U.S. PATENT AND TRADEMARK OFFICE
Information Products Division |
U.S. Patent Classification System - Classification Definitions
as of June 30, 2000
Patents classified in a subclass may be accessed by either clicking on
the subclass number
preceding each subclass definition or on the
"
" icon, below.
( please note that patents for some subclasses may not be available )
For classification search strategies, please refer to the
Classification Index
Explanation of Data web page.
(definitions have been obtained from the
Patents ASSIST CD-ROM which
is produced by the U.S. Patent and Trademark Office
Electronic Products Branch)
Class 356
OPTICS: MEASURING AND TESTING
Class Definition:
A. This class includes methods and apparatus (1) for
analyzing light to measure or test its characteristics, such
as intensity, color and polarization; (2) for determining
the optical or nonoptical properties of materials or articles
by noting, as by inspection, measurement, or test the effect
produced by the materials or articles on light associated
therewith; and (3) for measuring the dimensions of structures
or the spatial relationships such as distances or angle
bearings of spaced points by comparison of the respective
properties (usually direction or spatial position) of the
light from these points or by comparison of the properties of
these lights with some scale or standard. The light analyzing
includes or is for spectroscopy, interference, polarization,
beam direction or pattern, focal position of a light source,
shade or color, and photometers. The material or article
properties determined are or involve crystal or gem
examination, material strain analysis, blood analysis,
optical pyrometers, egg candling, cutting blade sharpness,
oil testing, document verification, flatness, lens or
reflector testing, refraction testing, monitoring moving webs
or fabrics, light transmission or absorption, light
reflection, inspection for flaws or imperfections in
materials, and thread counting.
The dimensioning and spatial relationship determination
includes triangulation by a light beam, contour plotting,
range or height finders, motion stopping, velocity or
velocity/height measuring, sighting where the optical element
or reticle moves with the sighted object, particle size
determination, particle light scattering, electrophoresis,
angle measuring or axial alignment, mensuration or
configuration comparison, alignment in a lateral direction,
and fiducial instruments.
B. Included also are apparatus and methods to facilitate the
viewing of structure as for flaws and imperfections. The
structure is usually optically significant such as
transparent sheets or bottles or semi-transparent cloth; or
the structure is inaccessible as a bore requiring a bore
scope. Included also are methods and structure for preparing
the sample for an optical test, and optical test standards.
C. Included also are apparatus and methods involving a
plurality of measurements or tests each within the scope of
this class; and also included are a measurement or test
within the scope of this class together with a measurement or
test or other art structure provided, per se, elsewhere, but
where no provision for the combination is made elsewhere.
LINES WITH OTHER CLASSES AND WITHIN THIS CLASS
A. OPTICAL MEASURING OR TESTING CLASSIFIED ELSEWHERE
Class 33 provides for optical measurements of the light ray
type within the scope of this class. See "Geometrical
Instruments in This Class and in Class 33," section C, below,
for the subject matter placed in Class 33 and Class 356.
Class 73 includes optical measuring and testing within the
scope of its subclasses. See "Measuring and Testing in This
Class and Class 73," section D, below, for the line between
Class 73 and Class 356. Signal and indicating apparatus
which may involve optics are classified elsewhere. See, for
example, temperature, radiant energy, smoke, or gas
indicators. Surgical diagnostic instruments which may involve
optical measuring or testing on or in the body are elsewhere.
Television systems for measuring and testing which may
include optical elements are classified elsewhere.
Photocells and associated circuitry together with optical
structure which may involve measuring or testing are
classified elsewhere. However, this Class 356 includes
optical testing with a photoelectric light detector and
usually claiming either an indicator or structure to support
or contain the specimen or sample under test. Lamp and
discharge device testing is classified elsewhere. Eye
examining and testing instruments which may include optical
measuring or testing are elsewhere. (See Subclass References
to the Current Class and References to Other Classes, below,
for subclass references of subject matter above.)
B. TESTING AND MEASURING SUBCOMBINATIONS PROVIDED FOR
ELSEWHERE
Optical elements which may be used in measuring and testing
apparatus are classified elsewhere as are the conventional
optical elements such as lenses, prisms, and mirrors.
