| US 7,480,792 B2 | ||
| Memory modules having accurate operating parameters stored thereon and methods for fabricating and implementing such devices | ||
| Jeffery W. Janzen, Meridian, Id. (US); Scott Schaefer, Boise, Id. (US); and Todd D. Farrell, Boise, Id. (US) | ||
| Assigned to Micron Technology, Inc., Boise, Id. (US) | ||
| Filed on Jul. 28, 2006, as Appl. No. 11/495,964. | ||
| Application 11/495964 is a continuation of application No. 10/816239, filed on Apr. 01, 2004, granted, now 7,404,071. | ||
| Prior Publication US 2006/0265615 A1, Nov. 23, 2006 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. G06F 9/312 (2006.01); G06F 15/177 (2006.01) | ||
| U.S. Cl. 713—1 [713/300; 711/1; 702/57; 702/99; 702/117; 702/118; 702/119; 702/130; 365/63; 365/225.7] | 18 Claims |
| 1. A method of operating a memory module comprising a volatile memory device, the method comprising:
accessing the volatile memory device;
monitoring an actual operating current of the volatile memory device; and
comparing the actual operating current of the volatile memory device to operating current thresholds, wherein the operating
current thresholds are based on operating currents uniquely corresponding to a lot in which the volatile memory device was
manufactured.
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