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TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
Definition statement
This subclass/group covers:

Arrangements for handling particles or ionising radiation, e.g. focusing or moderating;

Ionising radiation filters, e.g. X-ray filters;

Conversion screens for the conversion of the spatial distribution of particles or ionising radiation into visible images, e.g. fluoroscopic screens;

Irradiation devices;

Gamma ray or X-ray microscopes.

References relevant to classification in this subclass
This subclass/group does not cover:
Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons

Places in relation to which this subclass is residual:

Adaptations of reactors to facilitate experimentation or irradiation
Electron-optical arrangements in cathode ray tubes or electron beam tubes
Discharge tubes with provision for emergence of electrons or ions from the vessel; Lenard tubes
Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
Electron or ion microscopes with scanning beams
Production or acceleration of neutral particle beams, e.g. molecular or atomic beams
Direct voltage accelerators; accelerators using single pulses
Targets for producing nuclear reactions
Details of linear accelerators, magnetic induction accelerators, cyclotrons and magnetic resonance accelerators
Linear accelerators
Magnetic induction accelerators, e.g. betatrons
Magnetic resonance accelerators; Cyclotrons
Methods or devices for acceleration of charged particles not otherwise provided for
Informative references
Attention is drawn to the following places, which may be of interest for search:
Investigating or analysing materials by investigating the ionisation of gases
Scanning probe techniques or apparatus; applications of scanning probe techniques, e.g. scanning probe microscopy
X-ray apparatus involving X-ray tubes; circuits therefor
Apparatus or processes specially adapted for producing X-rays, not involving X-ray tubes, e.g. involving generation of plasma
Generating plasma; handling plasma
Particle spectrometers or separator tubes
Glossary of terms
In this subclass/group, the following terms (or expressions) are used with the meaning indicated:
Particle
Molecular, atomic or subatomic particle
Ionising radiation
'Ionising radiation’ consists of particles or electromagnetic waves that are sufficiently energetic to detach electrons from atoms or molecules, thus ionising them.
Arrangements for handling particles or ionizing radiation, e.g. focusing or moderating ( production or acceleration of neutrons, electrically-charged particles, neutral molecular beams or neutral atomic beams H05H 3/00 - H05H 15/00)
Definition statement
This subclass/group covers:
  • Diaphragms, collimators for handling ionizing radiation
  • Arrangements using diffraction, refraction or reflection, e.g. monochromators, for handling ionizing radiation
  • Deviation, concentration or focusing of the beam by electric or magnetic means
  • Scattering devices
  • Absorbing devices
  • Filter for ionising radiation
References relevant to classification in this group
This subclass/group does not cover:
Moderators in nuclear reactors
Electrodes, lenses, blanking arrays etc. in discharge tubes
Informative references
Attention is drawn to the following places, which may be of interest for search:
Production or acceleration of neutrons, electrically charged particles, or neutral molecular or atomic beams
{Manipulation of charged particles by using radiation pressure, e.g. optical levitation ( acceleration of charged particles H05H 5/00 , H05H 7/00 , H05H 9/00 , H05H 11/00 , H05H 13/00) }
Definition statement
This subclass/group covers:

Manipulation of charged nucleons or ions by radiation pressure, such as magneto optical ion traps, capturing cold ions

References relevant to classification in this group
This subclass/group does not cover:
Acceleration of charged particles
Glossary of terms
In this subclass/group, the following terms (or expressions) are used with the meaning indicated:

In this subclass, the following expressions are used with the meaning indicated

Radiation pressure
pressure exerted upon any surface exposed to electromagnetic radiation. If absorbed, the pressure is the power flux density divided by the speed of light. If the radiation is totally reflected, the radiation pressure is doubled
{Manipulation of neutral particles by using radiation pressure, e.g. optical levitation ( production or acceleration of neutral particles H05H 3/00) }
Definition statement
This subclass/group covers:

Manipulation of uncharged nucleons, atoms or molecules by radiation pressure, such as magneto optical atom traps, capturing cold atoms e.g. for cold-atom interferometry.