Subclasses relating to scale or indicia reading should be
particularly noted. Photocell circuits and apparatus are
elsewhere. Photo-sensitive discharge devices are classified
elsewhere. Mechanical scales and gauges which may be part of
optical measuring systems are elsewhere. Mechanical
indicators which may be part of optical measuring systems
classified elsewhere. Electrical indicating and measuring
devices which may be part of optical measuring systems are
classified elsewhere. (See References to Other Classes,
below, for class/subclass references to these art areas.)
(1) Note. Telemetric signaling means useful in
transmitting a measured quantity, not limited to any
particular measuring instrument provided for in other
classes, is classified elsewhere, while Class 356 takes such
telemetric signaling means in combination with a particular
measuring means of the type provided for in Class 356. (See
References to Other Classes, below.)
C. GEOMETRICAL INSTRUMENTS IN THIS CLASS AND IN CLASS 33
This Class (356) provides for measuring devices which are
used for determining spatial relationships, and which involve
the establishment of an optical axis between the observer's
station and a remote point and which include significant
optical structure. This includes certain types of
range-finders, angle or azimuth measuring instruments and
velocity measuring devices as qualified below. In this
subject matter the recitation of specific optical details
such as lens, prism, or mirror details is sufficient for
classification in this Class 356. Exceptions which remain in
Class 33 are bomb sights with specific optical line sighting
instruments with a telescope or microscope recited even in
some detail, and as a viewing aid to but not a part of the
sighting instrument. Also where a plurality of optical
functions are recited as, for example, plural reflections of
a line of sight, classification is in this Class 356. Where
optic is only recited broadly as, for example, "an optical
axis", a "telescope", or a "deflection of the line of sight",
the subject matter is generally classified in Class 33, as
opposed to Class 356.
Also included in this Class 356 are instruments for visual
sighting which in addition to having a field of view, perform
an aiming or alignment function or establish a line of sight
by means of an artificial reference and which include
significant optical structure.
The geometrical instruments of this Class 356 usually either
involve the determination of the direction of a point remote
from an observer with respect to some reference direction
where the two directions may be viewed and compared
simultaneously; or the determination of the relative
direction of two points remote from an observer where the two
directions may be viewed and compared simultaneously.
Optical structure is usually provided to facilitate this
simultaneous viewing. The subject matter of Class 33 relates
more to the direction determination by aiming an instrument
on a point and later noting the direction of the aimed
instrument with respect to some reference such as a level,
compass, or other point. A mere single deflection of a line
of sight as by a mirror or lens to facilitate the viewing is
not precluded from Class 33. In the mensuration or figure
comparison, the patents in this Class 356 include structure
to facilitate the viewing (usually simultaneously) of the
specimens, or configurations to be compared with other
specimens or configurations or with scales, masters, or
patterns.
A single sight line optical instrument such as a transit with
structure for indicating the direction is classified in Class
33. However where such an instrument includes a sighting mark
or scale at an optically critical position such as in the
focal plane classification is in Class 356.
Comparison instruments which merge the rays from diverse
directions for common viewing as in a split image range
finder are classified in Class 356. However plural sighting
instruments which merely aim on angularly separated points
(even simultaneously) with mechanical reading of the
directions are classified in Class 33. Space measuring
instruments whose operation is essentially optical such as
optical interferometers are classified in Class 356 as
opposed to Class 33. Reticles and cross hairs generally are
classified in Class 33. However, optical reticles which
reflect or refract light are classified in Class 356.
