LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 20th DAY OF January, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).
Na, Chan Ju: See--
Ikeda, Toshimichi; Na, Chan Ju; and Jeong, Kyu Cheon
07478671 Cl. 165-296.
Na, Sang-Ju; and Jin, Byoung-Yoon, to LG Electronics Inc. Hinge frame for portable computer and structure for mounting the same
07480131 Cl. 361-683.
Nabel, Gary J.: See--
June, Carl H.; Thompson, Craig B.; Nabel, Gary J.; Gray, Gary S.; and Rennert, Paul D.
07479269 Cl. 424-93.71.
Nabors, C. David: See--
DeBenedictis, Leonard C.; Nabors, C. David; and Frangineas, George
07480086 Cl. 359-201.
Nadalin, David M.: See--
Novak, Michael J.; Nadalin, David M.; Olson, Kipley J.; Larkin, Kevin P.; and Sanborn, Frank G.
07480868 Cl. 715-746.
Nadamoto, Hiroyasu: See--
Makishima, Hiroyuki; and Nadamoto, Hiroyasu
07478537 Cl. 62-133.
Nadar, Mariappan S.: See--
Flipo, Aurelien; and Nadar, Mariappan S.
07480400 Cl. 382-128.
Nadeau, Douglas P.: See--
Ogilvie, Clarence Rosser; Winn, Charles B.; Milton, David Wills; Lauricella, Kenneth Anthony; Sharma, Nitin; Schanely, Paul Mark; Herzl, Robert Dov; Horton, Robert Spencer; Wilder, Tad Jeffrey; and Nadeau, Douglas P.
07480888 Cl. 716-14.
Nagabuchi, Ritaro: See--
Kubota, Masao; and Nagabuchi, Ritaro
07479527 Cl. 525-526.
Nagahama, Tsutomu; Kiso, Hiroyuki; and Miyaki, Yukio, to Sony Corporation Light diffusion sheet and method of producing the light diffusion sheet, and screen
07480097 Cl. 359-449.
Nagahara, Seiji; and Hiroi, Masayuki, to Nec Electronics Corporation Chemically amplified resist composition, process for manufacturing semiconductor device and patterning process
07479361 Cl. 430-270.1.
Nagai, Mizuki; Kanda, Hiroyuki; Kurashina, Keiichi; Yamamoto, Satoru; Suzuki, Hidenao; Mishima, Koji; Baker-O'Neal, Brett C.; Deligianni, Hariklia; and Kwietniak, Keith, to Ebara Corporation Plating method and plating apparatus
07479213 Cl. 205-170.
Nagakura, Clyde H.; Chiu, Po Weng; and Zhou, Qinggang, to Denace Enterprise Co., L.L.C. Customizable ASIC with substantially non-customizable portion that supplies pixel data to a mask-programmable portion in multiple color space formats
07480010 Cl. 348-553.
Nagano, Naoki: See--
Kaneko, Jun; Nagano, Naoki; Kamoto, Satoru; Fujii, Katsushi; Shinoda, Mayumi; Fuse, Atsushi; and Kohno, Michinari
07480693 Cl. 709-201.
Nagao, Naoyuki; to Fujitsu Component Limited Interface device, and method and computer readable product for updating firmware in the interface device
07480905 Cl. 717-171.
Nagarajan, Erumaipatty R.: See--
Kim, Kimoon; Baek, Kangkyun; Kim, Jeeyeon; Hwang, Iiha; Ko, Young Ho; Selvapalam, Narayanan; Nagarajan, Erumaipatty R.; and Park, Kyeng Min
07479254 Cl. 422-61.
Nagarajan, Ramaswamy: See--
Tripathy, deceased, Sukant; Samuelson, Lynne A.; Bruno, Ferdinando F.; Roy, Sucharita; Nagarajan, Ramaswamy; Kumar, Jayant; Ku, Bon-Cheol; and Lee, Soo-Hyoung
07479329 Cl. 428-681.
Nagareda, Takeshi: See--
Wakitani, Noboru; Takamoto, Junji; Nagareda, Takeshi; Ito, Kuniaki; Nagata, Hideo; Igarashi, Hiroshi; and Onda, Akio
07479064 Cl. 463-36.
Nagasawa, Hiroyuki; Egashira, Yoshinori; Yamana, Yoshihiro; Saito, Hidekazu; and Kimura, Hiroki, to Bridgestone Sports Co., Ltd. Golf ball
07479533 Cl. 528-76.
Nagata, Hideo: See--
Wakitani, Noboru; Takamoto, Junji; Nagareda, Takeshi; Ito, Kuniaki; Nagata, Hideo; Igarashi, Hiroshi; and Onda, Akio
07479064 Cl. 463-36.
Nagata, Tsukasa: See--
Ohara, Kiyotaka; and Nagata, Tsukasa
07479964 Cl. 345-581.
Nagayama, Midori: See--
Hoshi, Tadashi; Hirose, Kenji; Abe, Hideaki; Nishimoto, Junichi; and Nagayama, Midori
07479823 Cl. 327-545.
Nagy, Christopher: See--
Osterloh, Christopher L.; and Nagy, Christopher
07479895 Cl. 340-870.02.
Naick, Indran; and Wilson, Jeffrey Kenneth, to International Business Machines Corporation Using phone service to initiate requests for web information
07480695 Cl. 709-206.
Naidu, Ravendra: See--
Dunlop, Eric H.; Naidu, Ravendra; and Mallavarapu, Megharaj
07479226 Cl. 210-602.
Naik, Parag; to Genesis Microchip Inc. Reducing power consumption of a microprocessor
07480809 Cl. 713-300.
Nair, Hari N.; to Genesis Microchip Inc. Temporal motion vector filtering
07480334 Cl. 375-240.16.
Naito, Kinshiro; Shimizu, Masayuki; Endo, Shigeru; Matsumoto, Takashi; Nakai, Hiroshi; and Kobayashi, Hiroyuki, to Amada Company, Limited Die and die device
07479004 Cl. 425-416.
Najt, Paul M.: See--
Kuo, Tang-Wei; Najt, Paul M.; Wermuth, Nicole; and Eng, James A.
