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Color Curly Brackets (indicating CPC extensions to IPC) References Date Revised
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CPC
COOPERATIVE PATENT CLASSIFICATION
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SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM] [2013‑01]
NOTE
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In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, classification is made in the first appropriate place.

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Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe [2013‑01]
.
Coarse scanning or positioning [2013‑01]
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.
Fine scanning or positioning [2013‑01]
. .
{
Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
}
[2013‑01]
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. .
Circuits or algorithms therefor [2013‑01]
. . .
{
Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
}
[2013‑01]
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Monitoring the movement or position of the probe [2013‑01]
.
by optical means [2013‑01]
.
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge [2013‑01]
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Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices [2013‑01]
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Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope [2013‑01]
. .
{
Optical microscopes coupled with SPM
}
[2013‑01]
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.
Display or data processing devices [2013‑01]
. .
for error compensation [2013‑01]
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Means for establishing or regulating a desired environmental condition within a sample chamber [2013‑01]
. .
Thermal environment [2013‑01]
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. .
Fluid environment [2013‑01]
. . .
Liquid environment [2013‑01]
. .
Vacuum environment [2013‑01]
.
Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields [2013‑01]
.
Sample handling device or method [2013‑01]
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Calibration, e.g. of probes [2013‑01]
.
Calibration standards and methods of fabrication thereof [2013‑01]
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Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof [2013‑01]
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Multiple-type SPM, i.e. involving more than one SPM technique [2013‑01]
. .
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy] [2013‑01]
. .
SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy] [2013‑01]
. .
MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy [2013‑01]
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STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes [2013‑01]
. .
STS [Scanning Tunnelling Spectroscopy] [2013‑01]
. .
STP [Scanning Tunnelling Potentiometry] [2013‑01]
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013‑01]
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.
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes [2013‑01]
. .
Fluorescence [2013‑01]
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013‑01]
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AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes [2013‑01]
. .
Friction force microscopy [2013‑01]
. .
Adhesion force microscopy [2013‑01]
. .
Scanning potential microscopy [2013‑01]
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. .
AC mode [2013‑01]
. . .
Tapping mode [2013‑01]
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. .
DC mode [2013‑01]
. . .
{
Contact-mode AFM
}
[2013‑01]
. . .
{
Nanoindenters, i.e. wherein the indenting force is measured
}
[2013‑01]
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. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013‑01]
. . .
Conductive probes [2013‑01]
. . .
Functionalization [2013‑01]
.
SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes [2013‑01]
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SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes [2013‑01]
. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013‑01]
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MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes [2013‑01]
. .
Resonance [2013‑01]
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. .
Probes, their manufacture, or their related instrumentation, e.g. holders [2013‑01]
. . .
Probes with magnetic coating [2013‑01]
.
SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes [2013‑01]
.
SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes [2013‑01]
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General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00 [2013‑01]
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.
Probe holders [2013‑01]
. .
with compensation for temperature or vibration induced errors [2013‑01]
.
Probe tip arrays [2013‑01]
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Probe characteristics [2013‑01]
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. .
Shape or taper [2013‑01]
. . .
Nano-tube tips [2013‑01]
. .
Particular materials [2013‑01]
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Probe manufacture [2013‑01]
. .
Functionalization [2013‑01]
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nano-structures B82B 3/00; recording or reproducing information using near-field interaction G11B 9/12, G11B 11/24, G11B 13/08) [2013‑01]
G01Q 90/00
Scanning-probe techniques or apparatus not otherwise provided for [2013‑01]
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Last Modified: 10/10/2013