	US 7,486,770 B2
	Focus-detector arrangement of an X-ray apparatus for generating projective or tomographic phase contrast recordings
Joachim Baumann, München (Germany); Christian David, Lauchringen (Germany); Martin Engelhardt, München (Germany); Jorg Freudenberger, Eckental (Germany); Eckhard Hempel, Fürth (Germany); Martin Hoheisel, Erlangen (Germany); Thomas Mertelmeier, Erlangen (Germany); Franz Pfeiffer, Brugg (Switzerland); Stefan Popescu, Erlangen (Germany); and Manfred Schuster, München (Germany)
Assigned to Siemens Aktiengesellschaft, Munich (Germany)
Filed on Jan. 31, 2007, as Appl. No. 11/700,172.
Claims priority of application No. 10 2006 004 604 (DE), filed on Feb. 01, 2006; application No. 10 2006 004 976 (DE), filed on Feb. 01, 2006; and application No. 10 2006 037 256 (DE), filed on Aug. 09, 2006.
Prior Publication US 2007/0183583 A1, Aug. 09, 2007
Int. Cl. G01N 23/04 (2006.01)

U.S. Cl. 378—62 [378/4; 378/21; 378/70; 378/145]

53 Claims

1. A focus-detector arrangement of an X-ray apparatus for generating at least one of projective and tomographic phase contrast recordings of a subject, comprising:

a radiation source with a focus, arranged on a first side of the subject, to generate a fan-shaped or conical beam of X-rays;

at least one X-ray optical grating arranged in the beam path, with at least one phase grating arranged on an opposite second side of the subject in the beam path to generate an interference pattern of the X-radiation; and

an analysis-detector system to detect at least the interference pattern generated by the phase grating in respect of its phase shift with position resolution, wherein the at least one X-ray optical grating comprises bars which are free from overhangs forming shadows in the beam path of the fan-shaped or conical beam of rays, wherein the at least one X-ray optical grating is designed to be curved around the focus at least in a first section plane.