LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 15th DAY OF February, 2011
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

E. C. L.: See--
Delcorde, Xavier 07887680 Cl. 204-288.6.
E. I. du Pont de Nemours & Co.: See--
Johnson, Jeffery W.; Matheson, Robert R.; White, Donald A.; Drysdale, Neville Everton; Corcoran, Patrick Henry; and Lewin, Laura Ann 07888440 Cl. 526-213.
E. I. du Pont de Nemours and Company: See--
Allen, Steven R; and Sikkema, Doetze Jakob 07888457 Cl. 528-486.
Figuly, Garret D. 07887846 Cl. 424-501.
Gohil, Rameshchandra M.; Hasty, Noel M.; Hayes, Richard Allen; Kurian, Joseph V.; Liang, Yuanfeng; Stancik, Edward J.; Strukelj, Marko; and Tseng, Susan Yen-Tee 07888405 Cl. 523-124.
Ito, Kazushige; and Noda, Hiroaki 07887992 Cl. 430-270.1.
Lonkin, Alex Sergey 07887989 Cl. 430-270.1.
Scott, David M.; Torardi, Carmine; and Grushin, Vladimir 07887779 Cl. 423-610.
E.I. du Pont de Nemours & Co.: See--
Huynh-Ba, Gia; and Corcoran, Patrick Henry 07888431 Cl. 525-124.
E.I. du Pont de Nemours and Company: See--
Cahoon, Rebecca E.; and Klein, Theodore M. 07888560 Cl. 800-295.
May, Donald Douglas 07888408 Cl. 523-205.
Peng, Sheng; and Moloy, Kenneth Gene 07888538 Cl. 570-172.
Rao, Velliyur Nott Mallikarjuna; and Knapp, Jeffrey P. 07888539 Cl. 570-178.
Renkes, Tanja; Tessari, Frank; and Barrere, Matthieu 07888439 Cl. 526-201.
Eacock, Graham: See--
Wenderow, Tal; Bromander, Thomas; Kennedy, III, James J.; Thompson, Stanley O.; Taylor, Jon B.; Lightcap, Jeffrey; and Eacock, Graham 07887549 Cl. 606-108.
Earley, Chris: See--
Hamel, Andrew; Baycura, Michael; Earley, Chris; Hoffman, David; and Ikriannikov, Alexandr 07887534 Cl. 606-34.
Earth To Air Systems, LLC: See--
Wiggs, B. Ryland 07886558 Cl. 62-282.
Easler, Timothy E.: See--
Riedell, James A.; and Easler, Timothy E. 07888277 Cl. 501-92.
Eastman Chemical Company: See--
Lin, Robert; and de Vreede, Marcel 07888530 Cl. 562-412.
Parker, Kenny Randolph; and Gibson, Philip Edward 07888529 Cl. 562-409.
Eastman Kodak Company: See--
Kahen, Keith B. 07888700 Cl. 257-103.
Korolik, Pavel; Beres, Moshe; Olpak, Tamir; Regev, Shay; and Silverman, Mark 07888664 Cl. 250-559.3.
Luo, Jiebo; and Papin, Christophe E. 07889794 Cl. 375-240.16.
Morales, Efrain O.; and Hamilton, Jr., John F. 07889921 Cl. 382-167.
Nair, Mridula; Yang, Xiqiang; Jones, Tamara K.; and Morgan, Jason 07887984 Cl. 430-110.1.
Nair, Mridula; Yang, Xiqiang; Jones, Tamara K.; and Popowych, James G. 07888410 Cl. 523-339.
Easwaran, Sri Navaneethakrishnan; and Hehemann, Ingo, to Texas Instruments Deutschland GmbH Bias current generator for multiple supply voltage circuit 07888993 Cl. 327-543.
EasyOnMe, Inc.: See--
Campbell, Tom 07890957 Cl. 719-313.
Eaton Corporation: See--
Bassett, Michael L.; Cole, Christopher D.; McClellan, Clinton J.; Schlosser, Kevin; and Woolcott, Douglas G. 07886887 Cl. 192-105CP.
Dooley, John Michael 07886771 Cl. 138-30.
Eaton, Dan L.: See--
Chang, Wesley; de Sauvage, Frederic J.; Eaton, Dan L.; Ebens, Jr., Allen J.; Frantz, Gretchen; Hongo, Jo-Anne S.; Koeppen, Hartmut; Polson, Andrew; and Smith, Victoria 07888478 Cl. 530-387.1.
Eaton, Scott: See--
Judy, John; Petruzzelli, Joe; Rajagopalan, Cadathur; Eaton, Scott; Kaufman, Sondra; and Hebert, Susan D0632698 Cl. D14-486.
Judy, John; Petruzzelli, Joe; Rajagopalan, Cadathur; Eaton, Scott; Kaufman, Sondra; Hebert, Susan; and Fidacaro, James D0632699 Cl. D14-486.
EB Associates, Inc.: See--
Barker, Earl 07886642 Cl. 83-73.
Ebara Corporation: See--
Nakasuji, Mamoru; Noji, Nabuharu; Satake, Tohru; Hatakeyama, Masahiro; Watanabe, Kenji; Kato, Takao; Sobukawa, Hirosi; Karimata, Tsutomu; Yoshikawa, Shoji; Kimba, Toshifumi; Oowada, Shin; Saito, Mutsumi; and Hamashima, Muneki 07888642 Cl. 250-310.
Sekimoto, Masahiko; Katsuoka, Seiji; Dai, Naoki; Watanabe, Teruyuki; Ogawa, Takahiro; Suzuki, Kenichi; Kobayashi, Kenichi; Motoshima, Yasuyuki; and Kato, Ryo 07886685 Cl. 118-400.
eBay Inc.: See--
Barrese, James J.; and Dan, Pritchett L. 07890376 Cl. 705-26.
Kasten, Christopher J.; and Seitz, Greg 07890537 Cl. 707-793.
Pritchett, Dan L; Yang, Connie Y.; Shoup, Randall Scott; and Bhanot, Alok 07889649 Cl. 370-230.
Talbert, Vincent W.; Keithly, Thomas H.; Hirschfeld, Daniel A.; and Lavelle, Mark L. 07890393 Cl. 705-35.
Vogel, Inna; and Ye, Mei 07890383 Cl. 705-26.
Ebens, Jr., Allen J.: See--
Chang, Wesley; de Sauvage, Frederic J.; Eaton, Dan L.; Ebens, Jr., Allen J.; Frantz, Gretchen; Hongo, Jo-Anne S.; Koeppen, Hartmut; Polson, Andrew; and Smith, Victoria 07888478 Cl. 530-387.1.
Ebergen, Josephus C.: See--
Parulkar, Ishwardutt; Ebergen, Josephus C.; and Elkin, Ilyas 07890826 Cl. 714-731.
Eberhardt, Carlos R.: See--
Whitsitt, Michael S.; Lund, Stephanie W.; Busch, Eric P.; Eberhardt, Carlos R.; Neuenschwander, Robb S.; Sawyer, Donald L.; Tetter, Ryan R.; and Van Epern, Lucas W. 07890370 Cl. 705-16.
Ebert, Katrin; Fritsch, Detlev; Plenio, Herbert; and Bengston, Gisela, to GKSS-Forschungszentrum Geesthacht GmbH Immobilized homogeneous catalysts 07888280 Cl. 502-159.
EBI, LLC: See--
Ziolo, Tara; and Leung, Takkwong Ross 07887570 Cl. 606-288.
