.; Schnell, Craig R.; Roberts, Douglas E.; Nivanh, Dan S.; and Wallans, Michael J.
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Noda, Hideki; Murakami, Masao; Uno, Koji; Matsushita, Kentaro; Hamano, Takubi; Saito, Takeshi; and Sato, Yasushi, to Nabtesco Corporation Magnetic shielding door and magnetic shielding room
07501588 Cl. 174-382.
Noda, Reiko; to Kabushiki Kaisha Toshiba Apparatus and method for coding image based on level of visual attention and level of perceivable image quality distortion, and computer program product therefor
07502518 Cl. 382-239.
Noebe, Ronald D.; Draper, Susan L.; Nathal, Michael V.; and Garg, Anita, to United States of America as represented by the Administration of NASA, The High work output NI-TI-PT high temperature shape memory alloys and associated processing methods
07501032 Cl. 148-402.
Noel, Michael Jonathan; to Go Daddy Group, Inc., The Document color and shades of gray optimization using dithered monochrome surfaces
07502135 Cl. 358-1.15.
Noelle, Frederic; to Rieter Perfojet Drum for a production unit for a non-woven material, method for production of a non-woven material and non-woven material obtained thus
07500293 Cl. 28-104.
Noelle, Randolph J.; Durie, Fiona H.; Parker, David C.; Appel, Michael C.; Phillips, Nancy E.; Mordes, John P.; Grenier, Dale L.; and Rossini, Aldo A., to Trustees of Dartmouth College Methods of inducing T-cell non-responsiveness with anti-gp39 24-31 antibodies
07501124 Cl. 424-154.1.
Noguchi, Hiromi: See--
Hara, Yoshihiko; Izui, Hiroshi; and Noguchi, Hiromi
07501282 Cl. 435-476.
Noguchi, Junji; Matsumoto, Takashi; Oshima, Takayuki; and Onozuka, Toshihiko, to Hitachi, Ltd. Semiconductor device and manufacturing method of the same
07501347 Cl. 438-700.
Noguchi, Toru; and Magario, Akira, to Nissin Kogyo Co., Ltd. Carbon fiber composite material and method of producing the same
07501459 Cl. 523-346.
Noh, Sok Won; Kim, Mu Hyun; Lee, Sang Bong; and Kim, Sun Hoe, to Samsung Mobile Display Co., Ltd. Laser induced thermal imaging apparatus and laser induced thermal imaging method and fabricating method of organic light-emitting diode using the same
07502043 Cl. 347-171.
Noh, Tae-Yong: See--
Son, Hae-Jung; Noh, Tae-Yong; Park, Sang-Hoon; Pu, Lyong-Sun; Ragini, Das Rupasree; Lee, Jong-Hyoup; Han, Eun-Sil; Byun, Young-Hun; Chang, Seok; and Lyu, Yi-Yeol
07501188 Cl. 428-690.
Nok Corporation: See--
Nokia Corporation: See--
Aaltonen, Janne U.
07502345 Cl. 370-331.
Ciminelli, Gabriele
07502632 Cl. 455-563.
Heiner, Andreas; Balandin, Sergey; and Barnes, Roberto
07502371 Cl. 370-389.
Hottinen, Ari; and Tirkkonen, Olav
07502421 Cl. 375-267.
Koskinen, Topi; Virta, Mikko; and Koivisto, Ari
07502362 Cl. 370-352.
Lemilainen, Jussi
07502626 Cl. 455-554.2.
Pöyhönen, Petteri; and Flinck, Hannu
07502923 Cl. 713-153.
Tarvainen, Tomi; Krol, Jarek; Autio, Kimmo; Torkkel, Jari; Pyyhtia, Jarmo; Tuominen, Hannu; and Okkonen, Juha
