LIST OF PATENTEES
TO WHOM
PATENTS WERE ISSUED ON THE 20th DAY OF January, 2009
NOTE--Arranged in accordance with the first significant character or word of the name
(in accordance with city and telephone directory practice).

Na, Chan Ju: See--
Ikeda, Toshimichi; Na, Chan Ju; and Jeong, Kyu Cheon 07478671 Cl. 165-296.
Na, Sang-Ju; and Jin, Byoung-Yoon, to LG Electronics Inc. Hinge frame for portable computer and structure for mounting the same 07480131 Cl. 361-683.
Nabel, Gary J.: See--
June, Carl H.; Thompson, Craig B.; Nabel, Gary J.; Gray, Gary S.; and Rennert, Paul D. 07479269 Cl. 424-93.71.
Nabors, C. David: See--
DeBenedictis, Leonard C.; Nabors, C. David; and Frangineas, George 07480086 Cl. 359-201.
Nadalin, David M.: See--
Novak, Michael J.; Nadalin, David M.; Olson, Kipley J.; Larkin, Kevin P.; and Sanborn, Frank G. 07480868 Cl. 715-746.
Nadamoto, Hiroyasu: See--
Makishima, Hiroyuki; and Nadamoto, Hiroyasu 07478537 Cl. 62-133.
Nadar, Mariappan S.: See--
Flipo, Aurelien; and Nadar, Mariappan S. 07480400 Cl. 382-128.
Nadeau, Douglas P.: See--
Ogilvie, Clarence Rosser; Winn, Charles B.; Milton, David Wills; Lauricella, Kenneth Anthony; Sharma, Nitin; Schanely, Paul Mark; Herzl, Robert Dov; Horton, Robert Spencer; Wilder, Tad Jeffrey; and Nadeau, Douglas P. 07480888 Cl. 716-14.
Nagabuchi, Ritaro: See--
Kubota, Masao; and Nagabuchi, Ritaro 07479527 Cl. 525-526.
Nagahama, Tsutomu; Kiso, Hiroyuki; and Miyaki, Yukio, to Sony Corporation Light diffusion sheet and method of producing the light diffusion sheet, and screen 07480097 Cl. 359-449.
Nagahara, Seiji; and Hiroi, Masayuki, to Nec Electronics Corporation Chemically amplified resist composition, process for manufacturing semiconductor device and patterning process 07479361 Cl. 430-270.1.
Nagai, Mizuki; Kanda, Hiroyuki; Kurashina, Keiichi; Yamamoto, Satoru; Suzuki, Hidenao; Mishima, Koji; Baker-O'Neal, Brett C.; Deligianni, Hariklia; and Kwietniak, Keith, to Ebara Corporation Plating method and plating apparatus 07479213 Cl. 205-170.
Nagakura, Clyde H.; Chiu, Po Weng; and Zhou, Qinggang, to Denace Enterprise Co., L.L.C. Customizable ASIC with substantially non-customizable portion that supplies pixel data to a mask-programmable portion in multiple color space formats 07480010 Cl. 348-553.
Nagano, Naoki: See--
Kaneko, Jun; Nagano, Naoki; Kamoto, Satoru; Fujii, Katsushi; Shinoda, Mayumi; Fuse, Atsushi; and Kohno, Michinari 07480693 Cl. 709-201.
Nagao, Naoyuki; to Fujitsu Component Limited Interface device, and method and computer readable product for updating firmware in the interface device 07480905 Cl. 717-171.
Nagarajan, Erumaipatty R.: See--
Kim, Kimoon; Baek, Kangkyun; Kim, Jeeyeon; Hwang, Iiha; Ko, Young Ho; Selvapalam, Narayanan; Nagarajan, Erumaipatty R.; and Park, Kyeng Min 07479254 Cl. 422-61.
Nagarajan, Ramaswamy: See--
Tripathy, deceased, Sukant; Samuelson, Lynne A.; Bruno, Ferdinando F.; Roy, Sucharita; Nagarajan, Ramaswamy; Kumar, Jayant; Ku, Bon-Cheol; and Lee, Soo-Hyoung 07479329 Cl. 428-681.
Nagareda, Takeshi: See--
Wakitani, Noboru; Takamoto, Junji; Nagareda, Takeshi; Ito, Kuniaki; Nagata, Hideo; Igarashi, Hiroshi; and Onda, Akio 07479064 Cl. 463-36.
Nagasawa, Hiroyuki; Egashira, Yoshinori; Yamana, Yoshihiro; Saito, Hidekazu; and Kimura, Hiroki, to Bridgestone Sports Co., Ltd. Golf ball 07479533 Cl. 528-76.
Nagata, Hideo: See--
Wakitani, Noboru; Takamoto, Junji; Nagareda, Takeshi; Ito, Kuniaki; Nagata, Hideo; Igarashi, Hiroshi; and Onda, Akio 07479064 Cl. 463-36.
Nagata, Tsukasa: See--
Ohara, Kiyotaka; and Nagata, Tsukasa 07479964 Cl. 345-581.
Nagayama, Midori: See--
Hoshi, Tadashi; Hirose, Kenji; Abe, Hideaki; Nishimoto, Junichi; and Nagayama, Midori 07479823 Cl. 327-545.
Nagy, Christopher: See--
Osterloh, Christopher L.; and Nagy, Christopher 07479895 Cl. 340-870.02.
Naick, Indran; and Wilson, Jeffrey Kenneth, to International Business Machines Corporation Using phone service to initiate requests for web information 07480695 Cl. 709-206.
Naidu, Ravendra: See--
Dunlop, Eric H.; Naidu, Ravendra; and Mallavarapu, Megharaj 07479226 Cl. 210-602.
Naik, Parag; to Genesis Microchip Inc. Reducing power consumption of a microprocessor 07480809 Cl. 713-300.
Nair, Hari N.; to Genesis Microchip Inc. Temporal motion vector filtering 07480334 Cl. 375-240.16.
Naito, Kinshiro; Shimizu, Masayuki; Endo, Shigeru; Matsumoto, Takashi; Nakai, Hiroshi; and Kobayashi, Hiroyuki, to Amada Company, Limited Die and die device 07479004 Cl. 425-416.
Najt, Paul M.: See--
Kuo, Tang-Wei; Najt, Paul M.; Wermuth, Nicole; and Eng, James A. 07478620 Cl. 123-294.
Nakabayashi, Takaaki; Saito, Yoshihiro; Okuma, Toshiyuki; and Ishino, Toshiki, to Canon Kabushiki Kaisha Head mounted apparatus 07480133 Cl. 361-683.
