| US 7,489,403 B1 | ||
| Electronic testing apparatus and testing method thereof | ||
| Chien-Der Lin, Sinshih Township, Tainan County (Taiwan); Wen-Chung Hsu, Sinshih Township, Tainan County (Taiwan); Tsung-Kai Chuang, Sinshih Township, Tainan County (Taiwan); and Jiann-Hua Wang, Sinshih Township, Tainan County (Taiwan) | ||
| Assigned to Kaiwood Technology Co., Ltd., Sinshih Township (Taiwan) | ||
| Filed on Mar. 11, 2008, as Appl. No. 12/73,880. | ||
| Claims priority of application No. 96144856 A (TW), filed on Nov. 26, 2007. | ||
| Int. Cl. G01N 21/84 (2006.01) | ||
| U.S. Cl. 356—429 [356/947] | 13 Claims |
| 1. An electronic testing apparatus, comprising:
a testing paper, having a first reaction line and a second reaction line;
a circuit board, having a light source, a first detector, and a second detector equipped thereon, wherein the light source
is disposed between the first detector and the second detector; and
a light shelter, defining a first chamber, a second chamber, and a third chamber, wherein there is a first slit configured
between the first chamber and the second chamber, and a second slit configured between the second chamber and the third chamber;
wherein the first chamber, the second chamber, and the third chamber respectively shelter the first detector, the light source,
and the second detector, the first detector detects a reflected light of a light projected by the light source to the first
window through the first slit, and the second detector detects a reflected light of the light projected by the light source
to the second window through the second slit.
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