07478620 Cl. 123-294.
Nakabayashi, Takaaki; Saito, Yoshihiro; Okuma, Toshiyuki; and Ishino, Toshiki, to Canon Kabushiki Kaisha Head mounted apparatus
07480133 Cl. 361-683.
Nakabayashi, Yukio; Nishinohara, Kazumi; Kinoshita, Atsuhiro; and Koga, Junji, to Kabushiki Kaisha Toshiba Field effect transistor
07479674 Cl. 257-288.
Nakagawa, Atsuji: See--
Ushijima, Shinichi; Nakagawa, Atsuji; and Fujii, Toshitaka
07478928 Cl. 362-261.
Nakagawa, Tomohide: See--
Tamura, Tsutomu; Nakagawa, Tomohide; Kouketsu, Shoji; Maruyama, Gaku; Tsutsumi, Daisuke; Koizumi, Junji; Ito, Katsushi; and Mizutani, Haruyasu
07479315 Cl. 428-36.91.
Nakahara, Koichi: See--
Mikura, Tsutomu; Ikeda, Kota; and Nakahara, Koichi
07479862 Cl. 336-200.
Nakahata, Yuji: See--
Inoue, Hiroyasu; Otani, Minoru; Nakahata, Yuji; Murata, Satoshi; Nakayama, Norimichi; and Sugimura, Hiroyuki
07480027 Cl. 349-190.
Nakai, Hiroshi: See--
Naito, Kinshiro; Shimizu, Masayuki; Endo, Shigeru; Matsumoto, Takashi; Nakai, Hiroshi; and Kobayashi, Hiroyuki
07479004 Cl. 425-416.
Nakai, Yoshihiro: See--
Nishikawa, Taichiro; and Nakai, Yoshihiro
07478665 Cl. 164-482.
Nakaji, Takayuki: See--
Endo, Kazuya; Miyamoto, Naoki; Mizuno, Toshio; Nakaji, Takayuki; Uchida, Takatoshi; Ookado, Kazuo; and Yokota, Yoshikazu
07480164 Cl. 363-147.
Nakajima, Eiji: See--
Nanjo, Yuzuru; Nakajima, Eiji; and Kondo, Akihiro
07480479 Cl. 399-328.
Nakajima, Ken; and Sato, Nobuyuki, to Sony Corporation Image device and method for removing noise
07479993 Cl. 348-241.
Nakajima, Tatsutoshi; to Nippon Filcon Co., Ltd. Press fabric for pulp machine
07478655 Cl. 139-383A.
Nakakita, Hideaki: See--
Shimojo, Yoshimitsu; and Nakakita, Hideaki
07480247 Cl. 370-236.
Nakamura, Eiji; Mizutani, Yasuji; and Yamamoto, Takayuki, to Toyota Jidosha Kabushiki Kaisha Brake control device and brake control method
07478887 Cl. 303-113.4.
Nakamura, Hiroyuki: See--
Yamakawa, Takehiko; Yamaguchi, Hiroshi; Nakatsuka, Hiroshi; Nakamura, Hiroyuki; Onishi, Keiji; and Ishizaki, Toshio
07479847 Cl. 333-133.
Nakamura, Kentaro; Ooi, Hiroki; and Ishikawa, George, to Fujitsu Limited Wavelength division multiplexing transmission system
07480459 Cl. 398-83.
Nakamura, Makoto; Hara, Seinosuke; Suga, Seiji; Watanabe, Masahiko; and Hokari, Tomio, to Hitachi, Ltd. Variably operated valve system for compression ignition engine
07478614 Cl. 123-90.15.
Nakamura, Satoshi; to Rohm Co., Ltd. Circuit assembly for battery pack or the like, and method of making the same
07479345 Cl. 429-129.
Nakamura, Shuji: See--
Feezell, Daniel F.; Cohen, Daniel A.; Farrell, Robert M.; Ishida, Masahiro; and Nakamura, Shuji
07480322 Cl. 372-50.124.
Nakamura, Takehiro: See--
Uebayashi, Shinji; Onoe, Seizo; Ishii, Minami; and Nakamura, Takehiro
07480277 Cl. 370-335.
Nakamura, Takeshi; to Murata Manufacturing Co., Ltd. Speaker cabinet and speaker device
07478703 Cl. 181-199.
Nakamura, Tomohisa: See--
Takenoshita, Hiroyuki; Sasaki, Hideki; Nakamura, Tomohisa; and Koyama, Seiji
07480141 Cl. 361-695.
Nakamura, Yukio: See--
Otani, Seiichi; Nakamura, Yukio; and Furusato, Mamoru
07479255 Cl. 422-94.
Nakamuta, Kazuhiro; Honda, Iwao; and Kuroda, Takashi, to Sanyo Electric Co., Ltd. Memory Access apparatus
07480188 Cl. 365-189.01.
Nakano, Hiroshi: See--
Tanaka, Kanji; Arai, Hiroshi; and Nakano, Hiroshi
07478963 Cl. 402-26.
Nakano, Shiro: See--
Yamanaka, Kosuke; Nakano, Shiro; Higashi, Kenji; Ishihara, Atsushi; and Maeda, Daisuke
07479089 Cl. 475-344.
Nakano, Tomoyuki: See--
Takizawa, Keiji; Otagiri, Yoshihiro; and Nakano, Tomoyuki
07480018 Cl. 349-106.
Nakano, Yoshiaki; to Sharp Kabushiki Kaisha I/Q demodulation circuit
07480348 Cl. 375-324.
Nakao, Kazunari; Okumura, Yoshiyuki; Matsumizu, Miyako; Ueno, Naomi; Hashizume, Yoshinobu; Kato, Tomoki; Kawai, Akiyoshi; Miyake, Yoriko; Nukui, Seiji; Shinjyo, Katsuhiro; and Taniguchi, Kana, to RaQualia Pharma Inc. Aryl or heteroaryl fused imidazole compounds as anti-inflammatory and analgesic agents
07479564 Cl. 548-304.4.
Nakao, Kenji; Ogawa, Shinji; and Wakemoto, Hirofumi, to Toshiba Matsushita Display Technology Co., Ltd. Liquid crystal display panel in which the rubbing directions of the pair of alignment films are oriented toward a side of a main diffusion source of impurity ions
07480023 Cl. 349-126.
Nakao, Makiko; to Fujitsu Limited Authentication information processing method, program, and device
07480932 Cl. 726-2.
Nakasuji, Mamoru; Kato, Takao; Watanabe, Kenji; Yoshikawa, Shoji; Satake, Tohru; and Noji, Nobuharu, to Ebara Corporation Electron beam apparatus and device manufacturing method using the same
