| US 7,479,109 B2 | ||
| Ophthalmologic applanation cornea contactor replacement system for eye examining instrument | ||
| Francis Y Falck, Jr., Stonington, N.Y. (US); and Robert W Falck, Pawcatuck, Conn. (US) | ||
| Assigned to Falck Medical, Inc., Mystic, Conn. (US) | ||
| Filed on Oct. 31, 2007, as Appl. No. 11/930,508. | ||
| Application 11/930508 is a continuation of application No. 11/420946, filed on May 30, 2006, abandoned. | ||
| Application 11/420946 is a continuation of application No. 10/453253, filed on Jun. 03, 2003, granted, now 7,153,267. | ||
| Prior Publication US 2008/0077000 A1, Mar. 27, 2008 | ||
| This patent is subject to a terminal disclaimer. | ||
| Int. Cl. A61B 3/16 (2006.01) | ||
| U.S. Cl. 600—406 [600/405] | 18 Claims |
| 1. A system ensuring replacement of a molded resin cornea contactor used in an eye examining instrument having a microprocessor
and a holder for receiving the cornea contactor in an operating position, the system comprising:
the cornea contactor being molded to have an element that is deformable in a direction of insertion of the cornea contactor
into the holder;
a strain gauge arranged in the holder to engage the element as the cornea contactor is being inserted into the holder and
before the cornea contactor reaches the operating position;
the strain gauge being arranged to deform the element from its initial position to a deformed position as the cornea contactor
is moved fully into the holder to the operating position;
the strain gauge being arranged to produce a strain signal delivered to the microprocessor representing the strain involved
in deforming the element from its initial position to its deformed position;
the element being configured so that a first deformation of the element from its initial position to its deformed position
requires more stress than any subsequent deformation of the element from its initial position to its deformed position;
the microprocessor being programmed to distinguish between a strain signal from the strain gauge representing the first deformation
of the element and a strain signal from the strain gauge representing the subsequent deformation of the element; and
the microprocessor being programmed to proceed with an eye examination only if a cornea contactor inserted into the holder
causes the strain gauge to produce a strain signal representing the first deformation of the element.
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