Nakabayashi, Yukio; Nishinohara, Kazumi; Kinoshita, Atsuhiro; and Koga, Junji, to Kabushiki Kaisha Toshiba Field effect transistor 07479674 Cl. 257-288.
Nakagawa, Atsuji: See--
Ushijima, Shinichi; Nakagawa, Atsuji; and Fujii, Toshitaka 07478928 Cl. 362-261.
Nakagawa, Tomohide: See--
Tamura, Tsutomu; Nakagawa, Tomohide; Kouketsu, Shoji; Maruyama, Gaku; Tsutsumi, Daisuke; Koizumi, Junji; Ito, Katsushi; and Mizutani, Haruyasu 07479315 Cl. 428-36.91.
Nakahara, Koichi: See--
Mikura, Tsutomu; Ikeda, Kota; and Nakahara, Koichi 07479862 Cl. 336-200.
Nakahata, Yuji: See--
Inoue, Hiroyasu; Otani, Minoru; Nakahata, Yuji; Murata, Satoshi; Nakayama, Norimichi; and Sugimura, Hiroyuki 07480027 Cl. 349-190.
Nakai, Hiroshi: See--
Naito, Kinshiro; Shimizu, Masayuki; Endo, Shigeru; Matsumoto, Takashi; Nakai, Hiroshi; and Kobayashi, Hiroyuki 07479004 Cl. 425-416.
Nakai, Yoshihiro: See--
Nishikawa, Taichiro; and Nakai, Yoshihiro 07478665 Cl. 164-482.
Nakaji, Takayuki: See--
Endo, Kazuya; Miyamoto, Naoki; Mizuno, Toshio; Nakaji, Takayuki; Uchida, Takatoshi; Ookado, Kazuo; and Yokota, Yoshikazu 07480164 Cl. 363-147.
Nakajima, Eiji: See--
Nanjo, Yuzuru; Nakajima, Eiji; and Kondo, Akihiro 07480479 Cl. 399-328.
Nakajima, Ken; and Sato, Nobuyuki, to Sony Corporation Image device and method for removing noise 07479993 Cl. 348-241.
Nakajima, Tatsutoshi; to Nippon Filcon Co., Ltd. Press fabric for pulp machine 07478655 Cl. 139-383A.
Nakakita, Hideaki: See--
Shimojo, Yoshimitsu; and Nakakita, Hideaki 07480247 Cl. 370-236.
Nakamura, Eiji; Mizutani, Yasuji; and Yamamoto, Takayuki, to Toyota Jidosha Kabushiki Kaisha Brake control device and brake control method 07478887 Cl. 303-113.4.
Nakamura, Hiroyuki: See--
Yamakawa, Takehiko; Yamaguchi, Hiroshi; Nakatsuka, Hiroshi; Nakamura, Hiroyuki; Onishi, Keiji; and Ishizaki, Toshio 07479847 Cl. 333-133.
Nakamura, Kentaro; Ooi, Hiroki; and Ishikawa, George, to Fujitsu Limited Wavelength division multiplexing transmission system 07480459 Cl. 398-83.
Nakamura, Makoto; Hara, Seinosuke; Suga, Seiji; Watanabe, Masahiko; and Hokari, Tomio, to Hitachi, Ltd. Variably operated valve system for compression ignition engine 07478614 Cl. 123-90.15.
Nakamura, Satoshi; to Rohm Co., Ltd. Circuit assembly for battery pack or the like, and method of making the same 07479345 Cl. 429-129.
Nakamura, Shuji: See--
Feezell, Daniel F.; Cohen, Daniel A.; Farrell, Robert M.; Ishida, Masahiro; and Nakamura, Shuji 07480322 Cl. 372-50.124.
Nakamura, Takehiro: See--
Uebayashi, Shinji; Onoe, Seizo; Ishii, Minami; and Nakamura, Takehiro 07480277 Cl. 370-335.
Nakamura, Takeshi; to Murata Manufacturing Co., Ltd. Speaker cabinet and speaker device 07478703 Cl. 181-199.
Nakamura, Tomohisa: See--
Takenoshita, Hiroyuki; Sasaki, Hideki; Nakamura, Tomohisa; and Koyama, Seiji 07480141 Cl. 361-695.
Nakamura, Yukio: See--
Otani, Seiichi; Nakamura, Yukio; and Furusato, Mamoru 07479255 Cl. 422-94.
Nakamuta, Kazuhiro; Honda, Iwao; and Kuroda, Takashi, to Sanyo Electric Co., Ltd. Memory Access apparatus 07480188 Cl. 365-189.01.
Nakano, Hiroshi: See--
Tanaka, Kanji; Arai, Hiroshi; and Nakano, Hiroshi 07478963 Cl. 402-26.
Nakano, Shiro: See--
Yamanaka, Kosuke; Nakano, Shiro; Higashi, Kenji; Ishihara, Atsushi; and Maeda, Daisuke 07479089 Cl. 475-344.
Nakano, Tomoyuki: See--
Takizawa, Keiji; Otagiri, Yoshihiro; and Nakano, Tomoyuki 07480018 Cl. 349-106.
Nakano, Yoshiaki; to Sharp Kabushiki Kaisha I/Q demodulation circuit 07480348 Cl. 375-324.
Nakao, Kazunari; Okumura, Yoshiyuki; Matsumizu, Miyako; Ueno, Naomi; Hashizume, Yoshinobu; Kato, Tomoki; Kawai, Akiyoshi; Miyake, Yoriko; Nukui, Seiji; Shinjyo, Katsuhiro; and Taniguchi, Kana, to RaQualia Pharma Inc. Aryl or heteroaryl fused imidazole compounds as anti-inflammatory and analgesic agents 07479564 Cl. 548-304.4.
Nakao, Kenji; Ogawa, Shinji; and Wakemoto, Hirofumi, to Toshiba Matsushita Display Technology Co., Ltd. Liquid crystal display panel in which the rubbing directions of the pair of alignment films are oriented toward a side of a main diffusion source of impurity ions 07480023 Cl. 349-126.
Nakao, Makiko; to Fujitsu Limited Authentication information processing method, program, and device 07480932 Cl. 726-2.
Nakasuji, Mamoru; Kato, Takao; Watanabe, Kenji; Yoshikawa, Shoji; Satake, Tohru; and Noji, Nobuharu, to Ebara Corporation Electron beam apparatus and device manufacturing method using the same 07479634 Cl. 250-310.
Nakatake, Yoshihiro: See--
Kai, Yasukazu; and Nakatake, Yoshihiro 07480841 Cl. 714-724.
