| US 7,488,991 B2 | ||
| Molecular controlled semiconductor device | ||
| David Cahen, Rechovot (Israel); and Igor Lubomirsky, Petach-Tikva (Israel) | ||
| Assigned to Yeda Research And Development Co. Ltd., Rechovot (Israel) | ||
| Filed on Dec. 02, 2005, as Appl. No. 11/292,370. | ||
| Claims priority of provisional application 60/632536, filed on Dec. 03, 2004. | ||
| Prior Publication US 2006/0118903 A1, Jun. 08, 2006 | ||
| Int. Cl. H01L 29/74 (2006.01) | ||
| U.S. Cl. 257—106 [257/104; 257/494; 257/E29.013; 257/E29.019; 257/E29.338; 257/E29.335; 436/151] | 44 Claims |

| 1. A semiconductor sensing device, comprising:
(a) a device body made of at least a first region a second region and a third region forming at least one p-n junction thereamongst,
said first region being made of a first type semiconductor material and said second and said third regions being made of a
second type semiconductor material wherein charge carrier concentrations of said regions of said semiconductor materials are
selected such that a current-voltage characteristic of said at least one p-n junction comprises a predetermined reverse breakdown
voltage;
(b) at least one layer of molecules deposited on at least one of said regions of said semiconductor materials, said molecules
being electrically-responsive to a species-of-interest being at least one of a photon, a chemical substance and a biological
material in a manner such that upon exposure of the device to said species-of-interest, said molecules interact with said
species-of-interest, and said predetermined reverse breakdown voltage is modified; and
(c) a perforated electrode disposed on said third region and being connectable to a voltage source, for electrically controlling
said predetermined reverse breakdown voltage.
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