Ebina, Koichi: See--
Nishioka, Atsushi; Arai, Kenichiro; and Ebina, Koichi 07889611 Cl. 369-53.15.
EBR Systems, Inc.: See--
Brisken, Axel F.; Cowan, Mark W.; Echt, Debra S.; and Riley, Richard E. 07890173 Cl. 607-33.
Eby, Janell: See--
Sekar, Vaithilingam; Lewnau, Carol; Eby, Janell; Atchinson, Brad; and Held, Bruce 07888561 Cl. 800-295.
Eccarius, Steffen: See--
Koltay, Peter; Litterst, Christian; and Eccarius, Steffen 07887621 Cl. 95-260.
Eccleston, Matthew: See--
Waldspurger, Carl A.; and Eccleston, Matthew 07890754 Cl. 713-164.
ECCO Sko A/S: See--
Kasprzak, Dieter D0632466 Cl. D2-951.
Echelon Corporation: See--
vanRuymbeke, Gilles; and Robinson, Andrew 07889471 Cl. 361-59.
Echigo, Masanori: See--
Kohno, Tetsushi; Kikuta, Masaya; Shimura, Norio; Nakano, Takeaki; Kameda, Hirokazu; Endo, Masaaki; Abe, Shigehi; Kuchiki, Manabu; Echigo, Masanori; and Yamaguchi, Munetaka 07889380 Cl. 358-1.18.
EchoStar Technologies L.L.C.: See--
Martch, Henry Gregg; Bazata, Michael John; and Mauser, Benjamin Raymond 07890816 Cl. 714-57.
Echt, Debra S.: See--
Brisken, Axel F.; Cowan, Mark W.; Echt, Debra S.; and Riley, Richard E. 07890173 Cl. 607-33.
Eckbauer, Andreas: See--
Rettig, Ingo; Scheffel, Martin; Hoang, Anh-Tuan; Buehner, Martin; and Eckbauer, Andreas 07886717 Cl. 123-470.
Ecker, David J.; Griffey, Richard H.; Sampath, Rangarajan; Hofstadler, Steven A.; McNeil, John; Crooke, Stanley T.; and Hannis, James C., to IBIS Biosciences, Inc. METHODS FOR RAPID DETECTION AND IDENTIFICATION OF BIOAGENTS IN EPIDEMIOLOGICAL AND FORENSIC INVESTIGATIONS 07226739 Cl. 435-6.
Eckert, Daniel: See--
Flükiger, René; and Eckert, Daniel 07887644 Cl. 148-98.
Eckhardt, William: See--
Garcia, Jr., Robert James; and Eckhardt, William D0632544 Cl. D8-349.
Eckhart, Colin J.; to Sony Ericsson Mobile Communication AB System and method for protecting data based on geographic presence of a restricted device 07890135 Cl. 455-552.1.
Eckstein, Ralf: See--
Bilmayer, Roman; Eckstein, Ralf; Kiforiuk, Alexander; Birkwald, Frank; and Stange, Michael 07887069 Cl. 280-93.514.
Eclipse Aerospace, Inc.: See--
Haaland, Peter D.; and Harness, Ken 07886836 Cl. 169-46.
Eclipse International: See--
Carlitz, Stuart Scott 07886385 Cl. 5-691.
Eclipsys Corporation: See--
Rosow, Eric; Adam, Joe; and Roth, Chris 07890347 Cl. 705-2.
Ecolab Inc.: See--
Tjelta, Brenda L.; Sanders, Lisa M.; and Besse, Michael E. 07888303 Cl. 510-191.
Warf, Jr., C. Cayce; Kemp, G. Kere; and Richards, John 07887850 Cl. 424-661.
Ecolab USA Inc.: See--
Man, Victor Fuk-Pong; Fasching, Gina Marie; Peitersen, Nathan Daniel; and Altier, Mark Raymond 07887641 Cl. 134-27.
Ecole Polytechnique Federale de Lausanne: See--
Barnikow, Jan; Chidley, Christopher; Gronemeyer, Thomas; Heinis, Christian; Jaccard, Hughes; Johnsson, Kai; Juillerat, Alexandre; and Keppler, Antje 07888090 Cl. 435-193.
Deveaud-Plédran, Benoît; Ciuti, Cristiano; and Morier-Genoud, François 07888692 Cl. 257-94.
eComSystems, Inc.: See--
Evans, Jon C. 07890873 Cl. 715-747.
Eda, Takanori: See--
Takashimizu, Satoru; Katsumata, Kenji; Yamamoto, Yuji; Iimuro, Satoshi; Eda, Takanori; and Sei, Shuko 07889281 Cl. 348-725.
Edahiro, Toshiaki: See--
Toda, Haruki; and Edahiro, Toshiaki 07890843 Cl. 714-782.
Edahiro, Toshiaki; Kanda, Kazushige; Tokiwa, Naoya; Futatsuyama, Takuya; Hosono, Koji; and Ohshima, Shigeo, to Kabushiki Kaisha Toshiba Non-volatile memory device and method for writing data thereto 07889537 Cl. 365-148.
Edali Industrial Corporation: See--
Lee, Chung-Yu 07887364 Cl. 439-578.
Eddings, II, Richard; Shepherd, Jason A.; and Bailey, Kevin M., to Dell Products, LP Disk drive access door 07890966 Cl. 720-647.
Edelstein, Daniel C.; Grill, Alfred; Patel, Vishnubhai V.; and Restaino, Darryl D., to International Business Machines Corporation Structures with improved interfacial strength of SiCOH dielectrics and method for preparing the same 07888741 Cl. 257-365.
Eder, Joseph C.; to Boston Scientific Scimed, Inc. Hybrid micro guide catheter 07887529 Cl. 604-523.
Edgar, Albert D.; Iglehart, David C.; and Yeager, Rick B, to TCMS Transparent Beauty LLC Handheld apparatus and method for the automated application of cosmetics and other substances 07890152 Cl. 600-310.
Edgett, Keith: See--
Gorham, Patrick; Edgett, Keith; Roman, Robert; and Wittig, James 07887525 Cl. 604-385.17.
Edison Opto Corporation: See--
Lee, Hsuan-Hsien D0632833 Cl. D26-123.
Educocio S.L.: See--
Tenorio, Jose Maxenchs 07887056 Cl. 273-156.
Edwards, David Lindsay Subsea tanker hydrocarbon production system 07886829 Cl. 166-357.
Edwards Lifesciences Corporation: See--
Bachman, Alan B. 07887552 Cl. 606-139.
Edwards, Michael W.: See--
Holler, Dennis P.; Vollmer, Scott D.; Johnson, Travis S.; Kakani, Sudhakar R.; Hulen, Matthew R.; Anliker, Randall J.; Edwards, Michael W.; Spurgeon, Larry L.; Sheldon, Jr., Victor L.; and Horst, Robert C. 07886705 Cl. 123-142.5R.
Edwards, William T.: See--
Polzin, R. Stephen; and Edwards, William T. 07890138 Cl. 455-557.
Efland, Taylor Rice: See--
Denison, Marie; and Efland, Taylor Rice 07888732 Cl. 257-328.
Egan, Josephine M.; and Doyle, Máire E., to United States of America as represented by the Department of Health and Human Services, The Uses of notch receptors, notch ligands, and notch modulators in methods related to metabolic diseases 07888116 Cl. 435-325.
Egawa, Akira: See--
Uchiyama, Takeshi; Yarita, Mitsuo; and Egawa, Akira 07886597 Cl. 73-504.12.