Nakatsuka, Hiroshi: See--
Yamakawa, Takehiko; Yamaguchi, Hiroshi; Nakatsuka, Hiroshi; Nakamura, Hiroyuki; Onishi, Keiji; and Ishizaki, Toshio 07479847 Cl. 333-133.
Nakaya, Teruomi: See--
Shigemi, Masashi; Koike, Akira; Ueno, Makoto; Hirotani, Tomonari; Nakaya, Teruomi; Wakai, Hiroshi; and Iwata, Toru 07480548 Cl. 701-7.
Nakayama, Fumitaka; Morikawa, Masatoshi; Hoshino, Yutaka; and Uchiyama, Tetsuo, to Renesas Eastern Technology Corp. Multilayered semiconductor structure containing a MISFET, a resistor, a capacitor, and an inductor 07479681 Cl. 257-379.
Nakayama, Koji: See--
Ito, Koji; Nakayama, Koji; Murashima, Hiroshi; and Hashiguchi, Takuji 07478896 Cl. 347-20.
Nakayama, Norimichi: See--
Inoue, Hiroyasu; Otani, Minoru; Nakahata, Yuji; Murata, Satoshi; Nakayama, Norimichi; and Sugimura, Hiroyuki 07480027 Cl. 349-190.
Nakazawa, Ikuo: See--
Suda, Sakae; Sato, Koichi; Nakazawa, Ikuo; Ikegami, Masayuki; and Tsubaki, Keiichiro 07479512 Cl. 523-160.
Nalco Company: See--
Adams, Robert R.; Banks, Rodney H.; Chattoraj, Mita; and Schwartz, Joe L. 07479490 Cl. 514-229.8.
Nalnenl, Malahal R.: See--
Jujjuri, Venkateswararao; Nalnenl, Malahal R.; Prasad, Rohit K.; Rajaram, Senthil; and Raphael, Roger C. 07480654 Cl. 707-8.
Nam, Nicholas; to OmniVision Technologies, Inc Multi-video interface for a mobile device 07480484 Cl. 455-3.06.
Nam, Nyun-woo: See--
Goh, Ji-hyun; and Nam, Nyun-woo 07480002 Cl. 348-333.05.
Nam, Seung-Hoon: See--
Hwang, Chan-Soo; Kim, Yung-Soo; Nam, Seung-Hoon; and Chung, Jae-Hak 07480339 Cl. 375-267.
Nam, Young-Dong: See--
Park, Byung-Wook; Cho, Byeong-Hwan; Nam, Young-Dong; and Kim, Bo-Yeon 07479793 Cl. 324-754.
Namba, Takanori; and Ito, Masayasu, to Koito Manufacturing Co., Ltd. Vehicle lighting apparatus 07479743 Cl. 315-307.
NAMCO BANDAI Games Inc.: See--
Yamaguchi, Kentaro; and Saito, Yoshihito 07479961 Cl. 345-426.
Namgoong, John E.: See--
Woo, Hyosang; Park, JongMin; Ahn, Jaesung; Jung, Do Yang; and Namgoong, John E. 07479786 Cl. 324-431.
Namkoong, Kak: See--
Oh, Kwang-wook; Namkoong, Kak; and Park, Chin-sung 07478792 Cl. 251-11.
Nammo Raufoss AS: See--
Ørbekk, Erland 07478778 Cl. 244-3.21.
Nanbu, Kohhei; to Sharp Kabushiki Kaisha Backlight and liquid crystal display device 07478920 Cl. 362-225.
Nanjo, Yuzuru; Nakajima, Eiji; and Kondo, Akihiro, to Kyocera Mita Corporation Fixing apparatus 07480479 Cl. 399-328.
Nanjyo, Takeshi: See--
Katoh, Seiichi; Nanjyo, Takeshi; and Ohtaka, Koichi 07480090 Cl. 359-290.
Nanomix, Inc.: See--
Jhi, Seung-Hoon; Kwon, Young-Kyun; Bradley, Keith; and Gabriel, Jean-Christophe P. 07479240 Cl. 252-182.32.
Nansei, Hiroyuki: See--
Higashi, Masahiko; and Nansei, Hiroyuki 07479427 Cl. 438-258.
Nantero, Inc.: See--
Bertin, Claude L.; Guo, Frank; Rueckes, Thomas; Konsek, Steven L.; Meinhold, Mitchell; Strasburg, Max; Sivarajan, Ramesh; and Huang, X. M. Henry 07479654 Cl. 257-40.
Nanya Technology Corporation: See--
Chiu, Chui-fu; and Wu, Wen-Bin 07480892 Cl. 716-21.
Naoi, Satoshi: See--
Jun, Sun; Katsuyama, Yutaka; and Naoi, Satoshi 07480408 Cl. 382-176.
Jun, Sun; Katsuyama, Yutaka; and Naoi, Satoshi 07480409 Cl. 382-176.
Napadensky, Eduardo; and Levy, Avi, to Objet Geometries Ltd. Compositions and methods for use in three dimensional model printing 07479510 Cl. 522-75.
Napier, Christopher D.: See--
Cook, Norman D.; Napier, Christopher D.; Embly, Robert B.; and Robinson, Darrell 07479029 Cl. 439-517.
Nappa, Mario Joseph: See--
Minor, Barbara Haviland; Nappa, Mario Joseph; Sievert, Allen Capron; and Leck, Thomas J. 07479239 Cl. 252-68.
Nara, Kazutaka: See--
Hasegawa, Junichi; and Nara, Kazutaka 07480091 Cl. 359-325.
Narayanabhatla, Shiva: See--
Oh, Dae-Sik; Yarkosky, Mark L.; Hayne, Kristin A.; Ngan, John Cheong Wai; Asif, Saad Z.; and Narayanabhatla, Shiva 07480485 Cl. 455-7.
Woleben, Samuel M.; Narayanabhatla, Shiva; Barbee, Bryan T; and Sill, Timothy W. 07480510 Cl. 455-453.
Narayanan, Vijay: See--
Bojarczuk, Jr., Nestor A.; Cabral, Jr., Cyril; Cartier, Eduard A.; Copel, Matthew W.; Frank, Martin M.; Gousev, Evgeni P.; Guha, Supratik; Jammy, Rajarao; Narayanan, Vijay; and Paruchuri, Vamsi K. 07479683 Cl. 257-410.
Narita, Toru: See--
Okada, Yoshikazu; Narita, Toru; and Fujisawa, Shinsuke 07479252 Cl. 419-38.