D. MEASURING AND TESTING IN THIS CLASS AND CLASS 73
This Class (356) provides for optical measuring and testing
as defined above. Class 73 provides for measuring and
testing which may include optical measuring and testing as
defined, combined with some nonoptical limitations beyond the
scope of this Class 356 and specifically provided for in
Class 73. Specific provision exists in Class 73 when the
measurement or test is of the type provided for by the
subclasses of Class 73 definitions. For example, Class 73
provides for gas chromatography involving color determination
of the Class 356 type together with some manipulation of the
gas beyond the scope of Class 356. Again Class 73 provides
for engine testing involving optical tests of the Class 356
type together with some mechanical manipulation of the parts
beyond the scope of Class 356. In general Class 73 provides
for measuring and testing of the type indicated by its
subclass titles and definitions which may include optical
steps together with other mechanical measuring and testing
steps beyond the scope of Class 356. There are some patents
presently in Class 73 which relate to measuring and testing
as there provided, but which claim only optical subject
matter within the scope of Class 356. Combinations of optical
measuring or testing with other structure or methods is
classified in Class 356 if no provision for such combinations
exists elsewhere. (See References to Other Classes, below.)
An exception to the above involves cutting blade sharpness
testing where Class 356 provides for the optical type with
the remainder in Class 73. Another exception involves stress
analysis where Class 356 provides for the optical type absent
intentional loading of the specimen. The remainder is
classified in Class 73, particularly for optical stress
analysis with intentional loading of the specimen. (See
Subclass References to the Current Class and References to
Other Classes, below.)
E. NONVISIBLE RADIATION
This class is restricted to measuring and testing involving
visible light. However where the measuring or testing
involves infrared or ultraviolet radiation with apparatus
optical in nature and nothing peculiar to such infra red and
ultra violet radiation, classification is in this class. For
example, optical equipment where the radiation was claimed as
ultraviolet or infra red would be classified in this class,
especially methods and apparatus for the inspection of solid
or liquids by charged particles and invisible radiation
responsive electric signalling methods and apparatus. See
also THERMOCOUPLES AND BOLOMETERS, below. (See Subclass
References to the Current Class, below.)
F. FLUORESCENCE AND PHOSPHORESCENCE TESTING
The examination of fluorescent and phosphorescent material or
organisms to determine their fluorescent or phosphorescent
properties or the examination of invisible energy including
ultraviolet light by subjecting fluorescent or phosphorescent
material to invisible radiation is classified elsewhere even
though the fluorescent or phosphorescent radiation is in the
visible light range and the intensity and the frequency of
the fluorescent or phosphorescent light is examined. Methods
of determining oil presence, contamination or concentration,
methods and apparatus using luminophor test material or a
luminophor detector in combination with an electric
signalling device responsive to the light emitted by the
luminophor, methods and apparatus to irradiate a luminophor
and luminscent devices, per se, are classified elsewhere.
(See References to Other Classes, below.)
Fluorescent or phosphorescent apparatus used as a visible
light standard and claimed as part of a visible light testing
apparatus as of a comparator type and which is basic subject
matter of Class 356 is classified in Class 356. The
examination of the visible light, per se, emitted by
fluorescent or phosphorescent materials would be classified
in Class 356 when the fluorescent or phosphorescent materials
or source producing the visible light is not included in the
claims.
G. LASERS AND RESONANCE RADIATION
The testing with optical apparatus of a laser beam for the
intensity or frequency of the visible light, per se, emitted
by the laser is in Class 356 (see Subclass References to the
Current Class, below). However, lasers and similar devices
when they function as an amplifier of light in the visible
range and laser modulator, per se, are classified elsewhere.
For optical elements which control light intensity or
direction on a molecular level, see classification elsewhere;
for modulation involving polarized light and for light
control by altering an optical medium or surface see
elsewhere. Coherent light generators, per se, are classified
elsewhere.
H. THERMOCOUPLES AND BOLOMETERS
Where the intensity or the frequency of invisible radiation
is determined by means of a thermal detector, classification
is elsewhere. Where the intensity or the frequency of
visible light radiation is determined by means of a thermal
detector, classification is in Class 356. Where the total
energy or power in a beam of radiation is measured by a
thermal detector classification is elsewhere; and where
thermally emitted radiation is measured to determine the
temperature of the emitting source, classification is also
elsewhere, except where the radiation is limited to light,
where the classification is in Class 356. (See Subclass
References to the Current Class and References to Other
Classes, below.)
I. BURNING
Although the burning of a combustible material is a chemical
reaction, the combination of the burning of combustible
material for visible light examination purposes with visible
light analyzing structures of this class is in this Class
356. See References to Other Classes, below for "Combustion"
and for all combustion reactions not provided for elsewhere.