References relevant to classification in this group
This subclass/group does not cover:
Sample preparation
Investigating characteristics of particles
Production or acceleration of neutral particles
Informative references
Attention is drawn to the following places, which may be of interest for search:
Handling suspended soils or molecules independently from the bulk or fluid flow
B01L3/00C6M16, also B01L 2400/0454 in combination with B01L3/00C6M16
Optical elements, system or apparatus
Computer generated holograms in general
using diaphragms, collimators
Glossary of terms
In this subclass/group, the following terms (or expressions) are used with the meaning indicated:
Collimator
Structure which achieves certain beam properties by absorbing those parts of the beam not having the desired properties, as opposed to structures which actively (through reflection or diffraction) change those properties.
{using multiple collimators, e.g. Bucky screens; other devices for eliminating undesired or dispersed radiation}
Definition statement
This subclass/group covers:

Devices selectively blocking rays according to their direction of propagation.

using variable diaphragms, shutters, choppers
Definition statement
This subclass/group covers:

Devices selectively blocking rays according to the position on which they are incident onto the device.

{changing time structure of beams by mechanical means, e.g. choppers, spinning filter wheels}
Definition statement
This subclass/group covers:

Devices such as choppers, scanning wheels e.g. "Nipkov disk"; filter wheels modulating the beam (i.e. continuously moving).

References relevant to classification in this group
This subclass/group does not cover:
Moving scattering grids
Scanning of charged particle beams
G21K 1/08, G21K1/87, G21K1/93
Informative references
Attention is drawn to the following places, which may be of interest for search:
Optical choppers
Special rules of classification within this group

For filter wheels modulating the beam (i.e. continuously moving), G21K 1/10 has to be allocated as well.

Glossary of terms
In this subclass/group, the following terms (or expressions) are used with the meaning indicated:
chaning time structure
changing intensity, phase, polarisation or frequency over time
{varying the contour of the field, e.g. multileaf collimators}
Definition statement
This subclass/group covers:

Diaphragms allowing a variation of the shape of the field, in a way which goes beyond changing the dimensions or the orientation or the aspect ratio of the field, e.g. by use of a plurality of individually positionable strips.

Example:

media0.jpg

US2009080619, Fig. 3

References relevant to classification in this group
This subclass/group does not cover:
Iris diaphragms, setups changing only size or orientation of the irradiated region e.g. rectangular diaphragms
using diffraction, refraction or reflection, e.g. monochromators (G21K 1/10 , G21K 7/00 take precedence )
Definition statement
This subclass/group covers:

Devices such as crystals, and all other optics not covered by the definition of the subgroups.

References relevant to classification in this group
This subclass/group does not cover:
Scattering devices; Absorbing devices; Ionising radiation filters
Gamma- or X-ray microscopes
Special rules of classification within this group

Assignment of Indexing Codes G21K 2201/062 to G21K 2201/068 is obligatory as important information for further details.

Assignment of G21K 2201/06 to G21K 2201/068 as additional information is optional.

{Devices having a multilayer structure}
Definition statement
This subclass/group covers:

Devices having a multilayer structure such as multilayer mirrors, multilayer gratings; including multilayers used in Laue geometry.

Informative references
Attention is drawn to the following places, which may be of interest for search:
Mirrors for UV light
Multilayer mirrors for IR or visible or UV
Special rules of classification within this group

Documents, which could potentially concern UV light and (soft or ultrasoft) X-rays due to the structure of the apparatus, or due to doubts if the wavelength range of intended operation is in the UV or the EUV / X-ray range, are to be classified in G21K 1/062 and as well in appropriate places in G02B 5/00.