Narumi, Satoshi: See--
Hosokawa, Hiroshi; Tsuda, Kiyonori; Narumi, Satoshi; Takeichi, Ryuta; Arai, Yuji; Kawasumi, Masanori; Umemura, Kazuhiko; Ishii, Hiroshi; Fukuchi, Yutaka; Suzuki, Kazuki; Noguchi, Yuusuke; Kuma, Kazuosa; and Kikura, Makoto 07480476 Cl. 399-258.
Nase, Rainer; to Austria Card Plastikkarten und Ausweissysteme GmbH Method and apparatus for block-oriented memory management provided in smart card controllers 07480775 Cl. 711-154.
Naso, Michael: See--
Song, Xiao-yu R.; Huang, Chong; Ma, Keying; Liang, Bailin; and Naso, Michael 07479479 Cl. 514-2.
Natarajan, Rohit; Lakshmanamurthy, Sridhar; and Kuo, Chen-Chi, to Intel Corporation Apparatus and method to merge and align data from distributed memory controllers 07480781 Cl. 711-170.
Natarajan, Saravana P.: See--
Weller, Thomas M.; Fries, David P.; and Natarajan, Saravana P. 07479864 Cl. 336-200.
National Formosa University: See--
Liao, Wen-Hwei 07478566 Cl. 73-862.21.
National Institute of Information and Communications Technology: See--
Akiba, Makoto 07479999 Cl. 348-308.
National Instruments Corporation: See--
Cetrulo, Raffaele; and Whittington, Mark 07480126 Cl. 361-91.1.
Grey, James A. 07480826 Cl. 714-38.
Joffrain, Philippe G.; Sumner, Joel; Shah, Darshan K.; and Nattinger, Darren M. 07480906 Cl. 717-171.
National Semiconductor Corporation: See--
Broach, Michael Eugene; and De Stasi, Frank John 07479778 Cl. 324-117R.
Hariman, George Adrian; and Tomiyoshi, Kenji 07479812 Cl. 327-102.
Hopper, Peter J.; Vashchenko, Vladislav; Lindorfer, Philipp; and Strachan, Andy 07479435 Cl. 438-303.
Johnson, Mark Alan; and Mayes, Larry W. 07479399 Cl. 438-33.
Li, Felix C. 07479411 Cl. 438-124.
Malone, Robert A. 07479831 Cl. 330-257.
Salmi, Pasi 07479768 Cl. 323-224.
Scheuerlein, Eric; and Archer, Donald M. 07480190 Cl. 365-189.05.
National University of Singapore: See--
Tan, Woei Wan; Ge, Pei; Tay, Eng Hock Francis; and Phang, Jyh Siong 07478559 Cl. 73-718.
Yang, Hongyuan 07479374 Cl. 435-7.2.
Nattinger, Darren M.: See--
Joffrain, Philippe G.; Sumner, Joel; Shah, Darshan K.; and Nattinger, Darren M. 07480906 Cl. 717-171.
Nawracala, Bernd: See--
Falk-Jordan, Stefan; Nawracala, Bernd; and Zimmermann, Hans-Peter 07480053 Cl. 356-444.
NCR Corporation: See--
Poynter, William Douglas 07480405 Cl. 382-162.
NEC Corporation: See--
Ito, Yoshio; and Yamamoto, Katsushi 07480313 Cl. 370-473.
Kimura, Akitaka 07479448 Cl. 438-604.
Ojima, Kenichi; and Tsuchiya, Manabu 07480118 Cl. 360-92.
Shimoda, Masamichi 07479937 Cl. 345-76.
Shintani, Tatsuyuki 07480518 Cl. 455-522.
Yoshikawa, Masahide 07480379 Cl. 379-433.06.
Nec Electronics Corporation: See--
Kawashima, Hidekazu 07479836 Cl. 331-74.
Nagahara, Seiji; and Hiroi, Masayuki 07479361 Cl. 430-270.1.
Takewaki, Toshiyuki; and Ueno, Kazuyoshi 07479700 Cl. 257-758.
Negami, Takayuki: See--
Hashimoto, Yasuhiro; Negami, Takayuki; and Satoh, Takuya 07479596 Cl. 136-256.
Negevtech Ltd.: See--
Furman, Dov; Dotan, Noam; and Miklatzky, Efraim 07480039 Cl. 356-237.2.
Neiss, Jason H.: See--
Maier, John S.; and Neiss, Jason H. 07479966 Cl. 345-589.
Nell, Joachim: See--
Bayer, Ronald; Jungbecker, Johann; Linkenbach, Steffen; Nell, Joachim; and Muth, Norman 07478573 Cl. 74-388R.
Nelsestuen, Gary L; to Regents of the University of Minnesota Modified vitamin K-dependent polypeptides 07479551 Cl. 536-23.1.
Nelson, Andrew: See--
Wengrovitz, Michael S.; and Nelson, Andrew 07480284 Cl. 370-352.
Nelson, Eric D.: See--
van Egmond, Cor F.; Nelson, Eric D.; Smith, Lawrence C.; Searle, Ronald G.; Beech, Jr., James H.; and Nicoletti, Michael P. 07479468 Cl. 502-52.
Neopost Technologies: See--
Bernard, Emmanuel; Gregoire, Jean-Pierre; and Multignier, Alain 07478808 Cl. 271-248.
Nepil, Mark; and Torp, Clyde, to Keson Industries Chalk line apparatus with a spool configured to avoid cavitation 07478484 Cl. 33-414.
Nerhood, Robert: See--
Lawrence, Bradley Michael; McGrew, Allison; and Nerhood, Robert 07480154 Cl. 361-826.
Nessett, Danny M.; and Young, Albert, to 3Com Corporation Enhancement to authentication protocol that uses a key lease 07480939 Cl. 726-22.
Nessler, Winfried: See--
Aigner, Robert; Marksteiner, Stephan; and Nessler, Winfried 07479851 Cl. 333-189.
Nestec S.A.: See--
Couzy, François; and Boissin-Delaporte, Catherine 07479286 Cl. 424-442.
NetApp, Inc.: See--
Somavarapu, Nagender 07480778 Cl. 711-159.
netCOMPONENTS, Inc.: See--
McGee, Todd 07480628 Cl. 705-27.
Nett, Juergen; and Gerngross, Tillman, to GlycoFi, Inc. ARG1, ARG2, ARG3, HIS1, HIS2, HIS5, HIS6 genes and methods for stable genetic integration 07479389 Cl. 435-471.
Netter, Christian M.: See--
Zepke, Bruce E.; Veronesi, William A.; Zacchio, Joseph; Stucky, Paul A.; Bellamy, Dennis W.; Netter, Christian M.; Vecchiotti, Alberto; Bacellar, Adriana H.; Bacellar, Luiz F.; and Haas, Deborah C. 07479861 Cl. 336-178.