See also Subclass References to the Current Class, below.
(See References to Other Classes, below.)
J. COUNTING
Claims to the counting of discrete particles such as blood
particles, bacteria colonies, or dust particles, one at a
time by numerical counting apparatus which registers the
counts corresponding to the respective particles will be
found elsewhere. However, the visual counting with a scale
or spacer to aid the eye is classified in this Class (356).
Claims to the sizing and counting of particles such as blood
particles, bacteria colonies, or dust particles, one at a
time by numerical counting apparatus will be found elsewhere.
The counting of undulations by means of visible light or
indeterminate length material such as a web of fabric or
threads, per se, for testing the weave of the web for
evenness, or the thread for unevenness, or for flaws, or for
optical properties or physical dimensions where the
measurement is affected only by the variations of the light
caused by the web or thread will be in Class 356 rather than
elsewhere. The counting of particles with visible light by
statistical analysis procedures instead of a one by one
numerical particle count as elsewhere will be in Class 356.
The sizing and counting of particles with visible light by
statistical analysis procedures instead of a one by one
numerical particle count as elsewhere will be in Class 356.
The counting or the sizing and counting of particles with
visible light by statistical methods in Class 356 involves
for example, polarized light, light scattering, color
testing, and reflective diffusion of light. Where a
microscope is utilized to count particles, one by one, such
as blood particles or bacteria colonies, see elsewhere.
Where an optical element such as a lens for magnification is
used in combination with a support for counting bacteria
colonies, or particles such as dust see classification
elsewhere for one by one counting. Where no optical element
is utilized and only a support is used see this Class (356).
Where a microscope having a graticule rather than a cross
hair or a reticle is used to count particles one by one see
this class (356). See this class (356) for supports for
bacteria counters where only a light and a support for the
one by one count is involved. (See Subclass References to
the Current Class and References to Other Classes, below.)
K. READING AND RECORDING
The combination of an optical test of this class with a
qualitative or quantitative marker or recorder is in this
class. Class 356 provides for the reading visually of the
information or data cards where not elsewhere provided.
Pattern or character recognition of a document or a record is
classified elsewhere. Where the document analysis or
verification is limited to the intrinsic properties of the
record, classification is in Class 356. Systems controlled
by a record and code record sensors, respectfully, are
classified elsewhere. Apparatus to check hole type cards for
errors in the punching or in the sorting of cards where the
error check equipment is not part of a business machine is
classified elsewhere. (See Subclass References to the
Current Class and References to Other Classes, below.)
SEE OR SEARCH THIS CLASS, SUBCLASS:
3 28, 139.01+, 141.1+, 152.1+, 218, and 442 for optical
testing with a photoelectric light detector and usually
claiming either an indicator or structure to support or
contain the specimen or sample under test.
32 for stress analysis where Class 356 provides for the
optical type absent intentional loading of the specimen.
43 where radiation is limited to light, classification is
here; where thermally emitted radiation is measured to
determine the temperature of the emitting source,
classification is elsewhere.
51 where measuring or testing involves infrared or
ultraviolet radiation with apparatus optical in nature and
nothing peculiar to infra red and ultra violet radiation.
69 for cutting blade sharpness testing where Class 356
provides for the optical type.
71 where document analysis or verification is limited to the
intrinsic properties of the record.
213 and 402+ for testing with optical apparatus of a laser
beam for the intensity or frequency of the visible light, per
se, emitted by the laser.
244 for supports for bacteria counters where only a light
and a support for the one by one count is involved.
306 for methods and apparatus for the inspection of solid or
liquids by charged particles.
315 see Search Class and the notes in reference to a flame
producer whose flame heats or burns a sample to cause the
emission of radiation to be analyzed. (See Lines With Other
Classes, "Burning", above.)
335 for the sizing and counting of particles with visible
light by statistical analysis procedures instead of a one by
one numerical particle count.
336 for invisible radiation responsive electric signalling
methods and apparatus.
