This class covers Scanning probes, i.e., devices
having at least a tip of nanometre sized dimensions that scans or moves
over an object surface, typically at a distance of a few
angstroms or nanometres, monitoring some interaction between
the tip and the surface, e.g., monitoring
the generation of a tunnelling current and techniques or apparatus
involving the use of scanning probes.
The following subjects are therefore covered, the
list being non-exhaustive:
scanning probes, per se, their manufacture
or their related instrumentation, e.g.,
holders;
scanning probe microscopy (SPM) or microscopes, i.e., the
application of scanning probes to the investigation or analysis
of a surface structure in atomic ranges;
applications, other than SPM, involving
the use of scanning probes.
SECTION II - LINES WITH OTHER CLASSES AND WITHIN THIS CLASS
Class 73,Measuring and Testing, is the generic
class for processes and apparatus for making a measurement of any
kind or for making a test of any kind. It takes all such
subject matter not provided for in other classes. Claimed
subject matter directed to a specific structure or method of SPM
is classifiable in Class 850. Class324, Electricity: Measuring
and Testing, is the residual home for all subject matter, not
elsewhere classified, relating to the measuring, testing
or sensing of electric properties. Claimed subject matter
directed to a specific structure or method of SPM is classifiable
Class 850.
SECTION III - SUBCLASS REFERENCES TO THE CURRENT CLASS
Measuring and Testing,
subclass 104 , 105 for testing or inspecting surfaces
or edges in general and subclass 866 for the testing of material not
elsewhere classifiable.
Radiant Energy,
subclasses 306 through 443.1apparatus and methods for the inspection of solids
or liquids in which charged particles, impelled (as in
a beam) toward the object to be inspected and pass near
to or through the object, or are reflected from or diffracted
by the object, or secondary radiations emitted from the
object, are detected.
Electricity: Measuring and Testing,
subclass 72.5 for testing potential in specific environments
using a voltage probe; subclasses 76.11-157
for measuring, testing, or sensing electricity, per
se, using probes; subclasses 307-315 for
means to measure the effects of external magnetic fields upon the
resonance of a host material in a controlled electromagnetic field; subclasses
425-450 for using probes to test electrolytes; subclasses
500-556 for fault detecting in electric circuits and of
electric components using probes, and subclasses 600-727
for testing impedance, admittance or other quantities representative
of electrical stimulus/response relationships using probes, especially subclass
690 for capacitance sensing using probes.
Coating Process, appropriate subclasses for surface coating processing using
SPM; especially
subclasses 357 through 601for coating processes with direct application of
electrical, magnetic, wave, or particular
energy using SPM.
Dynamic Optical Information Storage or Retrieval, appropriate subclasses for information recording
using SPM in accordance with means for recording for processes and
apparatus for making a measurement of any kind or for making a test
of any kind, and takes all such subject matter not provided
for in other classes.
SCANNING OR POSITIONING ARRANGEMENTS, I.E., ARRANGEMENTS
FOR ACTIVELY CONTROLLING THE MOVEMENT OR POSITION OF THE PROBE (EPO):
This subclass is indented under the class definition. Subject matter includes details about means or methods for
actively controlling the movement or the location of the scanning probe
tip relative to the object surface.
(1)
Note. This subclass and its indents are directed
to arrangements for an operator to control the movement or position
of the probe.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 10/00).
This subclass is indented under subclass 1. Subject including generating movement of the scanning probe
tip relative to the object surface at a scale larger than the resolution
of the scanning probe microscope.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 10/02).
This subclass is indented under subclass 1. Subject matter including generating movement of the scanning
probe tip relative to the object surface as large as the scale of
the resolution of the scanning probe microscope.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 10/04).
This subclass is indented under subclass 3. Subject matter including electronic means for locating or
stabilizing the movement of the scanning probe tip relative to the
object surface.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 10/06).
Optical: Systems and Elements,
subclasses 15 through 20for optical device in which a hologram is used
to direct a beam of light over the elements of a given region; subclasses 201-208
for optical scanning.
This subclass is indented under subclass 5. Subject matter wherein the probe comprises in their structure
means for detecting a signal to control/monitor its movements (e.g., piezoelectric
gauge).
(1)
Note: An example for Self-detecting probe
is the probe itself generates a signal representative of its position, e.g., piezo-electric
gauge.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 20/04).
