| US 7,499,091 B2 | ||
| Solid-state imaging device and method for driving same | ||
| Takashi Abe, Kanagawa (Japan); Ryoji Suzuki, Kanagawa (Japan); and Keiji Mabuchi, Kanagawa (Japan) | ||
| Assigned to Sony Corporation, Tokyo (Japan) | ||
| Appl. No. 10/508,234 PCT Filed Mar. 20, 2003, PCT No. PCT/JP03/03453 § 371(c)(1), (2), (4) Date Sep. 20, 2004, PCT Pub. No. WO03/079675, PCT Pub. Date Sep. 25, 2003. |
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| Claims priority of application No. 2002-077429 (JP), filed on Mar. 20, 2002. | ||
| Prior Publication US 2005/0104985 A1, May 19, 2005 | ||
| Int. Cl. H04N 3/14 (2006.01); H04N 5/335 (2006.01) | ||
| U.S. Cl. 348—308 [348/307] | 7 Claims |

| 1. A solid-state imaging device including an imaging pixel portion formed by arranging a plurality of pixels each including
a photo-electric conversion element and a reading circuit of the photo-electric conversion element in a matrix and having
an all pixel reading mode for reading pixel signals from all pixels of the imaging pixel portion and a thinning out reading
mode for selecting part of the pixels of the imaging pixel portion said solid-state imaging device comprising:
a drive circuit having a function for selecting the reading circuit in the all pixel reading mode for each pixel row or each
pixel column by a drive signal, and in the thinning out reading mode inputting a drive signal also to a pixel row or a pixel
column which is thinned out when driving by the thinning out reading mode, and making the reading circuit of each pixel operate,
wherein said drive circuit inputs drive signals to the not thinned out pixel rows or pixel columns and thinned out pixel rows
or pixel columns such that a number of operations for the reading circuits of all pixels after performing both thinning out
reading and all pixel reading is at least substantially equal.
|