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Classification Resources
 
Class   850SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, E.G., SCANNING PROBE MICROSCOPY [SPM]
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[List of Pre Grant Publications for class 850 subclass 1][List of Patents for class 850 subclass 1]1 SCANNING OR POSITIONING ARRANGEMENTS, I.E., ARRANGEMENTS FOR ACTIVELY CONTROLLING THE MOVEMENT OR POSITION OF THE PROBE (EPO)
[List of Pre Grant Publications for class 850 subclass 5][List of Patents for class 850 subclass 5]5 MONITORING THE MOVEMENT OR POSITION OF THE PROBE RESPONSIVE TO INTERACTION WITH THE SAMPLE (EPO)
[List of Pre Grant Publications for class 850 subclass 8][List of Patents for class 850 subclass 8]8 AUXILIARY MEANS SERVING TO ASSIST OR IMPROVE THE SCANNING PROBE TECHNIQUES OR APPARATUS, E.G., DISPLAY OR DATA PROCESSING DEVICES (EPO)
[List of Pre Grant Publications for class 850 subclass 19][List of Patents for class 850 subclass 19]19 CALIBRATION ASPECT, E.G., CALIBRATION OF PROBES (EPO)
[List of Pre Grant Publications for class 850 subclass 21][List of Patents for class 850 subclass 21]21 PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL COMPONENTS THEREOF (EPO)
[List of Pre Grant Publications for class 850 subclass 22][List of Patents for class 850 subclass 22]22 Subclass 22 indent level is 1 Multiple-type SPM, i.e., involving two or more SPM techniques (EPO)
[List of Pre Grant Publications for class 850 subclass 26][List of Patents for class 850 subclass 26]26 Subclass 26 indent level is 1 Scanning Tunnelling Microscopy [STM] or apparatus therefor, e.g., STM probes (EPO)
[List of Pre Grant Publications for class 850 subclass 30][List of Patents for class 850 subclass 30]30 Subclass 30 indent level is 1 Scanning Near-Field Optical Microscopy [SNOM] or apparatus therefor, e.g., SNOM probes (EPO)
[List of Pre Grant Publications for class 850 subclass 33][List of Patents for class 850 subclass 33]33 Subclass 33 indent level is 1 Atomic Force Microscopy [AFM] or apparatus therefor, e.g., AFM probes(EPO)
 [List of Pre Grant Publications for class 850 subclass 43][List of Patents for class 850 subclass 43]43 Subclass 43 indent level is 1 Scanning Ion-Conductance Microscopy [SICM] or apparatus therefor, e.g., SICM probes(EPO)
[List of Pre Grant Publications for class 850 subclass 44][List of Patents for class 850 subclass 44]44 Subclass 44 indent level is 1 Scanning Capacitance Microscopy [SCM] or apparatus therefor, e.g., SCM probes (EPO)
[List of Pre Grant Publications for class 850 subclass 46][List of Patents for class 850 subclass 46]46 Subclass 46 indent level is 1 Magnetic Force Microscopy [MFM] or apparatus therefor, e.g., MFM probes (EPO)
 [List of Pre Grant Publications for class 850 subclass 50][List of Patents for class 850 subclass 50]50 Subclass 50 indent level is 1 Scanning Thermal Microscopy [SThM] or apparatus therefor, e.g., SThM probes (EPO)
 [List of Pre Grant Publications for class 850 subclass 51][List of Patents for class 850 subclass 51]51 Subclass 51 indent level is 1 Scanning Electro-Chemical Microscopy [SECM] or apparatus therefor, e.g., SECM probes (EPO)
[List of Pre Grant Publications for class 850 subclass 52][List of Patents for class 850 subclass 52]52 GENERAL ASPECTS OF SPM PROBES, THEIR MANUFACTURE, OR THEIR RELATED INSTRUMENTATION, INSOFAR AS THEY ARE NOT SPECIALLY ADAPTED TO A SINGLE SPECIFIC SPM TECHNIQUE (EPO)
 [List of Pre Grant Publications for class 850 subclass 62][List of Patents for class 850 subclass 62]62 APPLICATIONS OF SCANNING-PROBE TECHNIQUES OTHER THAN SPM (EPO)
 [List of Pre Grant Publications for class 850 subclass 63][List of Patents for class 850 subclass 63]63 SCANNING-PROBE TECHNIQUES OR APPARATUS NOT OTHERWISE PROVIDED FOR (EPO)