| US 7,332,956 B2 | ||
| Method to avoid device stressing | ||
| Hibourahima Camara, Beacon, N.Y. (US); Louis C. Hsu, Fishkill, N.Y. (US); James D. Rockrohr, Hopewell Junction, N.Y. (US); Karl D. Selander, Hopewell Junction, N.Y. (US); Huihao Xu, Brooklyn, N.Y. (US); and Steven J. Zier, Hopewell Junction, N.Y. (US) | ||
| Assigned to International Business Machines Corporation, Armonk, N.Y. (US) | ||
| Filed on Oct. 27, 2005, as Appl. No. 11/163,688. | ||
| Prior Publication US 2007/0096797 A1, May 03, 2007 | ||
| Int. Cl. G05F 1/10 (2006.01) | ||
| U.S. Cl. 327—540 [327/530] | 19 Claims |
| 1. A system for protecting a weak device operating in a micro-electronic circuit comprising a high voltage power supply, the
system comprising:
a low voltage power supply detection circuit configured to detect circuit power-up, circuit power-down, and when the low voltage
power supply is absent, and generate a control signal upon detection; and
a controlled current mirror device configured to provide a trickle current to maintain a conduction channel in the weak device
in response to the control signal received from the low voltage power supply detection circuit during one of circuit power-up,
circuit power-down, and when the low voltage power supply is absent.
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