AUXILIARY MEANS SERVING TO ASSIST OR IMPROVE THE SCANNING PROBE
TECHNIQUES OR APPARATUS, E.G., DISPLAY
OR DATA PROCESSING DEVICES (EPO):
This subclass is indented under the class definition. Subject matter including a additional device or method that
assists or improves the analysis or the investigation.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/00).
This subclass is indented under subclass 8. Subject matter wherein the additional device is an analysing
or investigating device different from a scanning probe microscope.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/02).
Radiant Energy,
subclasses 306 through 311for analysing device which impels charged particles toward
a object or material to be studied; subclass 310 for scanning
electron microscope.
This subclass is indented under subclass 8. Subject matter including a programmable device that stores, retrieves, processes
or displays data for assisting or improving the scanning probe technique
or apparatus.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/04).
This subclass is indented under subclass 8. Subject matter including means that can adjust or control
the parameters, such as temperature, pressure, humidity, etc., of
a working environment condition inside the chamber containing the
sample being studied.
(1)
Note. included in this subclass is means for actively
establishing desired environmental within the sample chamber such as
by heating the chamber to an elevated temperature, filling
the chamber with a liquid, or other such means.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/08).
for means for preventing undesired external phenomena
such as breezes, vibrations from people walking nearby, etc., from
having any effect on conditions within the sample chamber.
This subclass is indented under subclass 12. Subject matter including means to adjust or control the
temperature of the sample chamber, e.g.,
a cryostat or heater that allows SPM to be performed at low or
high temperatures.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/10).
This subclass is indented under subclass 12. Subject matter including means that can adjust or control
the parameters, i.e. pressure or compositions, of
the materials of the environment inside the sample chamber.
(1)
Note: Materials of the fluid environment can be
of liquid state or gas.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/12).
This subclass is indented under subclass 14. Subject matter wherein the fluid environment is a liquid
such as water or other liquid chemical inside the sample chamber.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/14).
This subclass is indented under subclass 12. Subject matter including means that can establish or maintain
no or few molecules (or atoms) inside the chamber
e.g., pumping means to reduce pressure
inside the chamber.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/16).
This subclass is indented under subclass 8. Subject matter including means that prevents SPM from being
disturbed by a condition outside the scanning probe microscope such
as vibration, temperature, pressure, etc.
(1)
Note: The SPM is protected as a whole under the
adverse condition. For example, a specific housing
or arrangement to eliminate external vibrations to assure the stability
of the microscope, or shielding that protects it from electromagnetic fields.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/18).
This subclass is indented under subclass 8. Subject matter including a method or device that mechanically
positions or conditions a sample for analysis or investigation (e.g., tweezers, cutting
means).
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 30/20).
CALIBRATION ASPECT, E.G., CALIBRATION
OF PROBES (EPO):
This subclass is indented under the class definition. Subject matter including a method or apparatus used to adjust
or rectify a SPM device, e.g., the
probe itself, to a desired standard.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 40/00).
Data Processing; Measuring, Calibrating, or
Testing,
subclass 104 for calibrating or correcting a tranducer in a data
processing system or calculating computer of a measurement or testing system.
This subclass is indented under subclass 19. Subject matter including a structure with nanometric resolution
used for correcting or fixing the performance of the SPM device
before its utilization, e.g., grating
with a known line separation; and its related manufacture.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 40/02).
PARTICULAR TYPE OF SCANNING PROBE MICROSCOPY [SPM] OR MICROSCOPE; ESSENTIAL
COMPONENTS THEREOF (EPO):
This subclass is indented under the class definition. Subject matter including a method or device for which the
type of interaction between the scanning probe tip and the sample surface
is specified.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/00).
Radiant Energy,
subclasses 306 through 311for the inspection of solids or liquids by inspected
and which pass near to or through the object, or are reflected
from or diffracted by the object, or secondary radiations
emitted from the object, are detected.
This subclass is indented under subclass 21. Subject matter involving two or more different types of
interactions.
(1)
Note: The device can contain either one probe or
more than one probe to perform different types of SPM over the sample. Although, a
cantilever-type SNOM can perform the function of AFM, not
every SNOM of such a type should be classified here.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/02).
Dynamic Information Storage or Retrieval,
subclass 13.33 for storage or retrieval by the simultaneous application
of a magnetic field and near field optics.