438 and 441+ for the counting of particles with visible
light by statistical analysis procedures.
REFERENCES TO OTHER CLASSES
SEE OR SEARCH CLASS:
15, Brushing, Scrubbing, and General Cleaning, subclass 3.1
for machines to clean eggs, or machines to clean and assort
or screen eggs.
26, Textiles: Cloth Finishing, subclass 70 for devices
facilitating the inspection of cloth.
33, Geometrical Instruments, subclass 1 for planimeter type
calculators such as moment of inertia of areas, subclasses
18.1+, for scribers, subclass 121, for area integrators,
subclass 125, for distance measuring, subclasses 501+, for
gauges of the fixed or adjustable type, and subclass 227, for
means and methods utilizing nonreflected light rays and
direct sighting for determining the characteristics and
mutual relationships of points, lines, angles, etc.
33, Geometrical Instruments, provides for mechanical scales
and gauges which may be part of optical measuring systems.
(See Lines With Other Classes, B, "Testing and Measuring
Subcombinations Provided for Elsewhere.")
33, Geometrical Instruments, provides in subclass 227 for
optical measurements of the light ray type within the scope
of this class. (See Lines With Other Classes, A, "Optical
Measuring or Testing Classified Elsewhere.")
40, Card, Picture, or Sign Exhibiting, 446 for changeable
exhibitors, and subclasses 361+ for transparent film
viewers.
53, Package Making, subclass 52 for automatic or triggered
control of a package making machine in response to a test
which may be optical, and subclasses 507+ for visual
inspection means combined with package making machines.
65, Glass Manufacturing, 377 for processes of glass making
with a step of visually, chemically or physically determining
a chemical or physical property, subclass 38 for the process
of forming a lens with a fusion bonding step, and subclass
158 for inspection means which may be optical.
72, Metal Deforming, subclass 37 for metal deforming with
use of optical or transparent (e.g., viewing) means.
73, Measuring and Testing, subclass 23.1 for the examination
of the effluent of a mixture of gases which has contacted a
solvent or sorbent which separates the mixture into
fractional components and for gas chromatography involving
color determination of the Class 356 type together with some
manipulation of the gas beyond the scope of Class 356,
subclass 28 for analysis of solid matter in gases, subclass
29 for analysis of moisture content or vapor pressure by
physical means, subclass 30 for density tests by physical
means, subclass 32 for specific gravity or density testing of
liquids or solids, subclass 37 for fluid pressure tests,
subclasses 53.01+ for the testing of liquids or a liquid
suspension of solids including sediment or foreign content,
subclass 73 for determining moisture content or absorption
characteristics of material, subclass 78 for hardness
testing, subclasses 760+ for stress or strain testing of
material generally, particularly subclass 800 for optical
stress analysis with intentional loading of the specimen,
subclass 104 for surface and cutting edge testing generally,
subclass 116 for motor and engine testing including engine
parts, subclass 156 for statistical record verifying,
subclass 157 for record strip sprocket hole testing,
subclasses 861+ for volume or rate of flow meters, subclass
290 for liquid level or depth gauges, subclass 488 for speed
or acceleration testing generally, subclasses 700+ for fluid
pressures gauges, and subclass 421 for samplers and tollers.
(See Lines With Other Classes, sections A and D, above.)
73, Measuring and Testing, subclass 156 for apparatus to
check hole type cards for errors in the punching or in the
sorting of cards where the error check equipment is not part
of a business machine. (See Lines With Other Classes, K,
"Reading and Recording.")
74, Machine Element or Mechanism, subclass 20 for mechanical
movement apparatus, subclass 640 for gearing arrangements,
subclass 469 for control lever and linkage systems, and
subclass 567 for machine elements, per se.
91, Motors: Expansible Chamber Type, subclass 1 for
signals, indicators or inspection means including visual
inspection devices whereby the motor operation or the
condition of some part may be ascertained.
92, Expansible Chamber Devices, subclass 5 for signals,
indicators, or inspection means whereby the expansible
chamber operation or the condition of some part of the device
may be ascertained.
