| US 7,490,413 B2 | ||
| Contour measuring device with error correcting unit | ||
| Qing Liu, Shenzhen (China); Jun-Qi Li, Shenzhen (China); and Takeo Nakagawa, Tokyo (Japan) | ||
| Assigned to Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd., ShenZhen, Guangdong Province (China); Hon Hai Precision Industry Co., Ltd., Tu-Cheng, Taipei Hsien (Taiwan); and Fine Tech Corporation, Tokyo (Japan) | ||
| Filed on Aug. 23, 2007, as Appl. No. 11/843,664. | ||
| Claims priority of application No. 2006-258042 (JP), filed on Sep. 22, 2006. | ||
| Prior Publication US 2008/0072442 A1, Mar. 27, 2008 | ||
| Int. Cl. G01B 5/20 (2006.01); G01B 11/24 (2006.01) | ||
| U.S. Cl. 33—552 [33/1 M; 33/546] | 14 Claims |
| 1. A contour measuring device, comprising:
a pair of guide rails;
a movable fixture movably disposed on the guide rails;
a first probe for measuring an object along a contour measuring direction and obtaining a first measured contour value from
the object to be measured;
a second probe for measuring a standard object whose contour is known along the contour measuring direction and obtaining
a second measured contour value from the standard object; and
an error correcting unit for compensating the first measured contour value according to the second measured contour value.
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