Neumaier, Henrich: See--
Waldi, Wolfgang; Hug, Kuno; Betz, Thomas; Thomas, Volker; Neumaier, Henrich; Klonecki, Peter; and Ries, Christian 07479612 Cl. 200-507.
Neumann, Douglas T.: See--
Harry, Brian D.; Harry, Craig A.; Pinnix, Justin E.; and Neumann, Douglas T. 07480896 Cl. 717-120.
Neumann, Eric W.: See--
Larsen, Todd W.; and Neumann, Eric W. 07478647 Cl. 137-613.
Neumann, Gerold; and Birke, Peter, to Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. Pasty materials with nanocrystalline materials for electromechanical components and layers and electromechanical components with said materials 07479350 Cl. 429-217.
Neumayer, Deborah A.: See--
Edelstein, Daniel C.; Gates, Stephen M.; Grill, Alfred; Lane, Michael; Lin, Qinghuang; Miller, Robert D.; Neumayer, Deborah A.; and Van Nguyen, Son 07479306 Cl. 427-447.
New, Bernard J.: See--
Simkins, James M.; Young, Steven P.; Wong, Jennifer; New, Bernard J.; and Ching, Alvin Y. 07480690 Cl. 708-523.
New Cell Formulations, Ltd.: See--
Molino, Michele 07479560 Cl. 544-314.
New Dimensions Research Corporation: See--
Mason, Timothy L. 07478731 Cl. 211-59.3.
New Tech Copper S.A.: See--
Casanova, Manuel Rafael Umana 07479209 Cl. 204-279.
New York University: See--
Canary, James Wayne; Seeman, Nadrian C.; Zhu, Lei; and Lukeman, Philip 07479548 Cl. 536-23.1.
Frangione, Blas; Wisniewski, Thomas; and Sigurdsson, Einar M. 07479482 Cl. 514-12.
Lee, Ray F. 07479784 Cl. 324-318.
Neway, III, William E.: See--
Bugianesi, Robert L.; Doherty, George A.; Gentry, Amy; Hale, Jeffrey J.; Lynch, Christopher L.; Mills, Sander G.; and Neway, III, William E. 07479504 Cl. 514-422.
Newisys, Inc.: See--
Coleman, Richard A.; Christensen, Steven M.; and Pugley, John R. 07480146 Cl. 361-719.
Newman, Keith G.; to Sun Microsystems, Inc. Solder interconnect integrity monitor 07478741 Cl. 228-103.
Newsom, Paul E.; to General Electric Company Apparatus and methods for operating a cooking appliance 07479006 Cl. 431-12.
Ngai, Henry P.; to Pericom Semiconductor Corp. Pseudo-ethernet switch without ethernet media-access-controllers (MAC's) that copies ethernet context registers between PCI-express ports 07480303 Cl. 370-395.5.
Ngan, John Cheong Wai: See--
Oh, Dae-Sik; Yarkosky, Mark L.; Hayne, Kristin A.; Ngan, John Cheong Wai; Asif, Saad Z.; and Narayanabhatla, Shiva 07480485 Cl. 455-7.
NGK Insulators, Ltd.: See--
Sakai, Masahiro; Tanaka, Mitsuhiro; and Egawa, Takashi 07479658 Cl. 257-79.
Nguyen, Andrew: See--
Buchberger, Jr., Douglas A.; Hoffman, Daniel J.; Ramaswamy, Kartik; Nguyen, Andrew; Hanawa, Hiorji; Collins, Kenneth S.; and Al-Bayati, Amir 07479456 Cl. 438-706.
Nguyen, Andy T.: See--
Zhou, Shi-dong; Huang, Gubo; Nguyen, Andy T.; and Cline, Ronald L. 07479805 Cl. 326-83.
Nguyen, Anh: See--
Banik, Michael S.; Couvillon, Jr., Lucien Alfred; Nguyen, Anh; and Stahley, William H. 07479106 Cl. 600-159.
Nguyen, Huy Son; to XILINX, Inc. Pull-up voltage circuit 07480192 Cl. 365-189.11.
Nguyen, Logan A.: See--
Nguyen, Phu; and Nguyen, Logan A. 07478779 Cl. 244-31.
Nguyen, Nhiem Viet; to Hamilton Beach Brands, Inc. Gravity biased grill wires 07479295 Cl. 426-468.
Nguyen, Nhut; Wu, Matt; and Lin, Rosa, to Samsung Electronics Co., Ltd. Apparatus and method for scalable call-processing system 07480244 Cl. 370-235.
Nguyen, Nick N.; Jackson, Richard A.; and Fang, Yan, to Ethicon, Inc. Automated endoscope reprocessor solution testing 07479257 Cl. 422-119.
Nguyen, Phu; and Nguyen, Logan A. Device and method for sealing and lighting a balloon 07478779 Cl. 244-31.
Nguyen, Thang Q.: See--
Martin, Harold M.; Nguyen, Thang Q.; and Ikonomopoulos, Gus P. 07480837 Cl. 714-55.
Nguyen, Thomas: See--
Hwang, Guang-Yaw; Nguyen, Thomas; Chou, Wen-Ben; Tran, Timothy; and Yang, Yu-Wei 07479458 Cl. 438-714.
Ni, Jim Chin-Nan; Ma, Abraham C.; Hsueh, Paul; and Shen, Ming-Shiang, to Super Talent Electronics, Inc. Manufacturing process for a super-digital (SD) flash card with slanted asymmetric circuit board 07479039 Cl. 439-620.15.
Ni, Quan: See--
Hartley, Jesse W.; Stahmann, Jeffrey; Lee, Kent; and Ni, Quan 07479114 Cl. 600-529.
Nichia Corporation: See--
Takine, Kenji; and Yamashita, Ryohei 07479665 Cl. 257-99.
Nickels, Jr., Richard C: See--
O'Banion, Michael L; Rudolph, Scott; Nickels, Jr., Richard C; and Berry, Robert A 07478987 Cl. 411-413.
Nickolaus, Ralf; Rink, Heinz-Peter; Clauss, Reinhold; Wessling, Elisabeth; Löcken, Wilma; Bendix, Maximilian; and Mikolajetz, Dunja, to BASF Coatings AG Aqueous coating substance that is substantially or completely free of volatile organic substances, method for producing the same and the use thereof 07479520 Cl. 524-507.
Nicolai, Jean; and Rimpault, Marie, to STMicroelectronics S.A. Fractal-coding addressing of reference block memories 07480415 Cl. 382-232.
Nicolal, Philippe: See--
Germain, Pierre; and Nicolal, Philippe 07480866 Cl. 715-736.
