US 7,490,984 B2
Method of making an imaging inspection apparatus with improved cooling
Ashwinkumar C. Bhatt, Endicott, N.Y. (US); Varaprasad V. Calmidi, Binghamton, N.Y. (US); James J. McNamara, Jr., Vestal, N.Y. (US); and Sanjeev Sathe, San Jose, Calif. (US)
Assigned to Endicott Interconnect Technologies, Inc., Endicott, N.Y. (US)
Filed on Feb. 22, 2008, as Appl. No. 12/71,537.
Application 12/071537 is a division of application No. 11/141494, filed on Jun. 01, 2005, granted, now 7,354,197.
Prior Publication US 2008/0144768 A1, Jun. 19, 2008
This patent is subject to a terminal disclaimer.
Int. Cl. H01J 35/10 (2006.01); H01J 35/12 (2006.01); H05G 1/02 (2006.01); G01N 23/083 (2006.01)
U.S. Cl. 378—200  [378/9; 378/57] 15 Claims
OG exemplary drawing
 
1. A method of making an imaging inspection apparatus for inspecting objects located within articles, said method comprising:
providing a frame structure including a plurality of passages therein and an inspection location located substantially therein;
positioning from twenty to forty XCT scanning devices on said frame structure adjacent said inspection location, said XCT scanning devices adapted for directing X-rays onto articles at said inspection location to thereby inspect said articles and for providing output signals as a result of said inspecting;
positioning a processing and analysis assembly on said frame structure, said processing and analysis assembly adapted for receiving said output signals from said XCT scanning devices and for analyzing said output signals to identify said objects within said articles; and
providing a cooling structure adapted for directing cooling fluid through said plurality of passages within said frame structure relative to said XCT scanning devices to cool said XCT scanning devices during operation thereof.