07502866 Cl. 709-245.
Trossen, Dirk; Mahan, Michael; and Hirsch, Frederick
07502384 Cl. 370-466.
Vanhatalo, Aki; and Kokkonen, Jari
07502629 Cl. 455-558.
Westman, Ilkka; Bajko, Gabor; Huotari, Seppo; Kiss, Kirsztian; Pulkkinen, Olli M.; Tammi, Kalle; and Tuohino, Markku
07502837 Cl. 709-219.
Yu, Jing; and Hu, Xuelong Ronald
07502322 Cl. 370-235.
Zhang, Jianzhong; Bhatt, Tejas; and Mandyam, Giridhar
07502312 Cl. 370-210.
Nokia Telecommunications Oyj: See--
Pirkola, Juha Matti; Einola, Heikki Juhani; Suoknuuti, Marko Juhani; Mikkonen, Aki Petteri; Koskivirta, Tero; Saunamäki, Jukka-Pekka; and Pessi, Pekka Tapio
07502339 Cl. 370-310.
Nolan, Sean P.: See--
San Andres, Ramon J.; Sanderman, David S.; and Nolan, Sean P.
07502832 Cl. 709-216.
Noller, Klaus: See--
Kammerer, Werner; Noller, Klaus; Stier, Hubert; Schmieder, Dietmar; Huebel, Michael; Gerschwitz, Thomas; and Leitner, Christian
07500648 Cl. 251-57.
Nomadics, Inc.: See--
Nomiya, Susumu; to Disco Corporation Thickness-measuring method during grinding process
07500902 Cl. 451-8.
Nomura, Hiroshi; to Hoya Corporation Imaging device
07502552 Cl. 396-55.
Nomura, Ryoji; and Shimomura, Akihisa, to Semiconductor Energy Laboratory Co., Ltd. Laser oscillator
07502392 Cl. 372-9.
Nonaka, Yuji; Izumo, Takayuki; Akatani, Kaoru; Kishi, Atsuko; and Kishida, Tsunataro, to Suntory Limited Lactic acid bacteria with immunoregulating activities
07501274 Cl. 435-252.9.
Nonin, Katsuya: See--
Nabetani, Toshihisa; Adachi, Tomoko; Tandai, Tomoya; Nonin, Katsuya; and Kaburaki, Satoshi
07502330 Cl. 370-252.
Nonomura, Yutaka: See--
Fujiyoshi, Motohiro; Nonomura, Yutaka; and Sugihara, Hisayoshi
07501835 Cl. 324-662.
Nonoyama, Shigeru; and Ueda, Naoto, to Panasonic Corporation Semiconductor integrated circuit and method of manufacturing the same
07501710 Cl. 257-786.
Noquil, Jonathan A.: See--
Joshi, Rajeev D.; Noquil, Jonathan A.; and Tangpuz, Consuelo N.
07501702 Cl. 257-724.
Norbeck, Joseph M.; and Hackett, Colin E., to Regents of the University of California, The Steam pyrolysis as a process to enhance the hydro-gasification of carbonaceous materials
07500997 Cl. 48-127.7.
Nordenia Deutschland Gronau GmbH: See--
Nordex Energy GmbH: See--
Laubrock, Malte; Woldmann, Thomas Paul; and Bilges, Soren
07501798 Cl. 322-32.
Norioka, Shigemi: See--
Matsushita, Tomohiko; Aoyama, Shigeru; Nishikawa, Takeo; Tsuda, Yuko; Norioka, Shigemi; and Wazawa, Tetsuichi
07501241 Cl. 435-6.
Norman, Christopher O.: See--
Gould, Bruce M.; Arnswald, Jeffrey K.; and Norman, Christopher O.
07501140 Cl. 426-513.
Noro, Takashi; and Kaneko, Takahisa, to NGK Insulators, Ltd. Apparatus for coating outer peripheral surface of pillar structure and method for coating outer peripheral surface of pillar structure
07501160 Cl. 427-425.
Norsync Technology A/S: See--
Sjøgren, Bjørn-Harald; and Bjørnemyr, Jan-Thore
07502791 Cl. 707-8.
North Carlina State University: See--
Comins, Daniel L.; Fevrier, Florence; and Smith, Emilie Despagnet
07501520 Cl. 546-276.4.
North Carolina State University: See--
Balakumar, Arumugham; Muthukumaran, Kannan; and Lindsey, Jonathan S.