95, Gas Separation: Processes, 1 for processes of gas
separation with control responsive to sensed condition which
may involve an optical test and subclasses 82+ for processes
of gas separation using chromatography.
96, Gas Separation: Apparatus, 101 for chromatography type
apparatus for gas separation, subclass 413 for gas separation
apparatus having sampling means, and subclasses 417+ for gas
separation apparatus having signals, indicators, measuring,
or testing means.
100, Presses, subclass 99 for alarm, signal, indicator, or
test means which may be of an optical character.
101, Printing, subclass 2 for printing devices combined with
sorting devices which may utilize an optical test.
116, Signals and Indicators, for mechanical signals and
indicators, particularly 200 for mechanical indicators which
may be part of optical measuring systems and subclass 137 for
compressional wave generators. (See Lines With Other
Classes, B, "Testing and Measuring Subcombinations Provided
for Elsewhere.")
116, Signals and Indicators, for signal and indicating
apparatus which may involve optics. (See Lines With Other
Classes, A, "Optical Measuring or Testing Classified
Elsewhere.")
118, Coating Apparatus, 663 for automatic control of coating
apparatus which may include an optical test, subclasses 712+
for testing, inspecting or measuring which may involve visual
inspection or an optical test device, and subclasses 712+ for
signals and indicators responsive to a condition.
119, Animal Husbandry, subclass 6.8 for egg candling methods
and apparatus combined with the treating of fertilized eggs,
and subclass 311 for incubators which include candling
operations.
125, Stone Working, subclass 30 for working precious
stones.
131, Tobacco, 280 for cigar and cigarette making machinery
which include light testing devices to control the operation
of the machinery.
134, Cleaning and Liquid Contact With Solids, subclass 113
for such apparatus with an alarm, signal, indicating,
inspecting, illuminating, or display means.
136, Batteries: Thermoelectric and Photoelectric, 243 for
photoelectric primary batteries.
137, Fluid Handling, subclass 2 for processes of flow
control by a condition or characteristic of a fluid which may
be of an optical nature, and subclass 93 for
self-proportioning or correlating systems responsive to an
optical property, and subclass 551 for indicators, registers,
recorders, alarms, or inspection means including visual
inspection means.
141, Fluent Material Handling, With Receiver or Receiver
Coacting Means, subclass 83 for testing or weighing receiver
content, and subclass 94 for signals, indicators, recorders,
inspection means, and exhibitors permitting inspection of the
material handling means.
156, Adhesive Bonding and Miscellaneous Chemical Manufacture,
subclass 64 for methods with measuring, testing or
inspecting, subclass 378 for apparatus with testing,
measuring alone or in combination with indicating means
involving the properties, dimensions, or a condition of the
work or apparatus, and subclass 379 for inspecting with or
without illuminating means for observing normally nonvisible
machine or work parts.
162, Paper Making and Fiber Liberation, subclass 198 for
processes involving measuring, inspecting alone or in
combination with testing or visual inspection of the product,
and subclass 263 for apparatus to detect some condition of
the machine or the material including inspection of the
material undergoing treatment for some chemical or physical
characteristic.
165, Heat Exchange, 11.1 for exchange apparatus having an
alarm, indicator, signal, register, recorder, test or
inspection means.
166, Wells, 250.01 for processes including indicating,
testing, measuring, locating, or recording a well condition,
and subclass 64 for well apparatus including time, distance,
temperature, or counting apparatus.
171, Unearthing Plants or Buried Objects, subclass 15 for
apparatus including separation by size, subclass 18 for
apparatus for separating buried objects based upon physical
differences, and subclass 20 including visual inspection of
the buried object.
173, Tool Driving or Impacting, subclass 20 for apparatus
including means to indicate or signal a condition including
position or movement of the driving or impacting tool.
174, Electricity: Conductors and Insulators, subclass 11
for electrical apparatus including a fluid or vacuum with
structure to signal or indicate some condition of the fluid
or vacuum.
175, Boring or Penetrating the Earth, subclass 40 for
apparatus with signalling, indicating, testing or measuring
including invisible radiation examination in subclass 41 and
visual inspection means in subclass 49.