07479634 Cl. 250-310.
Nakatake, Yoshihiro: See--
Kai, Yasukazu; and Nakatake, Yoshihiro
07480841 Cl. 714-724.
Nakatsuka, Hiroshi: See--
Yamakawa, Takehiko; Yamaguchi, Hiroshi; Nakatsuka, Hiroshi; Nakamura, Hiroyuki; Onishi, Keiji; and Ishizaki, Toshio
07479847 Cl. 333-133.
Nakaya, Teruomi: See--
Shigemi, Masashi; Koike, Akira; Ueno, Makoto; Hirotani, Tomonari; Nakaya, Teruomi; Wakai, Hiroshi; and Iwata, Toru
07480548 Cl. 701-7.
Nakayama, Fumitaka; Morikawa, Masatoshi; Hoshino, Yutaka; and Uchiyama, Tetsuo, to Renesas Eastern Technology Corp. Multilayered semiconductor structure containing a MISFET, a resistor, a capacitor, and an inductor
07479681 Cl. 257-379.
Nakayama, Koji: See--
Ito, Koji; Nakayama, Koji; Murashima, Hiroshi; and Hashiguchi, Takuji
07478896 Cl. 347-20.
Nakayama, Norimichi: See--
Inoue, Hiroyasu; Otani, Minoru; Nakahata, Yuji; Murata, Satoshi; Nakayama, Norimichi; and Sugimura, Hiroyuki
07480027 Cl. 349-190.
Nakazawa, Ikuo: See--
Suda, Sakae; Sato, Koichi; Nakazawa, Ikuo; Ikegami, Masayuki; and Tsubaki, Keiichiro
07479512 Cl. 523-160.
Nalco Company: See--
Adams, Robert R.; Banks, Rodney H.; Chattoraj, Mita; and Schwartz, Joe L.
07479490 Cl. 514-229.8.
Nalnenl, Malahal R.: See--
Jujjuri, Venkateswararao; Nalnenl, Malahal R.; Prasad, Rohit K.; Rajaram, Senthil; and Raphael, Roger C.
07480654 Cl. 707-8.
Nam, Nicholas; to OmniVision Technologies, Inc Multi-video interface for a mobile device
07480484 Cl. 455-3.06.
Nam, Nyun-woo: See--
Goh, Ji-hyun; and Nam, Nyun-woo
07480002 Cl. 348-333.05.
Nam, Seung-Hoon: See--
Hwang, Chan-Soo; Kim, Yung-Soo; Nam, Seung-Hoon; and Chung, Jae-Hak
07480339 Cl. 375-267.
Nam, Young-Dong: See--
Park, Byung-Wook; Cho, Byeong-Hwan; Nam, Young-Dong; and Kim, Bo-Yeon
07479793 Cl. 324-754.
Namba, Takanori; and Ito, Masayasu, to Koito Manufacturing Co., Ltd. Vehicle lighting apparatus
07479743 Cl. 315-307.
NAMCO BANDAI Games Inc.: See--
Yamaguchi, Kentaro; and Saito, Yoshihito
07479961 Cl. 345-426.
Namgoong, John E.: See--
Woo, Hyosang; Park, JongMin; Ahn, Jaesung; Jung, Do Yang; and Namgoong, John E.
07479786 Cl. 324-431.
Namkoong, Kak: See--
Oh, Kwang-wook; Namkoong, Kak; and Park, Chin-sung
07478792 Cl. 251-11.
Nammo Raufoss AS: See--
Nanbu, Kohhei; to Sharp Kabushiki Kaisha Backlight and liquid crystal display device
07478920 Cl. 362-225.
Nanjo, Yuzuru; Nakajima, Eiji; and Kondo, Akihiro, to Kyocera Mita Corporation Fixing apparatus
07480479 Cl. 399-328.
Nanjyo, Takeshi: See--
Katoh, Seiichi; Nanjyo, Takeshi; and Ohtaka, Koichi
07480090 Cl. 359-290.
Nanomix, Inc.: See--
Jhi, Seung-Hoon; Kwon, Young-Kyun; Bradley, Keith; and Gabriel, Jean-Christophe P.
07479240 Cl. 252-182.32.
Nansei, Hiroyuki: See--
Higashi, Masahiko; and Nansei, Hiroyuki
07479427 Cl. 438-258.
Nantero, Inc.: See--
Bertin, Claude L.; Guo, Frank; Rueckes, Thomas; Konsek, Steven L.; Meinhold, Mitchell; Strasburg, Max; Sivarajan, Ramesh; and Huang, X. M. Henry
07479654 Cl. 257-40.
Nanya Technology Corporation: See--
Chiu, Chui-fu; and Wu, Wen-Bin
07480892 Cl. 716-21.
Naoi, Satoshi: See--
Jun, Sun; Katsuyama, Yutaka; and Naoi, Satoshi
07480408 Cl. 382-176.
Jun, Sun; Katsuyama, Yutaka; and Naoi, Satoshi
07480409 Cl. 382-176.
Napadensky, Eduardo; and Levy, Avi, to Objet Geometries Ltd. Compositions and methods for use in three dimensional model printing
07479510 Cl. 522-75.
Napier, Christopher D.: See--
Cook, Norman D.; Napier, Christopher D.; Embly, Robert B.; and Robinson, Darrell
07479029 Cl. 439-517.
Nappa, Mario Joseph: See--
Minor, Barbara Haviland; Nappa, Mario Joseph; Sievert, Allen Capron; and Leck, Thomas J.
07479239 Cl. 252-68.
Nara, Kazutaka: See--
Hasegawa, Junichi; and Nara, Kazutaka
07480091 Cl. 359-325.
Narayanabhatla, Shiva: See--
Oh, Dae-Sik; Yarkosky, Mark L.; Hayne, Kristin A.; Ngan, John Cheong Wai; Asif, Saad Z.; and Narayanabhatla, Shiva
07480485 Cl. 455-7.
Woleben, Samuel M.; Narayanabhatla, Shiva; Barbee, Bryan T; and Sill, Timothy W.
07480510 Cl. 455-453.
Narayanan, Vijay: See--
Bojarczuk, Jr., Nestor A.; Cabral, Jr., Cyril; Cartier, Eduard A.; Copel, Matthew W.; Frank, Martin M.; Gousev, Evgeni P.; Guha, Supratik; Jammy, Rajarao; Narayanan, Vijay; and Paruchuri, Vamsi K.