07501507 Cl. 540-145.
North Caroline State University: See--
Lindsey, Jonathan S.; Taniguchi, Masahiko; and Fan, Dazhong
07501508 Cl. 540-145.
Northcutt, J. Duane: See--
Hanko, James G.; Lavelle, Michael G.; Lyle, James D.; and Northcutt, J. Duane
07502470 Cl. 380-200.
Northern Illinois University: See--
Bose, Rathindra N.; and Bose, Anima B.
07501050 Cl. 205-105.
Northern Nanotechnologies: See--
Anderson, Darren; Goh, Jane B.; and Dinglasan, Jose Amado
07501180 Cl. 428-403.
Northrop Grumman Space & Mission Systems Corp.: See--
Cheng, Eric Chiu-Tat; Rice, Robert Rex; Wickham, Michael Gordon; and Weber, Mark Ernest
07502395 Cl. 372-32.
Norwood, John Q.: See--
Bevirt, JoeBen; Moore, David F.; Norwood, John Q.; Rosenberg, Louis B.; and Levin, Mike D.
07500853 Cl. 434-262.
Nosov, Alexander E.: See--
Sanghvi, Ashvinkumar J.; Hance, Howard M.; Novik, Lev; Kenny, Patrick R.; Thatcher, Michael A.; and Nosov, Alexander E.
07502845 Cl. 709-223.
Noss, Ryan C.; and Ruggiero, Brian L., to Jacobs Vehicle Systems, Inc. Variable valve actuation and engine braking
07500466 Cl. 123-321.
Noto, Sachio: See--
Yamamoto, Masahiko; Kouzan, Yoshihiro; Noto, Sachio; and Kobayashi, Kiyohito
07500502 Cl. 156-379.
Novartis Animal Health US, Inc.: See--
Simard, Nathalie C; and Bootland, Linda M
07501128 Cl. 424-224.1.
Novartis Vaccines and Diagnostics, Inc.: See--
O'Hagan, Derek; Singh, Manmohan; and Kazzaz, Jina
07501134 Cl. 424-489.
Reinhard, Christoph; Jefferson, Anne B.; and Chan, Vivien W.
07501242 Cl. 435-6.
Reinhard, Christoph; Jefferson, Anne B.; and Chan, Vivien W.
07501243 Cl. 435-6.
Reinhard, Christoph; Jefferson, Anne B.; and Chan, Vivien W.
07501244 Cl. 435-6.
NovAtel Inc.: See--
Novell, Inc.: See--
Amin, Baber; and Ebrahimi, Hashem Mohammad
07502922 Cl. 713-151.
Trowbridge, Jon Eric; and Friedman, Nathaniel Dourif
07502798 Cl. 707-10.
Novik, Lev: See--
Sanghvi, Ashvinkumar J.; Hance, Howard M.; Novik, Lev; Kenny, Patrick R.; Thatcher, Michael A.; and Nosov, Alexander E.
07502845 Cl. 709-223.
Novita Co., Ltd.: See--
Novo Nordisk A/S: See--
Nozaki, Kazutoshi: See--
Tabata, Atsushi; and Nozaki, Kazutoshi
07502679 Cl. 701-70.
Nozaki, Mikio: See--
Tokumoto, Yoshitomo; Takayama, Shingo; Nozaki, Mikio; and Nakane, Naoki
07500408 Cl. 73-862.334.
Nozaki, Shinji: See--
Tsuchiya, Kazuaki; Higuchi, Hidemitsu; Nozaki, Shinji; and Sawada, Sunao
07502372 Cl. 370-390.
Nozasa, Yuji; and Yoshimatsu, Yusaku, to Rohm Co., Ltd. Piezoelectric transducer drive circuit and cold cathode tube lighting device having the same