Eggeman, Timothy J.: See--
Verser, Dan W.; and Eggeman, Timothy J. 07888082 Cl. 435-135.
EGLO Leuchten GmbH: See--
Sabernig, Robert D0632824 Cl. D26-93.
Sabernig, Robert D0632825 Cl. D26-93.
Sabernig, Robert D0632826 Cl. D26-93.
Sabernig, Robert D0632827 Cl. D26-93.
Sabernig, Robert D0632828 Cl. D26-93.
Sabernig, Robert D0632829 Cl. D26-93.
Eguchi, Tatsuo: See--
Nomura, Yasuo; Eguchi, Tatsuo; Terashita, Yasuhiko; Watanabe, Yoshikazu; and Yamaguchi, Nobuaki 07889966 Cl. 386-52.
Eguchi, Yoshiaki: See--
Satoyama, Ai; Eguchi, Yoshiaki; and Nakano, Takahiro 07890720 Cl. 711-162.
Ehr, Chris J.: See--
Johnson, Kristin D.; Ehr, Chris J.; and Arts, Gene H. 07887536 Cl. 606-51.
Ehricht, Ralf; Ellinger, Thomas; Tuchscherer, Jens; Ermantraut, Eugen; Poser, Siegfried; and Schulz, Torsten, to Clondiag Chip Technologies GmbH Microchip matrix device for duplicating and characterizing nucleic acids 07888074 Cl. 435-91.2.
Eidenschink, Tracee: See--
Weber, Jan; and Eidenschink, Tracee 07886569 Cl. 72-402.
Eidson, John C.: See--
Warrior, Jogesh; and Eidson, John C. 07890301 Cl. 702-188.
Eifuku, Hideki: See--
Sakai, Tadahiko; and Eifuku, Hideki 07886432 Cl. 29-840.
Eigler, Neal L.: See--
Wardle, John L.; and Eigler, Neal L. 07890186 Cl. 607-119.
Eiklor Flames, LLC: See--
Eiklor, Scott F. 07886736 Cl. 126-512.
Eiklor, Scott F.; to Eiklor Flames, LLC Gas-fired artificial log burners with heating chamber 07886736 Cl. 126-512.
Eilert, Sean; to Intel Corporation Method and apparatus of cache assisted error detection and correction in memory 07890836 Cl. 714-758.
Eisai R & D Management Co., Ltd.: See--
Iwatsubo, Takeshi; Hashimoto, Tadafumi; and Nagai, Yasuo 07888076 Cl. 435-91.4.
Eisen, Lee Evan; Levitan, David Stephen; O'Connell, Francis Patrick; and Sauer, Wolfram M., to International Business Machines Corporation Method and logical apparatus for managing processing system resource use for speculative execution 07890738 Cl. 712-239.
Eisenberger, Harald; Monteparo, Sandra; Oge-Nichols, Dorothy; and Wiesenthal, Melanie, to Victoria's Secret Stores Brand Management, Inc. Bottle D0632583 Cl. D9-661.
Eisenberger, Harald; Monteparo, Sandra; Oge-Nichols, Dorothy; and Wiesenthal, Melanie, to Victoria's Secret Stores Brand Management, Inc. Bottle D0632584 Cl. D9-667.
Eisener, Bernd: See--
Albers, Sven; Diefenbeck, Klaus; Eisener, Bernd; Langguth, Gernot; Lehrer, Christian; Malek, Karl-Heinz; and Rohrer, Eberhard 07888703 Cl. 257-173.
Eisenhauer, Daniel G.: See--
Bodin, William Kress; Burkhart, Michael John; Eisenhauer, Daniel G.; Schumacher, Daniel Mark; and Watson, Thomas J. 07890848 Cl. 715-201.
Eisert, Rochelle: See--
Yruko, Gregory; Bowen, Kevin; D'Angelo, Mark; Eisert, Rochelle; and Kissel, Michael H 07890342 Cl. 705-2.
Ek, Anders: See--
Lundberg, Hakon; and Ek, Anders D0632701 Cl. D15-1.
Ek, Steven: See--
Bojarski, Ray; Sikora, George; Torrie, Paul Alexander; and Ek, Steven 07887551 Cl. 606-139.
Ekbal, Amal; Lee, Chong U.; and Julian, David Jonathan, to QUALCOMM Incorporated Multiple access techniques for a wireless communication medium 07889753 Cl. 370-431.
Ekelund, Anders: See--
Tornier, Alain; and Ekelund, Anders 07887544 Cl. 606-96.
Ekstrom, Erik; Schell, Craig A.; Kalbfleisch, William; and Bernstein, Eric L., to Black & Decker Inc. Gas concrete saw filtration system 07887624 Cl. 96-421.
El-Aouar, Walid H.: See--
Carter, Daniel S.; Craven, Christopher R.; El-Aouar, Walid H.; Greiner, Craig R; Hieb, Larry E; James, Dean W; Southard, Sandra L; and Williams, Rolando S. 07886930 Cl. 221-150R.
El-Gammal, Mohammed: See--
Fortune, Erik; Wu, Wei; Bennett, Julie D; and El-Gammal, Mohammed 07891008 Cl. 726-27.
El-Ghoroury, Hussein S.; and McNeill, Dale A., to Ostendo Technologies, Inc. LED-based high efficiency illumination systems for use in projection systems 07889430 Cl. 359-641.
El Husseini, Ahmad Mahdi: See--
Swartz, Tanya L.; Zhiyanov, Dmitry V.; Premchandran, Girish; Chopra, Gagan; Kureshy, Arif; El Husseini, Ahmad Mahdi; Pillai, Jayadev; and St. Lorant, Misha H. 07890544 Cl. 707-803.
ELA Medical S.A.S.: See--
Amblard, Amel 07890168 Cl. 607-9.
Ollivier, Jean-Francois; and Bessoule, Frederic 07890189 Cl. 607-122.
Elaasar, Maged E.; to International Business Machines Corporation Configurable pattern detection method and apparatus 07890923 Cl. 717-104.
Elad, Joseph B; Kallurkar, Srikanth V.; Yu, Bin; Dale, Jonathan; and Johnson, Apperson H., to Quantum Leap Research, Inc. Collaboration portal (COPO) a scaleable method, system, and apparatus for providing computer-accessible benefits to communities of users 07890549 Cl. 707-803.
Elan Pharmaceuticals, Inc.: See--
Yan, Riqiang; Tomasselli, Alfredo G.; Gurney, Mark E.; Emmons, Thomas L.; Bienkowski, Michael Jerome; and Heinrikson, Robert L. 07888291 Cl. 506-7.
Elayed, Karim: See--
Bax, Randall L.; Elayed, Karim; and Medina, Paul 07888601 Cl. 174-252.
Elbe, Hans-Ludwig: See--
Bruns, Rainer; Kugler, Martin; Jaetsch, Thomas; Elbe, Hans-Ludwig; Kuhnt, Dietmar; Gebauer, Olaf; and Rieck, Heiko 07888371 Cl. 514-310.
ELC Management LLC: See--
Wang, Tian Xiang; Marotta, Paul; Frampton, Katie Ann; and Mou, Robert 07887861 Cl. 424-765.
Eldred, Bradley J. Organic compound and metal ion synergistic disinfection and purification system and method of manufacture 07887749 Cl. 422-28.
Eldridge, Keith; Mackay, Brian; Johnson, Mark; Volk, Scott; Burke, Kenneth A.; Meskonis, Paul; Hall, Robert; and Dardinski, Steven, to Invensys Systems, Inc. Apparatus and method for configuring and editing a control system with live data 07890927 Cl. 717-110.