{using refraction, e.g. Tomie lenses}
Glossary of terms
In this subclass/group, the following terms (or expressions) are used with the meaning indicated:
Tomie lens
compound refractive x-ray lens

Example:

media1.png

US5594773 (Tomie), Fig. 4a

{using surface reflection, e.g. grazing incidence mirrors, gratings ( multilayer mirrors G21K 1/062 ; crystal optics G21K 1/06) }
Definition statement
This subclass/group covers:

Grazing incidence mirrors, gratings, multicapillary lenses (Khumakov lenses).

Example:

media2.png

US5192869 (Kumakhov), Fig. 10

References relevant to classification in this group
This subclass/group does not cover:
Crystal optics
Multilayer mirrors
Deviation, concentration or focusing of the beam by electric or magnetic means ( electron-optical arrangements in electric discharge tubes H01J 29/46 ; { details, e.g. electric or magnetic deviating means for direct voltage accelerators or in accelerators using single pulses H05H 5/02 ; arrangements for injecting particles into orbits H05H 7/08 ; arrangements for ejecting particles from orbits H05H 7/10} )
References relevant to classification in this group
This subclass/group does not cover:
Electron optical arrangements in electric discharge tubes in cathode ray tubes
Electron optical arrangements in electric discharge tubes with provision for introducing objects
Electron optical arrangements in electric discharge tubes in particle spectrometers
Details, e.g. electric or magnetic deviating means for direct voltage accelerators or in accelerators using single pulses
Arrangements for injecting particles into orbits
Arrangements for ejecting particles from orbits
by electrical means
Definition statement
This subclass/group covers:

Deviation, concentration or focusing of the beam by electrostatic means.

References relevant to classification in this group
This subclass/group does not cover:
Deviation, concentration or focusing of the beam by electromagnetic means
Scattering devices; Absorbing devices; Ionising radiation filters
Definition statement
This subclass/group covers:

Wavelength selective filter for X rays

Informative references
Attention is drawn to the following places, which may be of interest for search:
Energy modification of the final beam
Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens ( photographic processes using X-ray intensifiers G03C 5/17 ; discharge tubes comprising luminescent screens H01J 1/62 ; cathode ray tubes for X-ray conversion with optical output H01J 31/50)
Definition statement
This subclass/group covers:

Conversion screens for the conversion of the spatial distribution of X-rays or particle radiation into visible images, e.g. fluoroscopic screens

Informative references
Attention is drawn to the following places, which may be of interest for search:
Photographic processes using X-rays; using screens to intensify X-ray images
In discharge tubes: screens on or from which an image or pattern is formed; luminescent screens
In cathode ray tubes or electron beam tubes: image conversion tubes or image amplification tubes having an X-ray input and an optical output
Irradiation devices ( discharge tubes for irradiating H01J 37/00)
Definition statement
This subclass/group covers:

This main group contains devices for the irradiation of an object with ionising radiation such as X-rays or electron radiation.

References relevant to classification in this group
This subclass/group does not cover:
Conservation of food
Sterilization other than foodstuff or contact lenses
Preserving, protecting, or purifying packages or package content by irradiation
Discharge tubes with provision for emergence of electrons or ions from the vessel
Discharge tubes for irradiating
Discharge tubes with provision for introducing objects or material to be exposed to the discharge
Ion implanters
Electron beam or ion beam lithography
Glossary of terms
In this subclass/group, the following terms (or expressions) are used with the meaning indicated:
Irradiation
Exposure of an item to radiation with the aim to achieve a certain effect in the item, as opposed to techniques aiming at obtaining information from an item e.g. by analysis, obtaining images etc.
with beam-forming means
Definition statement
This subclass/group covers:

Inter aliae, apparatus aspects of beam outlets for radiation therapy.

Special rules of classification within this group

Additional assignment of a group symbol of G21K 1/00 is mandatory whenever the means used for beam forming are relevant.

Gamma- or X-ray microscopes
Definition statement
This subclass/group covers:

Gamma- or X-ray microscopes

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Last Modified: 10/11/2013