| US 7,491,922 B1 | ||
| System and methods for image acquisition | ||
| Shrenik Deliwala, Andover, Mass. (US); and Allen M. Flushberg, Newton, Mass. (US) | ||
| Assigned to Science Research Laboratory, Inc., Somerville, Mass. (US) | ||
| Filed on Apr. 25, 2006, as Appl. No. 11/410,812. | ||
| Claims priority of provisional application 60/674419, filed on Apr. 25, 2005. | ||
| Int. Cl. G02F 1/01 (2006.01) | ||
| U.S. Cl. 250—208.1 [250/330] | 23 Claims |
| 1. An image acquisition system comprising:
a pixellated optical transducer capable of absorbing electromagnetic radiation in a first range of wavelengths; the electromagnetic
radiation being received from an input source of electromagnetic radiation; each pixel in said pixellated optical transducer
being substantially thermally isolated from each other pixel in said pixellated optical transducer;
another source of electromagnetic radiation in a second range of wavelengths;
said pixellated optical transducer being also capable of causing, when the electromagnetic radiation from said another source
interacts with said pixellated optical transducer after absorption of a portion of electromagnetic radiation from the input
source, a variation in phase of electromagnetic radiation in the second range of wavelengths emanating from the optical transducer;
said pixellated optical transducer comprising at least one layer of material capable of absorbing the portion of electromagnetic
radiation from the input source; said at least one layer of material being disposed on a support; said support being capable
of allowing transmission of electromagnetic radiation in the second range of wavelengths; alteration in optical thickness
of said at least one layer of material resulting from absorbing the portion of electromagnetic radiation from the input source;
an image being obtained from alteration in optical thickness of said at least one layer of material, said alteration resulting
from absorbing the portion of electromagnetic radiation from the input source;
said pixellated optical transducer being capable of receiving electromagnetic radiation in the first range of wavelengths
at least one surface and of receiving electromagnetic radiation in the second range of wavelengths at least another surface;
an optical system capable of receiving electromagnetic radiation emanating from said another source, providing a portion of
the received electromagnetic radiation emanating from said another source to said optical transducer, and of receiving a portion
of the electromagnetic radiation in the second range of wavelengths emanating from the optical transducer;
a detector;
said optical system being also capable of imaging an interference pattern onto said detector; the interference pattern being
obtained from a portion of the electromagnetic radiation emanating from said another source and the portion of the electromagnetic
radiation in the second range of wavelengths emanating from the optical transducer; and
an analysis component capable of obtaining intensity information from the interference pattern;
whereby the obtained intensity information provides an image of the input source.
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