Electro Guard Corp.: See--
Todd, John; Sivanesan, Sai; and Cann, David 07890612 Cl. 709-220.
Electro Scientific Industries, Inc.: See--
Barrett, Spencer B.; McCurry, Brandon J.; and Almonte, Kenneth V. 07888949 Cl. 324-601.
Boyle, Adrian; Meighan, Oonagh; Walsh, Gillian; and Mah, Kia Woon 07887712 Cl. 216-65.
Holmgren, Douglas Earl; Lo, Ho Wai; and Conklin, Philip Mitchell 07888620 Cl. 219-121.6.
Kosmowski, Mark T. 07886449 Cl. 33-286.
Kosmowski, Mark T.; Ferguson, Robert; and Willey, Jeremy 07889322 Cl. 355-72.
Nashner, Michael; and Howerton, Jeff 07886437 Cl. 29-852.
Electrolux Home Products Corporation N.V.: See--
Hausen, Philipp 07886754 Cl. 134-184.
Electronics and Telecomminucation Research Institute: See--
Mun, Jae Kyoung; Kim, Dong Young; Lim, Jong Won; Ahn, Ho Kyun; Kim, Hae Cheon; and Yu, Hyun Kyu 07889023 Cl. 333-101.
Electronics and Telecommunications Research Institute: See--
Ahn, Seong Deok; Suh, Kyung Soo; Kang, Seung Youl; Lee, Yong Eui; Kim, Chul Am; Joung, Meyoung Ju; Kim, Mi Kyung; and Lee, Gun Hong 07889419 Cl. 359-296.
Kim, Dae Jun; Song, Yoon Ho; and Jeong, Jin Woo 07887878 Cl. 427-77.
Kim, Seong-Rag; Choi, In-Kyeong; Kwon, Dong-Seung; and Hwang, Seung-Ku 07889805 Cl. 375-267.
Lee, Youngseok; Kim, Changhoon; Seok, Yongho; Choi, Yanghee; and Jeong, Taesoo 07889661 Cl. 370-238.
Nam, Hyun Soon; Choi, Da Hye; and Jeong, You Hyeon 07889693 Cl. 370-328.
Son, Seong-Ho; Eom, Soon-Young; Jung, Young-Bae; Yun, Jae-Seung; and Jeon, Soon-Ik 07888903 Cl. 318-648.
Electronics for Imaging, Inc.: See--
Goel, Puneet; Tandon, Vivek; and Yang, Chueh Cheng 07889361 Cl. 358-1.12.
Kühn, Mario; and Mady, Samer 07889403 Cl. 358-504.
Electroplating Engineers of Japan Limited: See--
Watanabe, Shingo; Ohnishi, Junji; Wachi, Hiroshi; and Sone, Takayuki 07887692 Cl. 205-265.
Element Six Technologies (Pty) Ltd: See--
Scarsbrook, Geoffrey Alan; Martineau, Philip Maurice; Dorn, Barbel Susanne Charlotte; Cooper, Michael Andrew; Collins, John Lloyd; Whitehead, Andrew John; Twitchen, Daniel James; and Sussman, Ricardo Simon 07887628 Cl. 106-286.8.
Eleonori, Mano Cesar: See--
Benzo, Eduardo Rene; Ferraresi, Rodolfo W.; and Eleonori, Mano Cesar 07886379 Cl. 5-612.
Elhag, Sammy I.: See--
Rulkov, Nikolai; Hunt, Mark; Brady, Donald; Elhag, Sammy I.; and Lui, Steve 07887492 Cl. 600-500.
Eliacik, Cemalettin Bora: See--
Sever, Aziz; Lokman, Erhan; Simsek, Altug; Ozumuztoprak, Can; and Eliacik, Cemalettin Bora 07890954 Cl. 719-313.
Elisseeff, André: See--
Ben Hur, Asa; Elisseeff, André; and Guyon, Isabelle 07890445 Cl. 706-45.
Elkin, Ilyas: See--
Parulkar, Ishwardutt; Ebergen, Josephus C.; and Elkin, Ilyas 07890826 Cl. 714-731.
Elkouby, Marcel; and Greenman, Gadi, to Iscar, Ltd. Cutting insert having ceramic coating 07887935 Cl. 428-697.
Ellingboe, Albert Rogers; to Dublin City University Plasma source 07886690 Cl. 118-723E.
Ellinger, Thomas: See--
Ehricht, Ralf; Ellinger, Thomas; Tuchscherer, Jens; Ermantraut, Eugen; Poser, Siegfried; and Schulz, Torsten 07888074 Cl. 435-91.2.
Elliott, Adrian Nicholas Alexander; Falenski, Jason; Lechkun, Dave Michael; and Blust, Craig, to Ford Global Technologies, LLC Simultaneous movement system for a vehicle door 07887118 Cl. 296-155.
Elliott, James Randall: See--
Burnham, Jay Sanford; Comeau, Joseph Kerry Vaughn; Crane, Leslie Peter; Elliott, James Randall; Estes, Scott Alan; Nakos, James Spiros; and White, Eric Jeffrey 07888142 Cl. 438-14.
Elliott, Michael: See--
Murden, II, Franklin Marshall; Bardsley, Scott Gregory; and Elliott, Michael 07889004 Cl. 330-253.
Ellis-Monaghan, John; Johnson, Jeffrey B.; and Loiseau, Alain, to International Business Machines Corporation Predoped transfer gate for a CMOS image sensor 07888156 Cl. 438-57.
Ellis, Richard E.: See--
Darbee, Paul V.; Ellis, Richard E.; Jansky, Louis Steven; and Grossman, Avram S. 06587067 Cl. 341-176.
Ellis, Ryan: See--
Brass, Richard I.; and Ellis, Ryan 07887381 Cl. 440-53.
Elmer, Thomas W.: See--
Gopalsami, Nachappa; Bakhtiari, Sasan; Raptis, Apostolos C.; and Elmer, Thomas W. 07888645 Cl. 250-336.1.
Elphick, Jonathan; to Schlumberger Technology Corporation Waterflooding analysis in a subterranean formation 07890264 Cl. 702-12.
Elpida Memory, Inc.: See--
Fujimoto, Hiroyuki; and Togashi, Yuki 07888737 Cl. 257-347.
Hirota, Toshiyuki; and Tanioku, Masami 07888726 Cl. 257-310.
Idei, Yoji; Hatano, Susumu; Nishio, Yoji; Funaba, Seiji; and Uematsu, Yutaka 07889584 Cl. 365-206.
Kagaya, Yutaka; and Watanabe, Fumitomo 07888179 Cl. 438-113.
Elran, Tomer Shaul; to SanDisk Corporation Low VT dependency RC oscillator 07889018 Cl. 331-176.
Elstow, Corinne: See--
Mayers, Jeffrey; Casey, Elaine; Lamb, John; and Elstow, Corinne D0632579 Cl. D9-531.
Eltav Wireless Monitoring Ltd.: See--
Radomsky, Israel; Fuchs, Reuben; Kalman, Israel; Nemenoff, Amir; and Gal, Ohad 07886766 Cl. 137-554.
Elwood, Jennifer Anne: See--
Berardi, Michael J.; Bliman, Michal; Bonalle, David S.; Elwood, Jennifer Anne; Hood, Matthew C.; Isenberg, Susan E.; Mayers, Alexandra; Perry, Trevor J.; Saunders, Peter D.; Scheding, Kathryn D.; Shah, Sejal Ajit; VonWald, Kristin L.; and Williamson, John R. 07889052 Cl. 340-5.8.
