| US 7,492,657 B2 | ||
| Semiconductor device temperature sensor and semiconductor storage device | ||
| Atsumasa Sako, Kawasaki (Japan) | ||
| Assigned to Fujitsu Limited, Kawasaki (Japan) | ||
| Filed on Oct. 04, 2006, as Appl. No. 11/542,139. | ||
| Application 11/542139 is a continuation of application No. PCT/JP2004/008630, filed on Jun. 18, 2004. | ||
| Prior Publication US 2007/0036015 A1, Feb. 15, 2007 | ||
| Int. Cl. G11C 7/00 (2006.01) | ||
| U.S. Cl. 365—222 [365/212; 365/189.09] | 10 Claims |
| 1. A semiconductor device temperature sensor performing temperature detection by producing a reference level for temperature detection from two or more reference levels of different temperatures. |