07479683 Cl. 257-410.
Narita, Toru: See--
Okada, Yoshikazu; Narita, Toru; and Fujisawa, Shinsuke
07479252 Cl. 419-38.
Narumi, Satoshi: See--
Hosokawa, Hiroshi; Tsuda, Kiyonori; Narumi, Satoshi; Takeichi, Ryuta; Arai, Yuji; Kawasumi, Masanori; Umemura, Kazuhiko; Ishii, Hiroshi; Fukuchi, Yutaka; Suzuki, Kazuki; Noguchi, Yuusuke; Kuma, Kazuosa; and Kikura, Makoto
07480476 Cl. 399-258.
Nase, Rainer; to Austria Card Plastikkarten und Ausweissysteme GmbH Method and apparatus for block-oriented memory management provided in smart card controllers
07480775 Cl. 711-154.
Naso, Michael: See--
Song, Xiao-yu R.; Huang, Chong; Ma, Keying; Liang, Bailin; and Naso, Michael
07479479 Cl. 514-2.
Natarajan, Rohit; Lakshmanamurthy, Sridhar; and Kuo, Chen-Chi, to Intel Corporation Apparatus and method to merge and align data from distributed memory controllers
07480781 Cl. 711-170.
Natarajan, Saravana P.: See--
Weller, Thomas M.; Fries, David P.; and Natarajan, Saravana P.
07479864 Cl. 336-200.
National Formosa University: See--
National Institute of Information and Communications Technology: See--
National Instruments Corporation: See--
Cetrulo, Raffaele; and Whittington, Mark
07480126 Cl. 361-91.1.
Joffrain, Philippe G.; Sumner, Joel; Shah, Darshan K.; and Nattinger, Darren M.
07480906 Cl. 717-171.
National Semiconductor Corporation: See--
Broach, Michael Eugene; and De Stasi, Frank John
07479778 Cl. 324-117R.
Hariman, George Adrian; and Tomiyoshi, Kenji
07479812 Cl. 327-102.
Hopper, Peter J.; Vashchenko, Vladislav; Lindorfer, Philipp; and Strachan, Andy
07479435 Cl. 438-303.
Johnson, Mark Alan; and Mayes, Larry W.
07479399 Cl. 438-33.
Scheuerlein, Eric; and Archer, Donald M.
07480190 Cl. 365-189.05.
National University of Singapore: See--
Tan, Woei Wan; Ge, Pei; Tay, Eng Hock Francis; and Phang, Jyh Siong
07478559 Cl. 73-718.
Nattinger, Darren M.: See--
Joffrain, Philippe G.; Sumner, Joel; Shah, Darshan K.; and Nattinger, Darren M.
07480906 Cl. 717-171.
Nawracala, Bernd: See--
Falk-Jordan, Stefan; Nawracala, Bernd; and Zimmermann, Hans-Peter
07480053 Cl. 356-444.
NCR Corporation: See--
Poynter, William Douglas
07480405 Cl. 382-162.
NEC Corporation: See--
Ito, Yoshio; and Yamamoto, Katsushi
07480313 Cl. 370-473.
Ojima, Kenichi; and Tsuchiya, Manabu
07480118 Cl. 360-92.
Shintani, Tatsuyuki
07480518 Cl. 455-522.
Yoshikawa, Masahide
07480379 Cl. 379-433.06.
Nec Electronics Corporation: See--
Kawashima, Hidekazu
07479836 Cl. 331-74.
Nagahara, Seiji; and Hiroi, Masayuki
07479361 Cl. 430-270.1.
Takewaki, Toshiyuki; and Ueno, Kazuyoshi
07479700 Cl. 257-758.
Negami, Takayuki: See--
Hashimoto, Yasuhiro; Negami, Takayuki; and Satoh, Takuya
07479596 Cl. 136-256.
Negevtech Ltd.: See--
Furman, Dov; Dotan, Noam; and Miklatzky, Efraim
07480039 Cl. 356-237.2.
Neiss, Jason H.: See--
Maier, John S.; and Neiss, Jason H.
07479966 Cl. 345-589.
Nell, Joachim: See--
Bayer, Ronald; Jungbecker, Johann; Linkenbach, Steffen; Nell, Joachim; and Muth, Norman
07478573 Cl. 74-388R.
Nelsestuen, Gary L; to Regents of the University of Minnesota Modified vitamin K-dependent polypeptides
07479551 Cl. 536-23.1.
Nelson, Andrew: See--
Wengrovitz, Michael S.; and Nelson, Andrew
07480284 Cl. 370-352.
Nelson, Eric D.: See--
van Egmond, Cor F.; Nelson, Eric D.; Smith, Lawrence C.; Searle, Ronald G.; Beech, Jr., James H.; and Nicoletti, Michael P.
07479468 Cl. 502-52.
Neopost Technologies: See--
Bernard, Emmanuel; Gregoire, Jean-Pierre; and Multignier, Alain
07478808 Cl. 271-248.
Nepil, Mark; and Torp, Clyde, to Keson Industries Chalk line apparatus with a spool configured to avoid cavitation
07478484 Cl. 33-414.
Nerhood, Robert: See--
Lawrence, Bradley Michael; McGrew, Allison; and Nerhood, Robert
07480154 Cl. 361-826.
Nessett, Danny M.; and Young, Albert, to 3Com Corporation Enhancement to authentication protocol that uses a key lease
07480939 Cl. 726-22.
Nessler, Winfried: See--
Aigner, Robert; Marksteiner, Stephan; and Nessler, Winfried
07479851 Cl. 333-189.
Nestec S.A.: See--
Couzy, François; and Boissin-Delaporte, Catherine
07479286 Cl. 424-442.
NetApp, Inc.: See--
Somavarapu, Nagender
07480778 Cl. 711-159.
netCOMPONENTS, Inc.: See--
Nett, Juergen; and Gerngross, Tillman, to GlycoFi, Inc. ARG1, ARG2, ARG3, HIS1, HIS2, HIS5, HIS6 genes and methods for stable genetic integration
07479389 Cl. 435-471.
Netter, Christian M.: See--
Zepke, Bruce E.; Veronesi, William A.; Zacchio, Joseph; Stucky, Paul A.; Bellamy, Dennis W.; Netter, Christian M.; Vecchiotti, Alberto; Bacellar, Adriana H.; Bacellar, Luiz F.; and Haas, Deborah C.