Elysian Field Farms, Inc.: See--
Martin, Keith D. 07887399 Cl. 452-198.
Ema, Taiji: See--
Tsutsumi, Tomohiko; Ema, Taiji; Kojima, Hideyuki; and Anezaki, Toru 07888740 Cl. 257-358.
Emadi, Ali: See--
Lee, Young Joo; and Emadi, Ali 07889524 Cl. 363-65.
Emanuel, Stuart L.: See--
Huang, Shenlin; Lin, Ronghui; Connolly, Peter J.; Emanuel, Stuart L.; Middleton, Steven A.; Gruninger, Robert H.; and Wetter, Steven K. 07888380 Cl. 514-381.
Embarq Holdings Company, LLC: See--
Bugenhagen, Michael K. 07889660 Cl. 370-236.
Bugenhagen, Michael K. 07890111 Cl. 455-445.
Embedded Control Systems, Inc.: See--
Stoner, Paul Douglas 07888813 Cl. 307-9.1.
Stoner, Paul Douglas; and Vlad, Ovidiu Gabriel 07888812 Cl. 307-9.1.
Stoner, Paul Douglas; and Vlad, Ovidiu Gabriel 07888814 Cl. 307-9.1.
EMC Corporation: See--
Desai, Asit A.; and Zulch, Richard C. 07890746 Cl. 713-150.
Gasser, Morrie 07890794 Cl. 714-5.
Linstead, Paul 07890459 Cl. 707-610.
Madnani, Kiran; and DesRoches, David W. 07890795 Cl. 714-6.
Pawar, Sitaram; Bono, Jean Pierre; Bergant, Milena; Potnis, Ajay S.; and Agrawal, Ashwin B. 07890796 Cl. 714-8.
Tao, Tao; Bappe, Michael E.; Sandstrom, Harold M.; Epstein, Edith; West, Eric I.; Raizen, Helen S.; and Kudva, Santhosh V. 07890664 Cl. 710-8.
eMemory Technology Inc.: See--
Tsai, Yu-Hsiung; Huang, Po-Hao; and Chen, Yin-Chang 07889550 Cl. 365-185.02.
Emergent Product Development UK Limited: See--
Feldman, Robert Graham; Dougan, Gordon; Santangelo, Joseph David; Holden, David William; Shea, Jacqueline Elizabeth; and Hindle, Zoe 07887816 Cl. 424-258.1.
Emerson Electric Co.: See--
Sooy, Josh 07889980 Cl. 396-19.
Emerson Process Management Power & Water Solutions, Inc.: See--
Francino, Peter N.; and Cheng, Xu 07890197 Cl. 700-30.
Francino, Peter N.; and Cheng, Xu 07890214 Cl. 700-266.
Emery, Jeffrey Lorne; Jones, Jeffrey M.; Escutia, Raul; and Yee, Stephen Mark, to Intuity Medical, Inc. Fluid sample transport devices and methods 07887494 Cl. 600-584.
Emge, Mark B.; Groener, Gregory M.; Stutz, John J.; Sundoro, Englehard B.; and Swaney, Raymond D., to Garmin Switzerland GmbH Marine microphone D0632679 Cl. D14-225.
Emin, Jean-Luc: See--
Baron, Pascal; Dinh, Binh; Masson, Michel; Drain, Francois; and Emin, Jean-Luc 07887767 Cl. 423-8.
Emmons, James R.: See--
Davis, Dick E.; Emmons, James R.; Kalaghatagi, Amith M.; Lindberg, George R.; and Johnston, James A. 07890249 Cl. 701-124.
Emmons, Thomas L.: See--
Yan, Riqiang; Tomasselli, Alfredo G.; Gurney, Mark E.; Emmons, Thomas L.; Bienkowski, Michael Jerome; and Heinrikson, Robert L. 07888291 Cl. 506-7.
Emori, Akihiko: See--
Miyazaki, Hideki; Emori, Akihiko; Kudo, Akihiko; and Kai, Tsuyoshi 07888945 Cl. 324-434.
Empedocles, Stephen: See--
Bock, Larry; Daniels, R. Hugh; Empedocles, Stephen; and Owicki, John C. 07888292 Cl. 506-7.
Empfield, James: See--
Cacciola, Joseph; Empfield, James; Folmer, James; Hunter, Angela M; and Throner, Scott 07888353 Cl. 514-235.2.
Encell, Lance: See--
Darzins, Aldis; Encell, Lance; Johnson, Tonny; Klaubert, Dieter; Los, Georgyi V.; McDougall, Mark; Wood, Keith V.; Wood, Monika G.; and Zimprich, Chad 07888086 Cl. 435-174.
Endo, Masaaki: See--
Kohno, Tetsushi; Kikuta, Masaya; Shimura, Norio; Nakano, Takeaki; Kameda, Hirokazu; Endo, Masaaki; Abe, Shigehi; Kuchiki, Manabu; Echigo, Masanori; and Yamaguchi, Munetaka 07889380 Cl. 358-1.18.
Endo, Rie; Sakaizawa, Katsuhiro; and Yamamoto, Ryuji, to Canon Kabushiki Kaisha Developing apparatus having a scraping member 07890032 Cl. 399-281.
Endo, Satoshi; to Canon Kabushiki Kaisha Power-line communication device 07889061 Cl. 340-310.12.
Endo, Shin-ichiro: See--
Uchida, Hideki; Sakurai, Risa; Endo, Shin-ichiro; and Kido, Kazuo 07886427 Cl. 29-743.
Endo, Toshikazu: See--
Kang, Byung-Kyoo; and Endo, Toshikazu 07890913 Cl. 716-100.
Endo, Yoshinori; and Amaya, Shinichi, to Xanavi Informatics Corporation Route search method for navigation device 07890258 Cl. 701-209.
Endou, Mayumi: See--
Tazaki, Yuichi; and Endou, Mayumi 07887125 Cl. 296-193.1.
Endress + Hauser Flowtec AG: See--
Froehlich, Thomas; Berger, Andreas; and Bussinger, Klaus 07886615 Cl. 73-861.28.
Koudal, Ole; Matt, Christian; Engstler, Gernot; and Pohl, Hans 07886614 Cl. 73-861.08.
Endress + Hauser GmbH + Co. KG: See--
Lopatin, Sergej; and Pfeiffer, Helmut 07886602 Cl. 73-584.
Endress + Hauser Process Solutions AG: See--
De Groot, Vincent; and Zumoberhaus, Philipp 07890300 Cl. 702-188.
Endress + Hauser Wetzer GmbH + Co. KG: See--
Zinth, Peter; Steidle, Wolfgang; and Stuckl, Tobias 07886579 Cl. 73-31.05.
Endura Products, Inc.: See--
Van Camp, Brent; and Krochmal, Andrew D0632556 Cl. D8-400.
Enge, Harald A.: See--
Purser, Kenneth H.; Enge, Harald A.; and Turner, Norman L. 07888660 Cl. 250-492.21.
Engel, Jürgen; to AEterna Zentaris GmbH Process for preventing protozoal diseases 07887817 Cl. 424-265.1.
Engel, Klaus; and Williams, James, to Siemens Medical Solutions USA, Inc. System and method for in-context MPR visualization using virtual incision volume visualization 07889194 Cl. 345-419.
Engelbart, Roger W; Hannebaum, Reed; Hensley, Brian S; Pollock, Timothy T; and Orr, Samuel D, to Boeing Company, The Apparatus and methods for inspecting tape lamination 07889907 Cl. 382-141.
