| US 7,488,607 B2 | ||
| Electronically readable microarray with electronic addressing function | ||
| May Tom-Moy, San Carlos, Calif. (US); Carl Myerholtz, Cupertino, Calif. (US); August Hidalgo, San Fancisco, Calif. (US); and William McAllister, Saratoga, Calif. (US) | ||
| Assigned to Agilent Technologies, Inc., Santa Clara, Calif. (US) | ||
| Filed on Sep. 30, 2003, as Appl. No. 10/676,707. | ||
| Prior Publication US 2005/0079505 A1, Apr. 14, 2005 | ||
| Int. Cl. G01N 33/551 (2006.01); G01N 33/553 (2006.01) | ||
| U.S. Cl. 436—524 [422/82.01; 422/82.02; 435/6; 435/287.2; 435/973; 436/149; 436/525; 436/527; 436/806; 436/809; 436/815; 436/817] | 19 Claims |
| 1. A method of detecting a target in a sample, the method comprising:
(a) contacting a microarray with the sample, the microarray comprising a plurality of features disposed on a substrate, each
feature comprising a first electrode disposed on the substrate, a second electrode disposed on the substrate, a pad of resistive
material disposed on the substrate between the first electrode and the second electrode, said pad of material comprising a
material selected from the group consisting of carbon thin film, metal thin film, metal nitride, nichrom (NiCr), tantalum
nitride (Ta2N), silicon chrome, and metal oxide, and a probe supported on the pad of resistive material, the substrate comprising integrated
addressing circuitry in operable relation to each of the plurality of features;
(b) applying a source of metal ions to the plurality of features to result in metal deposited between the first electrode
and the second electrode of said features where the target is present, said metal providing a change in an observable property
of at least one of the plurality of features;
(c) providing a signal to the addressing circuitry to select one of the plurality of features to be interrogated; and
(d) measuring the observable property at the selected feature to detect the target.
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