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US 7,475,588 B2 |
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| Apparatus and process for sensing fluoro species in semiconductor processing systems |
| Frank Dimeo, Jr., Danbury, Conn. (US); Philip S. H. Chen, Bethel, Conn. (US); Jeffrey W. Neuner, Bethel, Conn. (US); James Welch, Wolcott, Conn. (US); Michele Stawacz, New Milford, Conn. (US); Thomas H. Baum, New Fairfield, Conn. (US); Mackenzie E. King, Southbury, Conn. (US); Ing-Shin Chen, Danbury, Conn. (US); and Jeffrey F. Roeder, Brookfield, Conn. (US) |
| Assigned to Advanced Technology Materials, Inc., Danbury, Conn. (US) |
| Filed on Feb. 14, 2005, as Appl. No. 11/57,734. |
| Application 11/057734 is a division of application No. 10/273036, filed on Oct. 17, 2002, granted, now 7,080,545. |
| Prior Publication US 2005/0205424 A1, Sep. 22, 2005 |
| Int. Cl. G01N 9/00 (2006.01)
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