Engelke, Thomas: See--
Behmenburg, Christof; Job, Heinz; Engelke, Thomas; Kock, Jörg; and Hoinkhaus, Hermann 07886882 Cl. 188-282.4.
Engineering Partners International, Incorporated: See--
Perkin, Gregg Steven; Hadjioannou, John; and O'Connor, Keven Michael 07887271 Cl. 409-143.
England, Jonathan Gerald: See--
Koo, Bon Woong; and England, Jonathan Gerald 07888636 Cl. 250-287.
England, Paul; and Peinado, Marcus, to Microsoft Corporation Saving and retrieving data based on public key encryption 07890771 Cl. 713-193.
Engle, James B.: See--
Coca, Dinesh C.; Engle, James B.; Garcia, Melissa J.; Holdaway, Kevan D.; Hourselt, Andrew G.; and Ricketts, Ashaki A. 07890622 Cl. 709-224.
Engø-Monsen, Kenth: See--
Canright, Geoffrey; Engø-Monsen, Kenth; Bjelland, Johannes; Ling, Richard Seyler; and Sundsøy, Pål Roe 07889679 Cl. 370-254.
Engstler, Gernot: See--
Koudal, Ole; Matt, Christian; Engstler, Gernot; and Pohl, Hans 07886614 Cl. 73-861.08.
Enguita, Eduardo Abanses: See--
Lodge, Christopher James; and Enguita, Eduardo Abanses 07886613 Cl. 73-828.
Enhanced Energy, Inc.: See--
Halek, James Michael; Harris, Philip Aaron; Thompson, Richard; Ferri, Robert; and Squires, Jonathan 07889146 Cl. 343-771.
Enoki, Masayuki; and Kawabata, Kiyoshi, to Fujitsu Toshiba Mobile Communications Limited Mobile station used for CDMA mobile communication systems 07890148 Cl. 455-574.
Enomae, Toshiharu: See--
Kitano, Yoshihisa; and Enomae, Toshiharu 07890036 Cl. 399-320.
Enomoto, Shintaro: See--
Mizuno, Yukitami; Hasegawa, Rei; and Enomoto, Shintaro 07888853 Cl. 313-358.
EnRG Solutions International, LLC: See--
Chaney, James A.; and Akasaki, Guy D0632642 Cl. D13-102.
Entegris, Inc.: See--
Bores, Gregory; Kalia, Suraj; and Tieben, Anthony Mathius 07886910 Cl. 206-710.
Entropic Communications, Inc.: See--
Monk, Anton; Bernath, Brett; Ozturk, Yusuf; and Porat, Ron 07889759 Cl. 370-465.
Envac AB: See--
Kihlström, Christer 07886402 Cl. 15-301.
Enventure Global Technology, L.L.C.: See--
Butterfield, Jr., Charles Anthony; and Brisco, David Paul 07886831 Cl. 166-380.
Enzmann, Mark; Mahler, Roger N.; and Kwong, Kennie Yiu-Hon, to AT&T Mobility II, LLC Interactive push service 07890125 Cl. 455-466.
Eom, Soon-Young: See--
Son, Seong-Ho; Eom, Soon-Young; Jung, Young-Bae; Yun, Jae-Seung; and Jeon, Soon-Ik 07888903 Cl. 318-648.
EPCOS AG: See--
Hesse, Christian 07887713 Cl. 216-86.
Epimmune Inc.: See--
Sette, Alessandro; Chesnut, Robert; Newman, Mark J.; Livingston, Brian D.; Babe, Lilia Maria; Chen, Yiyou; Deyoung, Lawrence M.; Huang, Manley T. F.; and Power, Scott D. 07888472 Cl. 530-350.
Epistar Corporation: See--
Chin, Yu-Ling; Jou, Li-Pin; Yang, Yu-Chih; Yang, Yu-Cheng; Chen, Wei-Shou; and Kuo, Cheng-Ta 07888162 Cl. 438-72.
Epocrates, Inc.: See--
Fiedotin, Richard Alan; Hyde, Geoffrey David; and Fraser, Diane Elizabeth 07890350 Cl. 705-3.
Epoxi Tech, Inc.: See--
Palushaj, Simon D0632537 Cl. D8-90.
Epp, Jeffrey B.; Schmitzer, Paul R.; Ruiz, James M.; Balko, Terry W.; Siddall, Thomas L.; and Yerkes, Carla N., to Dow AgroSciences LLC 2-(poly-substituted aryl)-6-amino-5-halo-4-pyrimidinecarboxylic acids and their use as herbicides 07888287 Cl. 504-239.
Epp, Joachim: See--
Harel, Orit; Hadari, Malkiel; Mandel, Alexander; Epp, Joachim; and Holzman, Ziv 07890389 Cl. 705-28.
Epperson, Ian: See--
Rechsteiner, Paul; Epperson, Ian; Kesteloot, Lawrence; Pearl, Elliott; Watson, Stephen; and Young, Brian 07888582 Cl. 84-633.
Epperson, William T.: See--
Cassady, Tony L.; Epperson, William T.; Jones, Eric L.; Rowell, Kevin J.; and Faver, James A. 07886971 Cl. 235-383.
Epson Toyocom Corporation: See--
Matsunaga, Masayuki; and Sato, Kenji 07886596 Cl. 73-504.02.
Epstein, Edith: See--
Tao, Tao; Bappe, Michael E.; Sandstrom, Harold M.; Epstein, Edith; West, Eric I.; Raizen, Helen S.; and Kudva, Santhosh V. 07890664 Cl. 710-8.
Equitable Life and Casualty Insurance: See--
Trani, Louis M.; and Ross, Earl Roderick 07890354 Cl. 705-4.
Erceg, Vinko: See--
Catreux-Erceg, Severine; Erceg, Vinko; Roux, Pieter; Van Rooyen, Pieter; and Winters, Jack 07890145 Cl. 455-562.1.
Erdelen, deceased, Christoph: See--
Fischer, Reiner; Kunz, Klaus; Lehr, Stefan; Ruther, Michael; Schneider, Udo; Dollinger, Markus; Drewes, Mark Wilhelm; Feucht, Dieter; Konze, Jörg; Wachendorff-Neumann, Ulrike; Bojack, Guido; Auler, Thomas; Hills, Martin Jeffrey; Bretschneider, Thomas; Malsam, Olga; Erdelen, deceased, Christoph; Angermann, Alfred; Kehne, Heinz; and Rosinger, Christopher Hugh 07888285 Cl. 504-138.
Erden, Mehmet F.: See--
Yang, Xueshi; Erden, Mehmet F.; and Kurtas, Erozan M. 07889823 Cl. 375-350.
Ergotron, Inc.: See--
Lindblad, Shaun C.; Hazzard, Joel; Trish, Scott; Fluhrer, Robert W.; and Cain, John 07887014 Cl. 248-123.11.
Erickson, Dave S.: See--
Kelsch, Daniel N.; Mellor, James L.; Rundle, Kenneth P.; Fell, Roger B.; Jahns, Scott E.; Erickson, Dave S.; Fischer, III, Vincent A.; and Anderson, Kent D. 07890192 Cl. 607-130.
Erickson, David J.: See--
Goodmote, John H.; Reiner, Dane E.; and Erickson, David J. 07889601 Cl. 367-176.
Erickson, Dwight D.: See--
Schwabel, Mark G.; and Erickson, Dwight D. 07887608 Cl. 51-307.