Nicolas, Corinne: See--
Pintos, Jean-François; Mocquard, Olivier; Robert, Jean-Luc; Thudor, Franck; and Nicolas, Corinne 07479929 Cl. 343-772.
Nicoletti, Michael P.: See--
van Egmond, Cor F.; Nelson, Eric D.; Smith, Lawrence C.; Searle, Ronald G.; Beech, Jr., James H.; and Nicoletti, Michael P. 07479468 Cl. 502-52.
NIDEC Sankyo Corporation: See--
Kobayashi, Kazutaka 07479721 Cl. 310-91.
Nielsen, Ole Neis; to Bang & Olufsen Icepower A/S Digital pulse width controlled oscillation modulator 07479840 Cl. 332-109.
Niemi, Sami; Johansson, Karl-Anders; and Stén, Johan, to Scalado AB Method for processing a digital image and image representation format 07480418 Cl. 382-246.
Niessen, Wiro Joep; Van De Kraats, Everine Brenda; Van Walsum, Theo; Rommes, Eeico Lennart; Ivanov, Eugene; and America, Petrus Hubertus Maria, to Koninklijke Philips Electronics N.V. X-ray examination apparatus and method 07478949 Cl. 378-205.
NIFCO Inc.: See--
Kawaguchi, Gaku; and Sim, Ki-Po 07478459 Cl. 24-170.
Sato, Hiroji; Kurihara, Kazumasa; Kobayashi, Yasutomo; Kimisawa, Toshihide; and Kojima, Takeshi 07478729 Cl. 210-491.
Nihon Dempa Kogyo Co., Ltd.: See--
Asamura, Fumio; Kawahata, Kenji; and Sakamoto, Katsuaki 07479856 Cl. 333-204.
Mitome, Hiroyuki; Ito, Manabu; and Uchida, Takeshi 07479835 Cl. 331-69.
Niklas, Karl: See--
Feist, Guenter; and Niklas, Karl 07479865 Cl. 336-229.
Nikon Corporation: See--
Hara, Hideaki 07480029 Cl. 355-53.
Nilsen, Thomas: See--
Sack, James A.; Nilsen, Thomas; and Vandoren, Arnold E. 07479607 Cl. 200-4.
Ning, Gang: See--
Fife, James Allen; Sebald, Zebbie Lynn; and Ning, Gang 07480130 Cl. 361-516.
Ning, Tak H.: See--
Cai, Jin; Haensch, Wilfried E.; and Ning, Tak H. 07479418 Cl. 438-154.
Ning, Xian J.; to Semiconductor Manufacturing International (Shanghai) Corporation Seal ring structures with unlanded via stacks 07479699 Cl. 257-751.
Nintendo Co., Ltd.: See--
Wakitani, Noboru; Takamoto, Junji; Nagareda, Takeshi; Ito, Kuniaki; Nagata, Hideo; Igarashi, Hiroshi; and Onda, Akio 07479064 Cl. 463-36.
Nippon Filcon Co., Ltd.: See--
Nakajima, Tatsutoshi 07478655 Cl. 139-383A.
Nippon Telegraph and Telephone Corporation: See--
Shimamura, Toshishige; Morimura, Hiroki; Fujii, Koji; Shigematsu, Satoshi; and Machida, Katsuyuki 07480785 Cl. 712-16.
Nippon Thompson Co., Ltd.: See--
Ohno, Kazuhiro 07478479 Cl. 29-898.051.
Nishida, Hiroshi: See--
Himi, Yoshihiro; Nishida, Hiroshi; and Sakamoto, Koichi 07479849 Cl. 333-134.
Nishida, Masami: See--
Takamori, Satoshi; Uchida, Tsuyoshi; and Nishida, Masami 07478972 Cl. 403-409.1.
Nishide, Yasushi: See--
Ishizuka, Ryuichi; Kodama, Mari; and Nishide, Yasushi 07480413 Cl. 382-202.
Nishigaki, Morio; and Suzuki, Takao, to Panasonic Corporation Ultrasonic diagnostic equipment 07479110 Cl. 600-443.
Nishigaki, Takahiro: See--
Yamaguchi, Katsuhiko; Harada, Osamu; Kobayashi, Yukio; Ueoka, Kiyoshiro; Nishigaki, Takahiro; Tomatsuri, Mamoru; and Muta, Koichiro 07478691 Cl. 180-65.2.
Nishihara, Eiji: See--
Imamura, Atsushi; Sano, Hiroshi; Nishihara, Eiji; and Shiomi, Junichi 07480407 Cl. 382-173.
Nishikawa, Hiroshi; Maruchi, Noritoshi; and Murakami, Tohru, to Minolta Company, Ltd. Apparatus for transporting a sheet into a reading position 07478809 Cl. 271-264.
Nishikawa, Taichiro; and Nakai, Yoshihiro, to Sumitomo Electric Industries, Ltd. Method of manufacturing magnesium alloy material 07478665 Cl. 164-482.
Nishimoto, Junichi: See--
Hoshi, Tadashi; Hirose, Kenji; Abe, Hideaki; Nishimoto, Junichi; and Nagayama, Midori 07479823 Cl. 327-545.
Nishimura, Joji: See--
Tsuchiya, Hitoshi; and Nishimura, Joji 07480022 Cl. 349-123.
Nishimura, Kazumasa: See--
Ide, Yosuke; Saito, Masamichi; Ishizone, Masahiko; Hasegawa, Naoya; and Nishimura, Kazumasa 07480122 Cl. 360-324.12.
Nishimura, Masafumi: See--
Mori, Shinsuke; Nishimura, Masafumi; and Itoh, Nobuyasu 07480612 Cl. 704-9.
Nishimura, Takuya: See--
Fukushima, Toshiyuki; Gotoh, Yoshiho; and Nishimura, Takuya 07480439 Cl. 386-46.
Nishino, Seiji; Wada, Hidenori; Komma, Yoshiaki; Mizuno, Sadao; and Matsuzaki, Keiichi, to Panasonic Corporation Optical head device and optical information apparatus using the same 07480227 Cl. 369-112.05.
Nishinohara, Kazumi: See--
Nakabayashi, Yukio; Nishinohara, Kazumi; Kinoshita, Atsuhiro; and Koga, Junji 07479674 Cl. 257-288.
Nishio, Chikara: See--
Hara, Yasushi; Nishio, Chikara; Abe, Makoto; Hirabayashi, Masashi; Yamada, Hiroshi; Takahashi, Toshikazu; and Tanaka, Akira 07478937 Cl. 362-606.
Nishiyama, Kiyoshi; to Japan Science and Technology Agency System estimation method and program, recording medium, and system estimation device 07480595 Cl. 703-1.