07501738 Cl. 310-316.01.
Nozawa, Masafumi: See--
Furuhashi, Ryoji; Kaneda, Yasunori; and Nozawa, Masafumi
07502904 Cl. 711-165.
Nozawa, Ryoichi: See--
Funamoto, Tatsuaki; and Nozawa, Ryoichi
07501754 Cl. 313-504.
Nozawa, Shigekazu: See--
Takahashi, Akeshi; Yoshikawa, Tomio; Huang, Baiying; Nozawa, Shigekazu; Nakayaka, Susumu; Koharagi, Haruo; and Kikuchi, Satoshi
07501734 Cl. 310-216.
Nozue, Daiki; Miyata, Hiroaki; and Sueyoshi, Noriyuki, to Hitachi Communication Technologies, Ltd. WDM type passive optical network
07502563 Cl. 398-69.
NSK Autoliv Co., Ltd.: See--
Ono, Katsuyasu; Ohsumi, Sadanori; Matsuki, Masuo; and Ogawa, Kiyoshi
07500632 Cl. 242-374.
NSK Ltd.: See--
Hara, Takeshi; and Endo, Shuji
07500538 Cl. 180-412.
Ishida, Ryuuichi; Yoshimoto, Shin; and Takano, Toshimichi
07500414 Cl. 74-493.
NTH IP Corporation: See--
NTN Corporation: See--
Koike, Takashi; Ishikawa, Tomomi; and Isobe, Hiroshi
07501812 Cl. 324-207.25.
NTT DoCoMo, Inc.: See--
Matoba, Naoto; Shirakabe, Masashige; Sugiyama, Takatoshi; and Yoshino, Hitoshi
07502341 Cl. 370-319.
Moon, Sung Uk; and Futakata, Toshiyuki
07502359 Cl. 370-348.
Mori, Kensaku; Terada, Masayuki; Ishii, Kazuhiko; and Hongo, Sadayuki
07500605 Cl. 235-380.
Takao, Toshiaki; Umeda, Narumi; and Chen, Lan
07502596 Cl. 455-78.
Yoshimura, Takeshi; Ohya, Tomoyuki; and Ueno, Hidetoshi
07502316 Cl. 370-229.
Nuclear Consultant Group, Inc.: See--
Nugent, Alex; to Knowmtech, LLC Fractal memory and computational methods and systems based on nanotechnology
07502769 Cl. 706-26.
Numata, Yasuhiro; Takahashi, Kazuyoshi; Takayanagi, Yoshiaki; Tanaka, Souhei; Tajika, Hiroshi; Koitabashi, Noribumi; Sugimoto, Hitoshi; and Fujita, Miyuki, to Canon Kabushiki Kaisha Ink jet recording apparatus and method using replaceable recording heads
07500739 Cl. 347-86.
Nunokawa, Hirokazu: See--
Hosono, Satoru; Nunokawa, Hirokazu; Hoshiyama, Yoshiko; Yonekubo, Shuji; and Saruta, Toshihisa
07500726 Cl. 347-10.
Nusseibeh, Fouad A.: See--
Wood, Roland A.; Cox, James A.; Higashi, Robert E.; and Nusseibeh, Fouad A.
07501626 Cl. 250-338.1.
Nuttall, Arch F.: See--
Frizzell, Jr., Raymond F.; and Nuttall, Arch F.
07500886 Cl. 439-701.
NuWay Tobacco Company: See--
Shepard, Charles B.; and Voorhies, Raymond A.
07500485 Cl. 131-309.
NVIDIA Corporation: See--
Jacob, Rojit; and Chuang, Dan Minglun
07502915 Cl. 712-220.
Maufer, Thomas A.; and Sidenblad, Paul J.
07502925 Cl. 713-161.
Moreton, Henry Packard
07502035 Cl. 345-611.
NXP B.V.: See--
Sanduleanu, Mihai Adrian Tiberiu; Stikvoort, Eduard Ferdinand; and Cissé, Idrissa
07501871 Cl. 327-218.
Nyström, Magnus: See--
Brainard, John G.; Kaliski, Jr., Burton S.; Nyström, Magnus; and Rivest, Ronald L.
07502467 Cl. 380-44.