Ericson, Richard J.; O'Donnell, Hugh J.; Mello, Ary O.; Barrett, Dale R.; and Rehmer, Dennis J., to Otis Elevator Company Traction enhanced controlled pressure flexible flat tension member termination device 07886878 Cl. 187-411.
Eriksen, Birgitte L.: See--
Peters, Dan; Eriksen, Birgitte L.; Nielsen, Elsebet Østergaard; Scheel-Krüger, Jørgen; and Olsen, Gunnar M. 07888358 Cl. 514-249.
Eriksen, Erik P.; Moffitt, Michael E.; and Warren, Tommy M., to Tesco Corporation Monitoring flow rates while retrieving bottom hole assembly during casing while drilling operations 07886847 Cl. 175-57.
Eriksson, Klas-Göran: See--
Siitonen, Pekka; Liimatainen, Jari; Möller, Tage; Eriksson, Klas-Göran; and Persson, Sture 07887000 Cl. 241-183.
Eriksson, Mark L. MSM component and associated gas panel assembly 07886770 Cl. 137-884.
Eriksson, Sören Sven: See--
Andersson, Ingmar; Eriksson, Sören Sven; Jewitt, Dennis Edward; Klerelid, Ingvar Berndt Erik; Lindén, Anders; and Nilsson, Lars B. 07887673 Cl. 162-202.
Ermantraut, Eugen: See--
Ehricht, Ralf; Ellinger, Thomas; Tuchscherer, Jens; Ermantraut, Eugen; Poser, Siegfried; and Schulz, Torsten 07888074 Cl. 435-91.2.
Ernesti, Bernd: See--
Daum, Andreas W.; Ernesti, Bernd; Colle, Renzo; Griesser, Thomas; Saterdag, Henrik; Zoch, Daniel; Lu, Liwei; Kaas, Markus J.; and Malik, Peter T. 07890462 Cl. 707-620.
Ernst, Larry M.: See--
Bradley, Timothy Graham; and Ernst, Larry M. 07890005 Cl. 399-48.
Errington, Bradley C.; Kanemaru, Junichi; and Burns, Trevor, to Honda Motor Co., Ltd. HVAC reset logic improvement for rear control usability 07886815 Cl. 165-203.
Ervin, Melbourne F.: See--
McDowell, Darrel L.; and Ervin, Melbourne F. 07889516 Cl. 361-826.
Erwin, Jimell; Ryan, III, Thomas W.; and Stanglmaier, Rudolf H., to Southwest Research Institute Fuels for homogenous charge compression ignition engines 07887695 Cl. 208-15.
Esbensen, Daniel; to TC Tech Electronics, LLC Apparatus and method for precision binary numbers and numerical operations 07890558 Cl. 708-204.
Escabia, Jose Gabriel: See--
Comas, Esteve; Escabia, Jose Gabriel; and Boleda, Miquel 07887167 Cl. 347-85.
Escutia, Raul: See--
Emery, Jeffrey Lorne; Jones, Jeffrey M.; Escutia, Raul; and Yee, Stephen Mark 07887494 Cl. 600-584.
Esdaile-Watts, Edward Ellis; Kwan, Kent Benjamen; Abraham, Nicholas Kenneth; Hibbard, Christopher; and Silverbrook, Kia, to Silverbrook Research Pty Ltd Method of depriming a printhead with concomitant isolation of ink supply chamber 07887148 Cl. 347-6.
Esdaile-Watts, Edward Ellis; Kwan, Kent Benjamen; Abraham, Nicholas Kenneth; Hibbard, Christopher; and Silverbrook, Kia, to Silverbrook Research Pty Ltd Pressure-regulating chamber comprising float valve biased towards closure by inlet ink pressure 07887170 Cl. 347-85.
Esenwein, Florian; to Robert Bosch GmbH Electrical device comprising a carbon brush shape adapting device 07888838 Cl. 310-248.
Esmark, Kai: See--
Glaser, Ulrich; Gossner, Harald; and Esmark, Kai 07888701 Cl. 257-109.
Espiard, Philippe; and Mahieuxe, Bruno, to Saint-Gobain Isover Insulation product, such as a thermal insulation product, and production method thereof 07887908 Cl. 428-292.1.
Espiau, Frederick M.; DeVincentis, Marc; Chang, deceased, Yian; and Espiau, legal representative, Frederick M., to Luxim Corporation Plasma lamp with conductive material positioned relative to RF feed 07888874 Cl. 315-39.
Espiau, legal representative, Frederick M.: See--
Espiau, Frederick M.; DeVincentis, Marc; and Chang, deceased, Yian 07888874 Cl. 315-39.
Esposito, Sandro: See--
Boger, Henry W.; and Esposito, Sandro 07890216 Cl. 700-282.
Esselstein, Robert C.: See--
Chiu, Jessica G.; Chan, Gregory Waimong; Asongwe, Gabriel; Esselstein, Robert C.; Gesswein, Douglas; Sridharan, Srinivasan; Bei, Nianjiong Joan; Webler, William E.; Schaible, Stephen G.; Chow, Mina; Shen, Yan; Bai, Hongzhi; Bly, Mark J.; and Hatten, Thomas R. 07887661 Cl. 156-194.
Essig, Heinz-Gerhard: See--
Vogl, Karl-Heinz; and Essig, Heinz-Gerhard 07886533 Cl. 60-484.
Essilor International (Compagnie Générale d'Optique): See--
Drobe, Bjorn; and Pedrono, Claude 07887183 Cl. 351-177.
Nunez, Ivan M.; Sekharipuram, Venkat; Carlesco, Scott J.; and Alron, Michele L. 07887882 Cl. 427-169.
Essman, Stephen James: See--
Tam, Jason; Dickstein, Jeff Joseph; Heitzmann, Lawrence Ronald; Meekins, Andrew Donald; Dumesh, Michael Aleksandrovich; Anderson, Daniel David; Essman, Stephen James; Hahn, Michael Anthony; and Baldacci, Dave 07889147 Cl. 343-777.
Estes, Mark C.; Wenger, Mitchell; Mernoe, Morten; Causey, James; and Kirschen, Todd, to Asante Solutions, Inc. Operating an infusion pump system 07887512 Cl. 604-151.
Estes, Scott Alan: See--
Burnham, Jay Sanford; Comeau, Joseph Kerry Vaughn; Crane, Leslie Peter; Elliott, James Randall; Estes, Scott Alan; Nakos, James Spiros; and White, Eric Jeffrey 07888142 Cl. 438-14.
Esumi, Atsushi; Li, Kai; and Mizuno, Hidemichi, to Rohm Co., Ltd. Baseline correction apparatus 07889446 Cl. 360-25.
Etheridge, Jr., Ronald D.: See--
Tarleton, Rick L.; and Etheridge, Jr., Ronald D. 07888135 Cl. 436-518.
Ethicon Endo-Surgery, Inc.: See--
Schwemberger, Richard F.; and Kelly, William D. 07886953 Cl. 227-178.1.
Stokes, Michael J.; Shelton, IV, Frederick E.; Ortiz, Mark S.; and Plescia, David N. 07887554 Cl. 606-144.
Ethicon, Inc.: See--
Cichocki, Jr., Frank Richard; Demarest, David; Hollin, Gregory; and Reynolds, Eugene D. 07887746 Cl. 266-252.
Etkin, Henry; to Redlands Technology, LLC System and method for dynamically generating, maintaining, and growing an online social network 07890871 Cl. 715-738.
Etoh, Takuya: See--
Naitoh, Yutaka; Yamazoe, Yoshikazu; Nanno, Shigeo; Saito, Osamu; and Etoh, Takuya 07890017 Cl. 399-107.