Nishizawa, Hirotaka; Osawa, Kenji; Higuchi, Akira; Osako, Junichiro; and Wada, Tamaki, to Renesas Technology Corp. Method of manufacturing an IC card 07478473 Cl. 29-834.
Nissan Technical Center North America, Inc.: See--
Fortin, Hugo F. 07478849 Cl. 293-120.
Nissin Kogyo Co., Ltd.: See--
Kobayashi, Naoki 07478701 Cl. 180-299.
Nitta, Haruki: See--
Takezaki, Masanori; Komaru, Masayuki; Nitta, Haruki; Yagi, Takafumi; and Mizuno, Yoshiyuki 07479013 Cl. 439-55.
Nitto Denko Corporation: See--
Bobrov, Yuri A. 07479311 Cl. 428-1.31.
Greener, Jehuda; Elman, James F.; Rao, YuanQiao; Hammerschmidt, Jon A.; and Bailey, David B. 07479309 Cl. 428-1.3.
Hashimoto, Kouichi; and Yamamoto, Kazuhiko 07479317 Cl. 428-40.1.
Rao, YuanQiao; Robello, Douglas R.; and Miller, Anne M. 07480021 Cl. 349-117.
Niu, Shouye; to Elegance Eyeglasses Factory Plug connection type eyeglasses assembly 07478905 Cl. 351-58.
Niu, Xiaomu: See--
Tomes, Dwight; Salvi, Silvio; Morgante, Michele; Sponza, Giorgio; Bruggemann, Edward; Niu, Xiaomu; Li, Bailin; and Tuberosa, Roberto 07479584 Cl. 800-320.1.
Niv, Haim Obstacle and terrain avoidance sensor 07479920 Cl. 342-65.
Noborio, Yasuhisa: See--
Kamikido, Yoshinobu; Shikida, Masaru; Noborio, Yasuhisa; Okuni, Hitoshi; and Toyofuku, Kumi 07480871 Cl. 715-789.
Nobunaga, Dean; and Abedifard, Ebrahim, to Micron Technology, Inc. Internal data comparison for memory testing 07480195 Cl. 365-201.
Noda, Koji; to Kabushiki Kaisha Toshiba Bearing and X-ray diagnostic apparatus using same 07478948 Cl. 378-193.
Noda, Masaaki; Terao, Atsuhito; and Asayama, Sanae, to Panasonic Corporation High-frequency receiver and portable device using the same 07480496 Cl. 455-130.
Noel, Thomas Olivier Marie: See--
Guezengar, Dominique; Hernandez, Didier Hippolyte; Noel, Thomas Olivier Marie; and Zischek, Michel 07478534 Cl. 60-796.
Noelle, Phillipe; to Honeywell International, Inc. Variable nozzle device 07478991 Cl. 415-159.
Noetzel, Siegfried; Bogardi, Jean-Philippe; and Mangold, Dieter, to Roche Diagnostics Operations, Inc. Analytical test element and method for blood analyses 07479393 Cl. 436-179.
Noguchi, Kazuhiro; and Okada, Tadanori, to Canon Kabushiki Kaisha Variable magnification lens having image stabilizing function 07479985 Cl. 348-208.5.
Noguchi, Soh; Sato, Tsutomu; Tomura, Tatsuya; and Ueno, Yasunobu, to Ricoh Company, Ltd. Recording and reading method and device for dye based write-once DVD medium 07480223 Cl. 369-59.11.
Noguchi, Takashi: See--
Kwon, Jang-yeon; Noguchi, Takashi; Park, Young-soo; and Kim, Do-young 07479667 Cl. 257-213.
Noguchi, Takashi; Xianyu, Wenxu; and Yin, Huaxiang, to Samsung Electronics Co., Ltd. Method of manufacturing single crystal Si film 07479442 Cl. 438-458.
Noguchi, Yuusuke: See--
Hosokawa, Hiroshi; Tsuda, Kiyonori; Narumi, Satoshi; Takeichi, Ryuta; Arai, Yuji; Kawasumi, Masanori; Umemura, Kazuhiko; Ishii, Hiroshi; Fukuchi, Yutaka; Suzuki, Kazuki; Noguchi, Yuusuke; Kuma, Kazuosa; and Kikura, Makoto 07480476 Cl. 399-258.
Nogueira, Joaquim Martins; and Looije, Peter Adrian, to Husky Injection Molding Systems Ltd Molding system having clamp actuator having actuator mount 07479005 Cl. 425-595.
Noji, Nobuharu: See--
Nakasuji, Mamoru; Kato, Takao; Watanabe, Kenji; Yoshikawa, Shoji; Satake, Tohru; and Noji, Nobuharu 07479634 Cl. 250-310.
Nojima, Shigeru: See--
Yagi, Katsuki; Nojima, Shigeru; and Yoshida, Hirohisa 07479169 Cl. 48-61.
Nokia Corporation: See--
Bush, Anton; Haverinen, Henry; Rinnemaa, Jyri; Smith, Mike; Takamäki, Timo; Tuomi, Jukka; and Tuominen, Hannu 07480933 Cl. 726-4.
Costa Requena, Jose; and Espigares, Inmaculada 07480915 Cl. 719-311.
Karkkainen, Tero Kalevi; and Salokannel, Kalle 07479018 Cl. 439-70.
Mäkelä, Jakke; Aikio, Janne Kari; Aikio, Sanna; Kataja, Kari Juhani; and Alajoki, Teemu 07480215 Cl. 369-44.19.
Mayer, Georg 07480254 Cl. 370-254.
Ollila, Mikko A.; and Haila, Olli-Pekka 07480451 Cl. 396-79.
Pedersen, Klaus Ingemann; Mogensen, Preben Elgaard; and Moreno, Juan Ramiro 07480278 Cl. 370-335.
Pihlaja, Pekka Juhana 07479947 Cl. 345-173.
Suomela, Riku; Lakkala, Harri; and Salminen, Ilkka 07480567 Cl. 701-211.
Tian, Jilei; Nurminen, Jani K.; and Popa, Victor 07480641 Cl. 706-15.
Wong, John Patrick; and Crampton, Jeff Philip 07480522 Cl. 455-575.1.
Nokia, Inc.: See--
Chaskar, Hemant M.; Trossen, Dirk; and Krishnamurthi, Govind 07480307 Cl. 370-401.
Nokia Siemens Networks GmbH & Co. KG: See--
Ajgaonkar, Mahesh U. 07480465 Cl. 398-203.
Nolle, Steven P.; Barker, Brian J.; and Doucette, Alan, to Arris International, Inc. Predictive upstream load balancing 07480237 Cl. 370-229.