This subclass is indented under subclass 22. Subject matter wherein the two interactions are tunnelling
current (STM) and the attractive or repulsive
force between the probe and the sample surface (AFM).
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/04).
This subclass is indented under subclass 22. Subject matter wherein the two interactions involve near-field
light emitted from the sample surface (SNOM) and
the attractive or repulsive force between the probe and the sample surface (AFM).
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/06).
This subclass is indented under subclass 22. Subject matter wherein the two interactions are between
the magnetic force between the sample and the probe (MFM) and
the attractive or repulsive force between the probe and the sample
surface (AFM).
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/08).
This subclass is indented under subclass 21. Subject matter wherein the monitored interaction is the
tunnelling current between the tip and the sample which are in very
close proximity but not actually in physical contact.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/10).
Nanotechnology,
subclass 861 for subject matter classified in this subclass
and its indents is requested to be appropriately crossed into the
cross reference art collection class.
This subclass is indented under subclass 26. Subject matter including a specific aspect of the probe, its
manufacture, or its related instrumentation, e.g., holders.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/16).
This subclass is indented under subclass 21. Subject matter wherein the monitored interaction involves
near-field light emitted or reflected from the sample surface.
(1)
Note: subject matter classified in this subclass
and its indents is requested to be appropriately crossed into the
cross reference.
(2)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/18).
Dynamic Information Storage or Retrieval,
subclass 13.33 for storage or retrieval by the simultaneous application
of a magnetic field and near field optics, and subclasses
43- 44.42 for information storage or retrieval with
servo positioning of transducer assembly over track combined with information
signal processing.
Nanotechnology,
subclass 862 for subject matter classified in this subclass
and its indents is requested to be appropriately crossed into the
cross reference art collection class.
This subclass is indented under subclass 30. Subject matter wherein the near-field light to be
monitored is the emission from a sample surface excited by an electromagnetic
wave.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/20).
This subclass is indented under subclass 30. Subject matter including a specific aspect of the probe, its
manufacture, or its related instrumentation, e.g., holders.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/22).
This subclass is indented under subclass 21. Subject matter wherein the monitored interaction is the
short range repulsive or long range attractive force between the
probe and atoms of the sample surface.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/24).
Nanotechnology,
subclass 863 for subject matter classified in this subclass
and its indents is requested to be appropriately crossed into the
cross reference art collection class.
This subclass is indented under subclass 33. Subject matter wherein the force monitored is the force
that tends to keep the probe in contact with the sample surface.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/28).
This subclass is indented under subclass 33. Subject matter wherein the force is an electric interaction
affected by the electric potential distribution on the sample surface. (e.g., Kelvin probe
microscopy and Scanning Maxwell stress microscopy, etc.).
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/30).
This subclass is indented under subclass 33. Subject matter including a specific aspect of the probe, its
manufacture, or its related instrumentation, e.g., holders.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/38).
This subclass is indented under subclass 40. Subject matter including adding specific particles to the
tip to give it another characteristic, e.g., specific
chemical receptor for biochemical analysis.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/42).
This subclass is indented under subclass 21. Subject matter wherein the interaction to be observed is
ion flow between the probe tip and the sample surface.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/44).
Nanotechnology,
subclass 861 for subject matter classified in this subclass
and is requested to be appropriately crossed into the cross reference art
collection class.
This subclass is indented under subclass 21. Subject matter wherein the interaction to be observed is
the electrical capacity between tip and the sample surface.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/46).
Nanotechnology,
subclass 866 for subject matter classified in this subclass
and is requested to be appropriately crossed into the cross reference art
collection class.
This subclass is indented under subclass 44. Subject matter including a specific aspect of the probe, its
manufacture, or its related instrumentation, e.g. holders.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/48).
Nanotechnology,
subclass 865 for subject matter classified in this class and
is requested to be appropriately crossed into the cross reference
art collection class.
This subclass is indented under subclass 46. Subject matter including a specific aspect of the probe, its
manufacture, or its related instrumentation, e.g., holders.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/54).
Nanotechnology,
subclasses 872 through 879for subject matter classified in these subclasses
and their indents are requested to be appropriately crossed into
the cross reference art collection class.
Nanotechnology,
subclass 867 for subject matter classified in this subclass
and is requested to be appropriately crossed into the cross reference art
collection class.