Ettori, Benjamin; Bocek, Joseph M.; and Kim, Jaeho, to Cardiac Pacemakers, Inc. Rate aberrant beat selection and template formation 07890170 Cl. 607-14.
Euler, Theresa Renee: See--
Barsness, Eric Lawrence; Beuch, Daniel E.; Euler, Theresa Renee; Nelsestuen, Paul Stuart; and Santosuosso, John Matthew 07890480 Cl. 707-702.
Eun, Jong-Moon: See--
Kweon, Dae-Seob; Noh, Joo-Hwan; Eun, Jong-Moon; and Sur, Jean-Man 07890022 Cl. 399-120.
Eurenco: See--
Mahe, Bernard 07887651 Cl. 149-109.6.
Euro-Pro Operating LLC: See--
Metaxatos, Paul; Stavrinou, Andrea; and Provolo, Dann D0632523 Cl. D7-412.
Eurofase Inc.: See--
Bitton, Jacques D0632822 Cl. D26-74.
Eustace, Anthony Roger: See--
Or Sim, Lim; Cheong, Yee Han; Jarrett, Andrew Lawrence; Bey, Shefik; Eustace, Anthony Roger; and Petit, Matthew James 07890579 Cl. 709-203.
EV3 Endovascular, Inc.: See--
Young, Michelle M.; Oman, Jana F.; and Barratt, Paul R. 07887562 Cl. 606-213.
ev3 Inc.: See--
Kusleika, Richard S. 07887560 Cl. 606-191.
Evans, Dean R.: See--
Cook, Gary; and Evans, Dean R. 07889413 Cl. 359-245.
Evans, Douglas G; Goldman, Scott M.; and Kronengold, Russell T., to Kensey Nash BVF Technology, LLC Devices and methods for treating defects in the tissue of a living being 07887598 Cl. 623-23.51.
Evans, Jon C.; to eComSystems, Inc. System and method for computer-created advertisements 07890873 Cl. 715-747.
Evans, Merle E.; Hashem, Ghazi J.; Setterberg, Jr., John Richard; Badrak, Robert P.; and Maguire, Patrick G., to Watherford/Lamb, Inc. Energizing seal for expandable connections 07887103 Cl. 285-333.
Evans, Michael E.; to Owens Corning Intellectual Capital, LLC Loosefill package for blowing wool machine 07886904 Cl. 206-321.
Evans, Paul G.: See--
Lagally, Max G.; Evans, Paul G.; and Ritz, Clark S. 07888583 Cl. 136-200.
Evans, Scott C.; Tomlinson, Harold T.; Liu, Ping; and Weerakoon, Ishan P., to Lockheed Martin Corporation Information dissemination method and system having minimal network bandwidth utilization 07889743 Cl. 370-394.
Evans, Simon J. W.; to Codian Ltd Hardware architecture for video conferencing 07889226 Cl. 348-14.09.
Evans, Steven L.: See--
Smith, Kelley A.; Webb, Steven R.; Evans, Steven L.; Mihaliak, Charles A.; Merlo, Donald J.; and Letchworth, Geoffrey J. 07888069 Cl. 435-69.3.
Eveleens, Jan Leendert; to Florist de Kwakel B.V. Gerbera plant named ‘Klondike’ PP021716 Cl. PLT-357.
Eveready Battery Company, Inc.: See--
Crawford, John D.; Spartano, David A.; and Hoffman, Peter F. 07888883 Cl. 315-291.
Fitch, Jonathan A; and Kingston, Ronald J D0632646 Cl. D13-107.
Fitch, Jonathan A; and Kingston, Ronald J D0632647 Cl. D13-107.
Everest Water, Ltd.: See--
Anderson, Rae; and White, Keith 07886557 Cl. 62-272.
Evering, Hans-Gerd: See--
Thiebaud, Pierre; Vecten, Didier; Favre, Yvan; and Evering, Hans-Gerd 07887509 Cl. 604-114.
Everlight Electronics Co., Ltd.: See--
Hsieh, Chung-Chuan D0632659 Cl. D13-180.
Lin, Jung-Chiuan D0632658 Cl. D13-180.
Everlokt Corporation: See--
Stein, John William 07890055 Cl. 455-41.1.
Evernu Technology, LLC: See--
Lin, Manhua; and Pillai, Krishnan S. 07888281 Cl. 502-242.
Evers, Daniel; and Ziroff, Andreas, to Siemens Aktiengesellschaft Radial gap measurement on turbines 07889119 Cl. 342-118.
Everson, David C.: See--
Weinstein, Peter Michael; and Everson, David C. 07886681 Cl. 114-299.
Everspin Technologies, Inc.: See--
Mather, Phillip Glenn; Dave, Renu W.; and Mancoff, Frederick B. 07888756 Cl. 257-421.
Evgeny Pavlovich Germanov: See--
Kutushov, Mikhail Vladimirovich 07888284 Cl. 502-400.
Evonik Degussa GmbH: See--
Deng, Yi; Oswald, Monika; Deller, Klaus; Clasen, Rolf; and Fehringer, Georg 07887923 Cl. 428-469.
Schumacher, Kai; and Oswald, Monika 07888396 Cl. 516-81.
Simon, Ulrich; Monsheimer, Sylvia; Grebe, Maik; and Altkemper, Stefan 07887740 Cl. 264-497.
Evrogen Joint Stock Company: See--
Lukyanov, Sergey A. 07888113 Cl. 435-320.1.
Ewen, John F.; to International Business Machines Corporation Low-voltage CMOS error amplifier with implicit reference 07888998 Cl. 330-11.
Exclara, Inc.: See--
Shteynberg, Anatoly; and Rodriguez, Harry 07888881 Cl. 315-291.
Exelixis, Inc.: See--
Friedman, Lori; Francis-Lang, Helen; Parks, Annette L.; Shaw, Kenneth James; Bjerke, Lynn Margaret; and Heuer, Timothy S. 07888047 Cl. 435-7.21.
Friedman, Lori S.; Francis-Lang, Helen; Parks, Annette L.; Shaw, Kenneth James; Heuer, Timothy S.; and Bjerke, Lynn Margaret 07888048 Cl. 435-7.21.
Exersmart, LLC: See--
Ross, Glenn D.; Olschansky, Brad R.; Olschansky, Scott M.; and Abelbeck, Kevin G. 07887468 Cl. 482-92.
Expolmaging, Inc.: See--
Baker, John B.; and Sowder, Erik D0632831 Cl. D26-118.
Extreme Networks, Inc.: See--
Bauder, James R.; Vu, Khoi D.; Fatherree, Kevin S.; Khattar, Siddharth; Swenson, Erik R.; and Cimino, Kathleen E. 07889658 Cl. 370-236.
Parker, David K. 07889750 Cl. 370-412.
ExxonMobil Chemical Patents Inc.: See--
Iaccino, Larry L.; Stavens, Elizabeth L.; and Sangar, Neeraj 07888543 Cl. 585-412.
ExxonMobil Research and Engineering Company: See--
Poirier, Marc-Andre; and Crouthamel, Kevin L. 07888298 Cl. 508-496.
Ezure, Yuichiro: See--
Ito, Tetsuya; Hasegawa, Jun; Itaya, Satoko; Matsumoto, Akira; Iizuka, Hiroyuki; Ezure, Yuichiro; Hasegawa, Akio; Davis, Peter; Kadowaki, Naoto; and Obana, Sadao 07890112 Cl. 455-445.