07479861 Cl. 336-178.
Neumaier, Henrich: See--
Waldi, Wolfgang; Hug, Kuno; Betz, Thomas; Thomas, Volker; Neumaier, Henrich; Klonecki, Peter; and Ries, Christian
07479612 Cl. 200-507.
Neumann, Douglas T.: See--
Harry, Brian D.; Harry, Craig A.; Pinnix, Justin E.; and Neumann, Douglas T.
07480896 Cl. 717-120.
Neumann, Eric W.: See--
Larsen, Todd W.; and Neumann, Eric W.
07478647 Cl. 137-613.
Neumann, Gerold; and Birke, Peter, to Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. Pasty materials with nanocrystalline materials for electromechanical components and layers and electromechanical components with said materials
07479350 Cl. 429-217.
Neumayer, Deborah A.: See--
Edelstein, Daniel C.; Gates, Stephen M.; Grill, Alfred; Lane, Michael; Lin, Qinghuang; Miller, Robert D.; Neumayer, Deborah A.; and Van Nguyen, Son
07479306 Cl. 427-447.
New, Bernard J.: See--
Simkins, James M.; Young, Steven P.; Wong, Jennifer; New, Bernard J.; and Ching, Alvin Y.
07480690 Cl. 708-523.
New Cell Formulations, Ltd.: See--
New Dimensions Research Corporation: See--
Mason, Timothy L.
07478731 Cl. 211-59.3.
New Tech Copper S.A.: See--
Casanova, Manuel Rafael Umana
07479209 Cl. 204-279.
New York University: See--
Canary, James Wayne; Seeman, Nadrian C.; Zhu, Lei; and Lukeman, Philip
07479548 Cl. 536-23.1.
Frangione, Blas; Wisniewski, Thomas; and Sigurdsson, Einar M.
07479482 Cl. 514-12.
Neway, III, William E.: See--
Bugianesi, Robert L.; Doherty, George A.; Gentry, Amy; Hale, Jeffrey J.; Lynch, Christopher L.; Mills, Sander G.; and Neway, III, William E.
07479504 Cl. 514-422.
Newisys, Inc.: See--
Coleman, Richard A.; Christensen, Steven M.; and Pugley, John R.
07480146 Cl. 361-719.
Newman, Keith G.; to Sun Microsystems, Inc. Solder interconnect integrity monitor
07478741 Cl. 228-103.
Newsom, Paul E.; to General Electric Company Apparatus and methods for operating a cooking appliance
07479006 Cl. 431-12.
Ngai, Henry P.; to Pericom Semiconductor Corp. Pseudo-ethernet switch without ethernet media-access-controllers (MAC's) that copies ethernet context registers between PCI-express ports
07480303 Cl. 370-395.5.
Ngan, John Cheong Wai: See--
Oh, Dae-Sik; Yarkosky, Mark L.; Hayne, Kristin A.; Ngan, John Cheong Wai; Asif, Saad Z.; and Narayanabhatla, Shiva
07480485 Cl. 455-7.
NGK Insulators, Ltd.: See--
Sakai, Masahiro; Tanaka, Mitsuhiro; and Egawa, Takashi
07479658 Cl. 257-79.
Nguyen, Andrew: See--
Buchberger, Jr., Douglas A.; Hoffman, Daniel J.; Ramaswamy, Kartik; Nguyen, Andrew; Hanawa, Hiorji; Collins, Kenneth S.; and Al-Bayati, Amir
07479456 Cl. 438-706.
Nguyen, Andy T.: See--
Zhou, Shi-dong; Huang, Gubo; Nguyen, Andy T.; and Cline, Ronald L.
07479805 Cl. 326-83.
Nguyen, Anh: See--
Banik, Michael S.; Couvillon, Jr., Lucien Alfred; Nguyen, Anh; and Stahley, William H.
07479106 Cl. 600-159.
Nguyen, Huy Son; to XILINX, Inc. Pull-up voltage circuit
07480192 Cl. 365-189.11.
Nguyen, Logan A.: See--
Nguyen, Phu; and Nguyen, Logan A.
07478779 Cl. 244-31.
Nguyen, Nhiem Viet; to Hamilton Beach Brands, Inc. Gravity biased grill wires
07479295 Cl. 426-468.
Nguyen, Nhut; Wu, Matt; and Lin, Rosa, to Samsung Electronics Co., Ltd. Apparatus and method for scalable call-processing system
07480244 Cl. 370-235.
Nguyen, Nick N.; Jackson, Richard A.; and Fang, Yan, to Ethicon, Inc. Automated endoscope reprocessor solution testing
07479257 Cl. 422-119.
Nguyen, Phu; and Nguyen, Logan A. Device and method for sealing and lighting a balloon
07478779 Cl. 244-31.
Nguyen, Thang Q.: See--
Martin, Harold M.; Nguyen, Thang Q.; and Ikonomopoulos, Gus P.
07480837 Cl. 714-55.
Nguyen, Thomas: See--
Hwang, Guang-Yaw; Nguyen, Thomas; Chou, Wen-Ben; Tran, Timothy; and Yang, Yu-Wei
07479458 Cl. 438-714.
Ni, Jim Chin-Nan; Ma, Abraham C.; Hsueh, Paul; and Shen, Ming-Shiang, to Super Talent Electronics, Inc. Manufacturing process for a super-digital (SD) flash card with slanted asymmetric circuit board
07479039 Cl. 439-620.15.
Ni, Quan: See--
Hartley, Jesse W.; Stahmann, Jeffrey; Lee, Kent; and Ni, Quan
07479114 Cl. 600-529.
Nichia Corporation: See--
Takine, Kenji; and Yamashita, Ryohei
07479665 Cl. 257-99.
Nickels, Jr., Richard C: See--
O'Banion, Michael L; Rudolph, Scott; Nickels, Jr., Richard C; and Berry, Robert A
07478987 Cl. 411-413.
Nickolaus, Ralf; Rink, Heinz-Peter; Clauss, Reinhold; Wessling, Elisabeth; Löcken, Wilma; Bendix, Maximilian; and Mikolajetz, Dunja, to BASF Coatings AG Aqueous coating substance that is substantially or completely free of volatile organic substances, method for producing the same and the use thereof
07479520 Cl. 524-507.
Nicolai, Jean; and Rimpault, Marie, to STMicroelectronics S.A. Fractal-coding addressing of reference block memories
07480415 Cl. 382-232.
Nicolal, Philippe: See--
Germain, Pierre; and Nicolal, Philippe
07480866 Cl. 715-736.
Nicolas, Corinne: See--
Pintos, Jean-François; Mocquard, Olivier; Robert, Jean-Luc; Thudor, Franck; and Nicolas, Corinne
07479929 Cl. 343-772.
Nicoletti, Michael P.: See--
van Egmond, Cor F.; Nelson, Eric D.; Smith, Lawrence C.; Searle, Ronald G.; Beech, Jr., James H.; and Nicoletti, Michael P.