This subclass is indented under subclass 21. Subject matter wherein the monitored interaction that is
monitored is the Faraday current generated by an electrochemical
reaction.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 60/60).
Nanotechnology,
subclasses 872 through 879for subject matter classified in these subclasses
and their indents are requested to be appropriately crossed into
the cross reference art collection class.
GENERAL ASPECTS OF SPM PROBES, THEIR MANUFACTURE, OR
THEIR RELATED INSTRUMENTATION, INSOFAR AS THEY ARE NOT
SPECIALLY ADAPTED TO A SINGLE SPM TECHNIQUE (EPO):
This subclass is indented under the class definition. Subject matter including a SPM probe, its manufacture, or
its related instrumentation, insofar as not peculiar to
a specific SPM technique.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 70/00).
Nanotechnology,
subclasses 872 through 879for subject matter classified in these subclasses
and their indents are requested to be appropriately crossed into
the cross reference art collection class.
Measuring and Testing,
subclass 866.5 for probes mountings in which a particular sensing
element is either not specified or not otherwise provided for, or
there are plural sensing elements, none of which is otherwise provided
for.
This subclass is indented under subclass 53. Subject matter including means integrated in the probe holder
that can adjust the probe to correct for errors caused by temperature
variations or vibrations.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 70/04).
Measuring and Testing,
subclass 866.5 for probes in which a particular sensing element
is either not specified, not otherwise provided for, or there
are plural sensing elements, none of which is otherwise
provided for.
Nanotechnology,
subclasses 875 through 879for subject matter classified in these subclasses
and their indents are requested to be appropriately crossed into
the cross reference art collection class.
This subclass is indented under subclass 56. Subject matter wherein the physical form of the tip or the
degree of slope or angle of the tip is specified.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 70/10).
Nanotechnology,
subclasses 875 through 879subject matter classified in these subclasses and
their indents are requested to be appropriately crossed into the
cross reference art collection class.
This subclass is indented under subclass 56. Subject matter wherein the scanning probe or a component
thereof (e.g., a cantilever
or a covering material on the tip) is made of some material
that gives a particular property to the scanning probe.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 70/14).
This subclass is indented under subclass 60. Subject matter including adding specific particles to the
probe tip to give it another characteristic, e.g., specific
chemical receptor for biochemical analysis.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 70/18).
APPLICATIONS OF SCANNING-PROBE TECHNIQUES OTHER
THAN SPM (EPO):
This subclass is indented under the class definition. Subject matter including a specific application of a scanning-probe
technique not otherwise provided for.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 80/00).
Coating Process, appropriate subclasses for surface coating processing using
SPM; especially
subclasses 357 through 601for coating processes with direct application of
electrical, magnetic, wave, or particular
energy using SPM.
SCANNING-PROBE APPARATUS OR TECHNIQUES NOT OTHERWISE
PROVIDED FOR (EPO):
This subclass is indented under the class definition. Subject matter including general or specific scanning-probe
apparatus or techniques not otherwise provided for.
(1)
Note. The subject matter in this subclass is substantially
the same in scope as ECLA (G01Q 90/00).
This page is produced by the Office of Classification Support (Office of Patent Classification) for the Reference Tools Project.
Note: The Patent
and Trademark Depository Library Program (PTDLP) administers a nationwide
network of public, state and academic libraries designated as Patent and
Trademark Depository Libraries authorized by 35 U.S.C. 13 to: Disseminate
Patent and Trademark Information Support Diverse Intellectual Property
Needs of the Public. PTDL Contact Information
Note: For information/comments on electronic information products, such
as purchasing USPTO data, or to discuss system requirements for magnetic
tape products, contact:
KEY: =online
business system =fees =forms=help =laws/regulations =definition
(glossary)
The Inventors
Assistance Center is available to help you on patent
matters.Send questions about USPTO programs and services
to theUSPTO
Contact Center (UCC). You can suggest USPTO webpages
or material you would like featured on this section by E-mail
to the webmaster@uspto.gov.
While we cannot promise to accommodate all requests, your suggestions
will be considered and may lead to other improvements on the
website.
![[Search a list of Patent Appplications for class 850]](../as.gif)
CLASS 850,![[List of Patents for class 850 subclass 1]](../ps.gif)
1
=online
business system 
=fees 
=forms
=help 
=laws/regulations 
=definition
(glossary)