177, Weighing Scales, appropriate subclasses for balances,
per se, and automatic weighing devices, particularly subclass
45 for apparatus including alarms or signals in addition to
the weight indicator, and subclass 50 for apparatus for
performing an additional test including size gauging not
provided for elsewhere.
193, Conveyors, Chutes, Skids, Guides, and Ways, appropriate
subclasses for nonpowered type material transporting
apparatus including subclass 2 for chutes and subclass 35
for rollerways.
194, Check-Actuated Control Mechanisms, subclass 207
including apparatus for the testing of paper currency for
genuineness and other anomalous checks in automatic
dispensing machines and including apparatus in subclasses 224
and 304+ for coin in circuit operated switches, subclasses
219+, 230+, and 239+ for coin operated switches, and
subclasses 302+ for fraud preventive devices.
198, Conveyors: Power-Driven, subclass 502 for a conveyor
having signalling or indicating means or means for measuring
the conveyed load, subclasses 504+ for a conveyor having load
weighing means, and appropriate subclasses for different
types of conveyors or systems of conveyors having operation
control means using a photo-optics system.
200, Electricity: Circuit Makers and Breakers, subclass
61.02 for light actuated switches.
204, Chemistry: Electrical and Wave Energy, 450 and 600+
for processes and apparatus, respectively, dealing with
electrophoresis and electro-osmosis; subclasses 400+ for
electrolytic analysis and testing apparatus; and subclasses
242+ for electrolytic cells, in general.
209, Classifying, Separating, and Assorting Solids,
particularly 510 for the combination of a candling operation
with a weighing operation of the sorting type; subclasses
556+ for diverse condition responsive testing means;
subclasses 525 and 586 for light-type gauging apparatus;
subclasses 580+ for apparatus for sorting on the basis of an
optical property of a material including the color and
polarization effects of the material; subclasses 512+, 592+,
and 645 for automatic weighers; and subclasses 702+ and 939
for manual candling and assorting apparatus.
210, Liquid Purification or Separation, subclass 635 and
656+ for processes involving chromatography, and subclass 85
for apparatus including alarms, indicators, registers,
recorders, signals or inspection means including sight
glasses.
211, Supports: Racks, appropriate subclasses for supports
for plural articles particularly subclass 10 for racks to
facilitate the sorting of articles by hand, and subclass 14
for racks designed to support eggs.
221, Article Dispensing, subclass 2 for apparatus including
recorders, registers, indicators, signals or exhibitors for
noting a condition or position of a dispenser part, and
subclass 155 for apparatus with transparent inspecting or
viewing means.
225, Severing by Tearing or Breaking, subclass 41 for manual
severing devices which have a housing for the work supply
with an inspection window or transparent panel.
226, Advancing Material of Indeterminate Length, subclass 100
for apparatus with an alarm, signal, or indicator to sense a
condition in the movement of indefinite length material.
228, Metal Fusion Bonding, subclass 56.5 for apparatus to
note the physical state or location of the work, flux,
filler, or product.
235, Registers, 419 for record controlled electromechanical
calculators, subclass 61 for mechanical digital and analogue
calculators.
235, Registers, 375 and 435+ for systems controlled by a
record and code record sensors, respectfully. (See Lines
With Other Classes, K, "Reading and Recording.")
239, Fluid Sprinkling, Spraying, and Diffusing, subclass 71
for apparatus having means to indicate a condition, indicate
the extent of motion or position of a part, or perform a
quantity measurement or an inspection to determine flow
conditions.
242, Winding, Tensioning, or Guiding, subclass 357, 472.9+,
479.9+, 484.8, 484.9, 534+, 563+ for detector or stop for
controlling various winding or unwinding operations, and
subclass 912 for an alarm or indicator.
246, Railway Switches and Signals, subclass 20 for block
signal systems, subclass 111 for grade crossing track
protection, subclass 120 for the detection of defects in the
roadway, subclass 122 for train position indicating
apparatus, subclass 125 for electric automatic highway signal
apparatus, and subclass 169 for train defect indicating
apparatus including infrared hot box detectors.
248, Supports, appropriate subclasses for single article
supports in general.