Noma, Takayuki: See--
Otani, Hitoshi; Kochi, Nobuo; and Noma, Takayuki 07479982 Cl. 348-188.
Nommensen, Marten: See--
Iversen, Frank Holm; Lassen, Heinz Otto; Nommensen, Marten; and Petersen, deceased, Christian 07478471 Cl. 29-596.
Nomura, Taichiroh: See--
Hara, Chikashi; Hayakawa, Kazuyo; Kumai, Satoru; Nomura, Taichiroh; Sakurai, Toshio; and Takenoshita, Hiroyuki 07480140 Cl. 361-692.
Nomura, Yujiro: See--
Ishihara, Yasumasa; Nomura, Yujiro; Gomi, Akihiro; and Ikuma, Ken 07480087 Cl. 359-213.
Noonan, James T.: See--
Peck, Donald Ray; Winter, David Carl; Noonan, James T.; and Hook, Richard Wayne 07478683 Cl. 172-456.
Noor, Shamshad: See--
Bianchi, Catherine; Noor, Shamshad; Mirley, Christopher L.; Bauer, Ralph; and Yener, Doruk 07479324 Cl. 428-403.
Nordmark, Erik: See--
Tripathi, Sunay; and Nordmark, Erik 07480291 Cl. 370-389.
Nordson Corporation: See--
Kleineidam, Andreas; and Kleineidam, Wilhard 07478976 Cl. 406-50.
Nortel Networks Limited: See--
Allan, David 07480253 Cl. 370-252.
Chen, Xixian; Xue, Guoqiang; Harris, Mark; and Li, Weigang 07480516 Cl. 455-522.
Stuart, David; Wandel, Markus; and Toplis, Blake 07480730 Cl. 709-232.
Sylvain, Dany D. 07480283 Cl. 370-352.
Unbehagen, Paul; and Radoaca, Vasile 07480306 Cl. 370-401.
North, Janice: See--
Leong, Simon; Chan, Agnes How-Ching; Hunt, David William Carey; Levy, Julia G.; Renke, Martin; and North, Janice 07479503 Cl. 514-414.
Northon, Dennis William: See--
Micu, Carl John; Ritter, Curtis Paul; Holden, Richard Hartley Coe; Northon, Dennis William; and Carpenter, Wade Sanner 07478616 Cl. 123-143C.
Northrop Grumman Corporation: See--
Stenger, Peter A. 07479841 Cl. 333-26.
Noto, Rodolfo: See--
Lo Presti, Gaetano; and Noto, Rodolfo 07479196 Cl. 156-96.
Novak, Michael J.; Nadalin, David M.; Olson, Kipley J.; Larkin, Kevin P.; and Sanborn, Frank G., to Microsoft Corporation Methods and systems for creating skins 07480868 Cl. 715-746.
Novartis AG: See--
Seidelmann, Dieter; Krueger, Martin; Ottow, Eckhard; Huth, Andreas; Thierauch, Karl-Heinz; Menrad, Andreas; and Haberey, Martin 07479491 Cl. 514-237.2.
Novatek Microelectronics Corp.: See--
Chen, Wei-Zen; Liao, Dar-Huei; and Yen, Chih-Jen 07479833 Cl. 330-296.
Novell, Inc.: See--
Dahneke, Bart; Tronson, Ted Wayne; Cowley, Michael John; and Parra, Victor Hugo 07480745 Cl. 710-15.
Novellus Systems, Inc.: See--
Entley, William R.; Langan, John G.; Murali, Amith; and Bennett, Kathleen 07479191 Cl. 134-1.
Novick, Gregory: See--
Jobs, Steven P.; Forstall, Scott; Christie, Greg; Lemay, Stephen O.; Herz, Scott; van Os, Marcel; Ording, Bas; Novick, Gregory; Westerman, Wayne C.; Chaudhri, Imran; Coffman, Patrick Lee; Kocienda, Kenneth; Ganatra, Nitin K.; Anzures, Freddy Allen; Wyld, Jeremy A.; Bush, Jeffrey; Matas, Michael; Marcos, Paul D.; Pisula, Charles J.; King, Virgil Scott; Blumenberg, Chris; Tolmasky, Francisco Ryan; Williamson, Richard; Boule, Andre M. J.; and Lamiraux, Henri C. 07479949 Cl. 345-173.
Novo Measuring Instruments Ltd.: See--
Zagatsky, Yan 07480404 Cl. 382-151.
Novotny, Pavel; to UCB Pharma Limited Acellular pertussis vaccine comprising a combination of the 69 kDa and the filamentous haemagglutinin antigens of Bordetella pertussis 07479283 Cl. 424-253.1.
Nowak, Edward J.: See--
Haensch, Wilfried E.; and Nowak, Edward J. 07479410 Cl. 438-123.
NTT DoCoMo, Inc.: See--
Fujii, Hiromasa; and Suda, Hirohito 07480235 Cl. 370-208.
Kuroda, Kei 07480507 Cl. 455-433.
Manabe, Hiroyuki; Hiraiwa, Akira; and Sugimura, Toshiaki 07480616 Cl. 704-254.
Uebayashi, Shinji; Onoe, Seizo; Ishii, Minami; and Nakamura, Takehiro 07480277 Cl. 370-335.
Nukui, Seiji: See--
Nakao, Kazunari; Okumura, Yoshiyuki; Matsumizu, Miyako; Ueno, Naomi; Hashizume, Yoshinobu; Kato, Tomoki; Kawai, Akiyoshi; Miyake, Yoriko; Nukui, Seiji; Shinjyo, Katsuhiro; and Taniguchi, Kana 07479564 Cl. 548-304.4.
Nurminen, Jani K.: See--
Tian, Jilei; Nurminen, Jani K.; and Popa, Victor 07480641 Cl. 706-15.
Nutec Components Inc.: See--
Schnetzler, Rene H.; and Yoon, Young A. 07478981 Cl. 409-134.
Nutter, Dana M.: See--
Wainwright, Norman R.; and Nutter, Dana M. 07479375 Cl. 435-7.2.
NVIDIA Corporation: See--
Berendsen, John 07480739 Cl. 710-5.
Danilak, Radoslav 07480749 Cl. 710-52.
King, Gary C.; Chang, Luke Y.; Molnar, Steven E.; and McAllister, David K. 07479965 Cl. 345-589.
Mimberg, Ludger 07479753 Cl. 318-599.
NXP B.V.: See--
Mair, Werner; and Lanzenberger, Heinz 07480352 Cl. 375-340.
Xu, Peng 07479769 Cl. 323-271.