07479468 Cl. 502-52.
NIDEC Sankyo Corporation: See--
Kobayashi, Kazutaka
07479721 Cl. 310-91.
Nielsen, Ole Neis; to Bang & Olufsen Icepower A/S Digital pulse width controlled oscillation modulator
07479840 Cl. 332-109.
Niemi, Sami; Johansson, Karl-Anders; and Stén, Johan, to Scalado AB Method for processing a digital image and image representation format
07480418 Cl. 382-246.
Niessen, Wiro Joep; Van De Kraats, Everine Brenda; Van Walsum, Theo; Rommes, Eeico Lennart; Ivanov, Eugene; and America, Petrus Hubertus Maria, to Koninklijke Philips Electronics N.V. X-ray examination apparatus and method
07478949 Cl. 378-205.
NIFCO Inc.: See--
Kawaguchi, Gaku; and Sim, Ki-Po
07478459 Cl. 24-170.
Sato, Hiroji; Kurihara, Kazumasa; Kobayashi, Yasutomo; Kimisawa, Toshihide; and Kojima, Takeshi
07478729 Cl. 210-491.
Nihon Dempa Kogyo Co., Ltd.: See--
Asamura, Fumio; Kawahata, Kenji; and Sakamoto, Katsuaki
07479856 Cl. 333-204.
Mitome, Hiroyuki; Ito, Manabu; and Uchida, Takeshi
07479835 Cl. 331-69.
Niklas, Karl: See--
Feist, Guenter; and Niklas, Karl
07479865 Cl. 336-229.
Nikon Corporation: See--
Nilsen, Thomas: See--
Sack, James A.; Nilsen, Thomas; and Vandoren, Arnold E.
07479607 Cl. 200-4.
Ning, Gang: See--
Fife, James Allen; Sebald, Zebbie Lynn; and Ning, Gang
07480130 Cl. 361-516.
Ning, Tak H.: See--
Cai, Jin; Haensch, Wilfried E.; and Ning, Tak H.
07479418 Cl. 438-154.
Ning, Xian J.; to Semiconductor Manufacturing International (Shanghai) Corporation Seal ring structures with unlanded via stacks
07479699 Cl. 257-751.
Nintendo Co., Ltd.: See--
Wakitani, Noboru; Takamoto, Junji; Nagareda, Takeshi; Ito, Kuniaki; Nagata, Hideo; Igarashi, Hiroshi; and Onda, Akio
07479064 Cl. 463-36.
Nippon Filcon Co., Ltd.: See--
Nakajima, Tatsutoshi
07478655 Cl. 139-383A.
Nippon Telegraph and Telephone Corporation: See--
Shimamura, Toshishige; Morimura, Hiroki; Fujii, Koji; Shigematsu, Satoshi; and Machida, Katsuyuki
07480785 Cl. 712-16.
Nippon Thompson Co., Ltd.: See--
Nishida, Hiroshi: See--
Himi, Yoshihiro; Nishida, Hiroshi; and Sakamoto, Koichi
07479849 Cl. 333-134.
Nishida, Masami: See--
Takamori, Satoshi; Uchida, Tsuyoshi; and Nishida, Masami
07478972 Cl. 403-409.1.
Nishide, Yasushi: See--
Ishizuka, Ryuichi; Kodama, Mari; and Nishide, Yasushi
07480413 Cl. 382-202.
Nishigaki, Morio; and Suzuki, Takao, to Panasonic Corporation Ultrasonic diagnostic equipment
07479110 Cl. 600-443.
Nishigaki, Takahiro: See--
Yamaguchi, Katsuhiko; Harada, Osamu; Kobayashi, Yukio; Ueoka, Kiyoshiro; Nishigaki, Takahiro; Tomatsuri, Mamoru; and Muta, Koichiro
07478691 Cl. 180-65.2.
Nishihara, Eiji: See--
Imamura, Atsushi; Sano, Hiroshi; Nishihara, Eiji; and Shiomi, Junichi
07480407 Cl. 382-173.
Nishikawa, Hiroshi; Maruchi, Noritoshi; and Murakami, Tohru, to Minolta Company, Ltd. Apparatus for transporting a sheet into a reading position
07478809 Cl. 271-264.
Nishikawa, Taichiro; and Nakai, Yoshihiro, to Sumitomo Electric Industries, Ltd. Method of manufacturing magnesium alloy material
07478665 Cl. 164-482.
Nishimoto, Junichi: See--
Hoshi, Tadashi; Hirose, Kenji; Abe, Hideaki; Nishimoto, Junichi; and Nagayama, Midori
07479823 Cl. 327-545.
Nishimura, Joji: See--
Tsuchiya, Hitoshi; and Nishimura, Joji
07480022 Cl. 349-123.
Nishimura, Kazumasa: See--
Ide, Yosuke; Saito, Masamichi; Ishizone, Masahiko; Hasegawa, Naoya; and Nishimura, Kazumasa
07480122 Cl. 360-324.12.
Nishimura, Masafumi: See--
Mori, Shinsuke; Nishimura, Masafumi; and Itoh, Nobuyasu
07480612 Cl. 704-9.
Nishimura, Takuya: See--
Fukushima, Toshiyuki; Gotoh, Yoshiho; and Nishimura, Takuya
07480439 Cl. 386-46.
Nishino, Seiji; Wada, Hidenori; Komma, Yoshiaki; Mizuno, Sadao; and Matsuzaki, Keiichi, to Panasonic Corporation Optical head device and optical information apparatus using the same
