| US 7,498,800 B1 | ||
| Methods and apparatus for rotationally accessed tester interface | ||
| Kenneth S. Whiteman, Portland, Oreg. (US) | ||
| Assigned to Advanced Inquiry Systems, Inc., | ||
| Filed on Jul. 18, 2007, as Appl. No. 11/880,093. | ||
| Claims priority of provisional application 60/831975, filed on Jul. 18, 2006. | ||
| Int. Cl. G01R 31/28 (2006.01) | ||
| U.S. Cl. 324—158.1 [324/758] | 15 Claims |
| 1. A rotationally accessed tester interface, comprising:
a rotation stage;
an edge-extended wafer translator, having a first and a second major surface, disposed on the rotation stage; and
a first contact block having a first portion positioned to overlap a peripheral annular region on a first major surface of
the edge-extended wafer translator, and moveable, independent of the edge-extended wafer translator, in an axis perpendicular
to the first major surface;
wherein the edge-extended wafer translator includes contact pads disposed in a peripheral annular region of at least the first
surface;
wherein the first contact block includes a zero insertion force socket operable to receive pins extending perpendicularly
from the first major surface of the edge-extended wafer translator.
|