| US 7,485,852 B2 | ||
| Mass analysis method and mass analysis apparatus | ||
| Hiromichi Yamashita, Hitachinaka (Japan); Akihiro Takeda, Hitachinaka (Japan); Tomoyuki Kurosawa, Hitachi (Japan); and Kinya Kobayashi, Hitachi (Japan) | ||
| Assigned to Hitachi High-Technologies Corporation, Tokyo (Japan) | ||
| Filed on May 30, 2006, as Appl. No. 11/442,113. | ||
| Claims priority of application No. 2005-156508 (JP), filed on May 30, 2005. | ||
| Prior Publication US 2006/0289736 A1, Dec. 28, 2006 | ||
| Int. Cl. B01D 59/44 (2006.01) | ||
| U.S. Cl. 250—282 [250/281; 250/286; 250/288; 422/68.1; 422/70; 702/23; 702/27] | 12 Claims |
| 1. A mass analysis method for analyzing components of a sample by ionizing and mass-analyzing the sample:
obtaining a mass spectrum by ionizing a standard sample, selecting an ion from the obtained mass spectrum as a first precursor
ion, and obtaining a mass spectrum of the first precursor ion;
obtaining a mass spectrum by ionizing a sample of interest to be measured, selecting an ion from the obtained mass spectrum
as a second precursor ion with exclusion of an ion common to the first precursor ion, and obtaining a mass spectrum of the
second precursor ion;
selecting: a mass spectrum of an ion, in the first precursor ion, common to the ion of mass spectrum of the sample of interest
to be measured; a mass spectrum of an ion, in the first precursor ion, different to the ion of mass spectrum of the sample
of interest to be measured; and a mass spectrum of the second precursor ion; and
comparing the selected mass spectra with each other, thereby analyzing the component of the sample of interest to be measured.
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