07480227 Cl. 369-112.05.
Nishinohara, Kazumi: See--
Nakabayashi, Yukio; Nishinohara, Kazumi; Kinoshita, Atsuhiro; and Koga, Junji
07479674 Cl. 257-288.
Nishio, Chikara: See--
Hara, Yasushi; Nishio, Chikara; Abe, Makoto; Hirabayashi, Masashi; Yamada, Hiroshi; Takahashi, Toshikazu; and Tanaka, Akira
07478937 Cl. 362-606.
Nishiyama, Kiyoshi; to Japan Science and Technology Agency System estimation method and program, recording medium, and system estimation device
07480595 Cl. 703-1.
Nishizawa, Hirotaka; Osawa, Kenji; Higuchi, Akira; Osako, Junichiro; and Wada, Tamaki, to Renesas Technology Corp. Method of manufacturing an IC card
07478473 Cl. 29-834.
Nissan Technical Center North America, Inc.: See--
Nissin Kogyo Co., Ltd.: See--
Nitta, Haruki: See--
Takezaki, Masanori; Komaru, Masayuki; Nitta, Haruki; Yagi, Takafumi; and Mizuno, Yoshiyuki
07479013 Cl. 439-55.
Nitto Denko Corporation: See--
Greener, Jehuda; Elman, James F.; Rao, YuanQiao; Hammerschmidt, Jon A.; and Bailey, David B.
07479309 Cl. 428-1.3.
Hashimoto, Kouichi; and Yamamoto, Kazuhiko
07479317 Cl. 428-40.1.
Rao, YuanQiao; Robello, Douglas R.; and Miller, Anne M.
07480021 Cl. 349-117.
Niu, Shouye; to Elegance Eyeglasses Factory Plug connection type eyeglasses assembly
07478905 Cl. 351-58.
Niu, Xiaomu: See--
Tomes, Dwight; Salvi, Silvio; Morgante, Michele; Sponza, Giorgio; Bruggemann, Edward; Niu, Xiaomu; Li, Bailin; and Tuberosa, Roberto
07479584 Cl. 800-320.1.
Niv, Haim Obstacle and terrain avoidance sensor
07479920 Cl. 342-65.
Noborio, Yasuhisa: See--
Kamikido, Yoshinobu; Shikida, Masaru; Noborio, Yasuhisa; Okuni, Hitoshi; and Toyofuku, Kumi
07480871 Cl. 715-789.
Nobunaga, Dean; and Abedifard, Ebrahim, to Micron Technology, Inc. Internal data comparison for memory testing
07480195 Cl. 365-201.
Noda, Koji; to Kabushiki Kaisha Toshiba Bearing and X-ray diagnostic apparatus using same
07478948 Cl. 378-193.
Noda, Masaaki; Terao, Atsuhito; and Asayama, Sanae, to Panasonic Corporation High-frequency receiver and portable device using the same
07480496 Cl. 455-130.
Noel, Thomas Olivier Marie: See--
Guezengar, Dominique; Hernandez, Didier Hippolyte; Noel, Thomas Olivier Marie; and Zischek, Michel
07478534 Cl. 60-796.
Noelle, Phillipe; to Honeywell International, Inc. Variable nozzle device
07478991 Cl. 415-159.
Noetzel, Siegfried; Bogardi, Jean-Philippe; and Mangold, Dieter, to Roche Diagnostics Operations, Inc. Analytical test element and method for blood analyses
07479393 Cl. 436-179.
Noguchi, Kazuhiro; and Okada, Tadanori, to Canon Kabushiki Kaisha Variable magnification lens having image stabilizing function
07479985 Cl. 348-208.5.
Noguchi, Soh; Sato, Tsutomu; Tomura, Tatsuya; and Ueno, Yasunobu, to Ricoh Company, Ltd. Recording and reading method and device for dye based write-once DVD medium
07480223 Cl. 369-59.11.
Noguchi, Takashi: See--
Kwon, Jang-yeon; Noguchi, Takashi; Park, Young-soo; and Kim, Do-young
07479667 Cl. 257-213.
Noguchi, Takashi; Xianyu, Wenxu; and Yin, Huaxiang, to Samsung Electronics Co., Ltd. Method of manufacturing single crystal Si film
07479442 Cl. 438-458.
Noguchi, Yuusuke: See--
Hosokawa, Hiroshi; Tsuda, Kiyonori; Narumi, Satoshi; Takeichi, Ryuta; Arai, Yuji; Kawasumi, Masanori; Umemura, Kazuhiko; Ishii, Hiroshi; Fukuchi, Yutaka; Suzuki, Kazuki; Noguchi, Yuusuke; Kuma, Kazuosa; and Kikura, Makoto
07480476 Cl. 399-258.
Nogueira, Joaquim Martins; and Looije, Peter Adrian, to Husky Injection Molding Systems Ltd Molding system having clamp actuator having actuator mount
07479005 Cl. 425-595.
Noji, Nobuharu: See--
Nakasuji, Mamoru; Kato, Takao; Watanabe, Kenji; Yoshikawa, Shoji; Satake, Tohru; and Noji, Nobuharu
07479634 Cl. 250-310.
Nojima, Shigeru: See--
Yagi, Katsuki; Nojima, Shigeru; and Yoshida, Hirohisa
07479169 Cl. 48-61.
Nokia Corporation: See--
Bush, Anton; Haverinen, Henry; Rinnemaa, Jyri; Smith, Mike; Takamäki, Timo; Tuomi, Jukka; and Tuominen, Hannu
07480933 Cl. 726-4.
Costa Requena, Jose; and Espigares, Inmaculada
07480915 Cl. 719-311.
Karkkainen, Tero Kalevi; and Salokannel, Kalle
07479018 Cl. 439-70.
Mäkelä, Jakke; Aikio, Janne Kari; Aikio, Sanna; Kataja, Kari Juhani; and Alajoki, Teemu
07480215 Cl. 369-44.19.
Ollila, Mikko A.; and Haila, Olli-Pekka
07480451 Cl. 396-79.
Pedersen, Klaus Ingemann; Mogensen, Preben Elgaard; and Moreno, Juan Ramiro
07480278 Cl. 370-335.
Pihlaja, Pekka Juhana
07479947 Cl. 345-173.
Suomela, Riku; Lakkala, Harri; and Salminen, Ilkka
07480567 Cl. 701-211.
Tian, Jilei; Nurminen, Jani K.; and Popa, Victor
07480641 Cl. 706-15.
Wong, John Patrick; and Crampton, Jeff Philip
07480522 Cl. 455-575.1.
Nokia, Inc.: See--
Chaskar, Hemant M.; Trossen, Dirk; and Krishnamurthi, Govind
07480307 Cl. 370-401.
Nokia Siemens Networks GmbH & Co. KG: See--
Ajgaonkar, Mahesh U.
