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Outline
Indent Level
Color Curly Brackets (indicating CPC extensions to IPC) References Date Revised

CPC
COOPERATIVE PATENT CLASSIFICATION
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SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
NOTE
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In this subclass, the first place priority rule is applied, i.e. at each hierarchical level, classification is made in the first appropriate place.

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Scanning or positioning arrangements, i.e. arrangements for actively controlling the movement or position of the probe
.
Coarse scanning or positioning
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.
Fine scanning or positioning
. .
{
Self-actuating probes, i.e. wherein the actuating means for driving are part of the probe itself, e.g. piezoelectric means on a cantilever probe
}
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. .
Circuits or algorithms therefor
. . .
{
Feedback mechanisms, i.e. wherein the signal for driving the probe is modified by a signal coming from the probe itself
}
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Monitoring the movement or position of the probe
.
by optical means
.
Self-detecting probes, i.e. wherein the probe itself generates a signal representative of its position, e.g. piezo-electric gauge
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Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
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.
Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
. .
{
Optical microscopes coupled with SPM
}
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.
Display or data processing devices
. .
for error compensation
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.
Means for establishing or regulating a desired environmental condition within a sample chamber
. .
Thermal environment
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. .
Fluid environment
. . .
Liquid environment
. .
Vacuum environment
.
Means for protecting or isolating the interior of a sample chamber from external environmental conditions or influences, e.g. vibrations or electromagnetic fields
.
Sample handling device or method
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Calibration, e.g. of probes
.
Calibration standards and methods of fabrication thereof
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Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
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Multiple-type SPM, i.e. involving more than one SPM technique
. .
STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
. .
SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
. .
MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
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.
STM [Scanning Tunnelling Microscopy] or apparatus therefor, e.g. STM probes
. .
STS [Scanning Tunnelling Spectroscopy]
. .
STP [Scanning Tunnelling Potentiometry]
. .
Probes, their manufacture, or their related instrumentation, e.g. holders
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.
SNOM [Scanning Near-Field Optical Microscopy] or apparatus therefor, e.g. SNOM probes
. .
Fluorescence
. .
Probes, their manufacture, or their related instrumentation, e.g. holders
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.
AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
. .
Friction force microscopy
. .
Adhesion force microscopy
. .
Scanning potential microscopy
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. .
AC mode
. . .
Tapping mode
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. .
DC mode
. . .
{
Contact-mode AFM
}
. . .
{
Nanoindenters, i.e. wherein the indenting force is measured
}
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. .
Probes, their manufacture, or their related instrumentation, e.g. holders
. . .
Conductive probes
. . .
Functionalization
.
SICM [Scanning Ion-Conductance Microscopy] or apparatus therefor, e.g. SICM probes
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SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes
. .
Probes, their manufacture, or their related instrumentation, e.g. holders
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.
MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
. .
Resonance
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. .
Probes, their manufacture, or their related instrumentation, e.g. holders
. . .
Probes with magnetic coating
.
SThM [Scanning Thermal Microscopy] or apparatus therefor, e.g. SThM probes
.
SECM [Scanning Electro-Chemical Microscopy] or apparatus therefor, e.g. SECM probes
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General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q 60/00
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Probe holders
. .
with compensation for temperature or vibration induced errors
.
Probe tip arrays
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Probe characteristics
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. .
Shape or taper
. . .
Nano-tube tips
. .
Particular materials
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.
Probe manufacture
. .
Functionalization
Applications, other than SPM, of scanning-probe techniques (manufacture or treatment of nano-structures B82B 3/00; recording or reproducing information using near-field interaction G11B 9/12, G11B 11/24, G11B 13/08)
G01Q 90/00
Scanning-probe techniques or apparatus not otherwise provided for
This page is owned by Office of Patent Classification.
Last Modified: 10/10/2013