US 7,497,001 B2
Technique for predicting over insertions for partial grids and defective Z-pins
Terence F. W. Hall, Santa Monica, Calif. (US); and Jonathan D. Bartley-Cho, Arcadia, Calif. (US)
Assigned to Northrop Grumman Corporation, Los Angeles, Calif. (US)
Filed on Nov. 29, 2005, as Appl. No. 11/288,832.
Application 11/288832 is a continuation in part of application No. 11/158400, filed on Jun. 22, 2005, granted, now 7,409,757.
Prior Publication US 2006/0288555 A1, Dec. 28, 2006
Int. Cl. B23P 11/00 (2006.01); B23Q 17/00 (2006.01)
U.S. Cl. 29—407.01  [29/407.05; 29/407.08; 29/525.08; 29/798] 20 Claims
OG exemplary drawing
 
1. A method of predicting an over insertion of at least one Z-pin into a composite laminate and determining whether the Z-pin is defective, the method comprising the steps of:
a) positioning at least one Z-pin upon the composite laminate;
b) applying an insertion force to the Z-pin at a level sufficient to commence an insertion process wherein the Z-pin is driven into the composite laminate to a first insertion depth;
c) monitoring the insertion force applied to the Z-pin during the insertion thereof to the first insertion depth;
d) calculating an insertion energy level applied to the Z-pin during the insertion thereof to the first insertion depth; and
e) comparing the insertion energy level to an empirically derived value.