07480465 Cl. 398-203.
Nolle, Steven P.; Barker, Brian J.; and Doucette, Alan, to Arris International, Inc. Predictive upstream load balancing
07480237 Cl. 370-229.
Noma, Takayuki: See--
Otani, Hitoshi; Kochi, Nobuo; and Noma, Takayuki
07479982 Cl. 348-188.
Nommensen, Marten: See--
Iversen, Frank Holm; Lassen, Heinz Otto; Nommensen, Marten; and Petersen, deceased, Christian
07478471 Cl. 29-596.
Nomura, Taichiroh: See--
Hara, Chikashi; Hayakawa, Kazuyo; Kumai, Satoru; Nomura, Taichiroh; Sakurai, Toshio; and Takenoshita, Hiroyuki
07480140 Cl. 361-692.
Nomura, Yujiro: See--
Ishihara, Yasumasa; Nomura, Yujiro; Gomi, Akihiro; and Ikuma, Ken
07480087 Cl. 359-213.
Noonan, James T.: See--
Peck, Donald Ray; Winter, David Carl; Noonan, James T.; and Hook, Richard Wayne
07478683 Cl. 172-456.
Noor, Shamshad: See--
Bianchi, Catherine; Noor, Shamshad; Mirley, Christopher L.; Bauer, Ralph; and Yener, Doruk
07479324 Cl. 428-403.
Nordmark, Erik: See--
Tripathi, Sunay; and Nordmark, Erik
07480291 Cl. 370-389.
Nordson Corporation: See--
Kleineidam, Andreas; and Kleineidam, Wilhard
07478976 Cl. 406-50.
Nortel Networks Limited: See--
Chen, Xixian; Xue, Guoqiang; Harris, Mark; and Li, Weigang
07480516 Cl. 455-522.
Stuart, David; Wandel, Markus; and Toplis, Blake
07480730 Cl. 709-232.
Unbehagen, Paul; and Radoaca, Vasile
07480306 Cl. 370-401.
North, Janice: See--
Leong, Simon; Chan, Agnes How-Ching; Hunt, David William Carey; Levy, Julia G.; Renke, Martin; and North, Janice
07479503 Cl. 514-414.
Northon, Dennis William: See--
Micu, Carl John; Ritter, Curtis Paul; Holden, Richard Hartley Coe; Northon, Dennis William; and Carpenter, Wade Sanner
07478616 Cl. 123-143C.
Northrop Grumman Corporation: See--
Noto, Rodolfo: See--
Lo Presti, Gaetano; and Noto, Rodolfo
07479196 Cl. 156-96.
Novak, Michael J.; Nadalin, David M.; Olson, Kipley J.; Larkin, Kevin P.; and Sanborn, Frank G., to Microsoft Corporation Methods and systems for creating skins
07480868 Cl. 715-746.
Novartis AG: See--
Seidelmann, Dieter; Krueger, Martin; Ottow, Eckhard; Huth, Andreas; Thierauch, Karl-Heinz; Menrad, Andreas; and Haberey, Martin
07479491 Cl. 514-237.2.
Novatek Microelectronics Corp.: See--
Chen, Wei-Zen; Liao, Dar-Huei; and Yen, Chih-Jen
07479833 Cl. 330-296.
Novell, Inc.: See--
Dahneke, Bart; Tronson, Ted Wayne; Cowley, Michael John; and Parra, Victor Hugo
07480745 Cl. 710-15.
Novellus Systems, Inc.: See--
Entley, William R.; Langan, John G.; Murali, Amith; and Bennett, Kathleen
07479191 Cl. 134-1.
Novick, Gregory: See--
Jobs, Steven P.; Forstall, Scott; Christie, Greg; Lemay, Stephen O.; Herz, Scott; van Os, Marcel; Ording, Bas; Novick, Gregory; Westerman, Wayne C.; Chaudhri, Imran; Coffman, Patrick Lee; Kocienda, Kenneth; Ganatra, Nitin K.; Anzures, Freddy Allen; Wyld, Jeremy A.; Bush, Jeffrey; Matas, Michael; Marcos, Paul D.; Pisula, Charles J.; King, Virgil Scott; Blumenberg, Chris; Tolmasky, Francisco Ryan; Williamson, Richard; Boule, Andre M. J.; and Lamiraux, Henri C.
07479949 Cl. 345-173.
Novo Measuring Instruments Ltd.: See--
Novotny, Pavel; to UCB Pharma Limited Acellular pertussis vaccine comprising a combination of the 69 kDa and the filamentous haemagglutinin antigens of Bordetella pertussis
07479283 Cl. 424-253.1.
Nowak, Edward J.: See--
Haensch, Wilfried E.; and Nowak, Edward J.
07479410 Cl. 438-123.
NTT DoCoMo, Inc.: See--
Fujii, Hiromasa; and Suda, Hirohito
07480235 Cl. 370-208.
Manabe, Hiroyuki; Hiraiwa, Akira; and Sugimura, Toshiaki
07480616 Cl. 704-254.
Uebayashi, Shinji; Onoe, Seizo; Ishii, Minami; and Nakamura, Takehiro
07480277 Cl. 370-335.
Nukui, Seiji: See--
Nakao, Kazunari; Okumura, Yoshiyuki; Matsumizu, Miyako; Ueno, Naomi; Hashizume, Yoshinobu; Kato, Tomoki; Kawai, Akiyoshi; Miyake, Yoriko; Nukui, Seiji; Shinjyo, Katsuhiro; and Taniguchi, Kana
07479564 Cl. 548-304.4.
Nurminen, Jani K.: See--
Tian, Jilei; Nurminen, Jani K.; and Popa, Victor
07480641 Cl. 706-15.
Nutec Components Inc.: See--
Schnetzler, Rene H.; and Yoon, Young A.
07478981 Cl. 409-134.
Nutter, Dana M.: See--
Wainwright, Norman R.; and Nutter, Dana M.
07479375 Cl. 435-7.2.
NVIDIA Corporation: See--
King, Gary C.; Chang, Luke Y.; Molnar, Steven E.; and McAllister, David K.
07479965 Cl. 345-589.
NXP B.V.: See--
Mair, Werner; and Lanzenberger, Heinz
07480352 Cl. 375-340.