249, Static Molds, subclass 53 for apparatus including
static gauges, levels, plumbs or scale markings on molding
apparatus.
250, Radiant Energy, subclass 200 for photoelectric circuits
to control the illumination falling upon the photocell or to
follow a pattern or to follow a point, and for apparatus,
subclass 206 for photoelectric controlled circuits,
particularly subclass 216 for optical or prephotocell systems
which includes in subclass 221 for system controlled by
articles, persons or animals, in subclass 225 polarizing
optical system, in subclass 226 optical systems including
visible light filters, prisms, and diffraction gratings and
in subclass 229 the control of light by optical shutters and
attenuators, and subclasses 250 to 422 for methods and
apparatus dealing with the production of invisible radiant
energy, its detection or utilization. (See Lines With Other
Classes, B, "Testing and Measuring Subcombinations Provided
for Elsewhere.")
250, Radiant Energy, subclass 200 provides for photocells
and associated circuitry together with optical structure
which may involve measuring or testing. (See Lines With
Other Classes, A, "Optical Measuring or Testing Classified
Elsewhere.")
250, Radiant Energy, subclass 301 for methods of determining
oil presence, contamination or concentration, subclass 361
for methods and apparatus using luminophor test material or a
luminophor detector in combination with an electric
signalling device responsive to the light emitted by the
luminophor, subclasses 458.1+ for methods and apparatus to
irradiate a luminophor and subclasses 453.11+ for luminscent
devices, per se. The examination of fluorescent and
phosphorescent material or organisms to determine their
fluorescent or phosphorescent properties or the examination
of invisible energy including ultraviolet light by subjecting
fluorescent or phosphorescent material to invisible radiation
is in Class 250 even though the fluorescent or phosphorescent
radiation is in the visible light range and the intensity and
the frequency of the fluorescent or phosphorescent light is
examined. (See Lines With Other Classes, F, "Fluorescence
And Phosphorescence Testing.")
250, Radiant Energy, where the intensity or the frequency of
invisible radiation is determined by means of a thermal
detector. (See Lines With Other Clases, H, "Thermocouples
And Bolometers.")
252, Compositions, subclass 62.3 for barrier layer device
compositions, subclass 501.1 for light sensitive emissive or
conductive compositions, subclass 299 for liquid crystal
containing optical filter compositions and subclasses 582+
for other optical filter compositions, and subclasses 301.16
through 301.6 for fluorescent or phosphorescent
compositions.
264, Plastic and Nonmetallic Article Shaping or Treating:
Processes, 1.1 for methods for forming articles producing
optical effects including light polarization, and subclass 40
for methods with measuring, testing, or inspecting some
variable condition in the shaped article, the mold, the
molded material or shaping surface.
269, Work Holders, subclass 8 for magnetic work holders,
subclass 11 for holders provided with illuminating means, and
subclass 19 for holders provided with gage means such as
vertical or horizontal position indicators for the work or
the holder.
313, Electric Lamp and Discharge Devices, subclass 94 for
photo-sensitive discharge devices. (See Lines With Other
Clases, B, "Testing and Measuring Subcombinations Provided
for Elsewhere.")
318, Electricity: Motive Power Systems, subclass 18 for
follow-up systems of motor control, particularly subclass 28
for self-balancing network controls, subclass 480 for
apparatus which includes the radiant energy control of a
motor, and subclass 490 for motor systems with signals,
meters, recorders and testing devices.
324, Electricity: Measuring and Testing, appropriate
subclasses for the measurement or the testing of electric
properties, particularly 300 for measurements or tests
relating to nuclear or electronic induction, subclasses 403+
for the testing of lamps, vacuum tubes, and discharge
devices, subclass 200 for tests which rely on magnetic
phenomenon, subclasses 600+ for the measurement of impedance,
admittance, inductance, resistance, conductance, and
susceptance, subclasses 76.11+ for measuring or testing
electricity, per se, including subclass 96 for tests
utilizing optical principles to determine electrical
quantities, and subclass 121 for cathode-ray type indicators.
(See Lines With Other Classes, A, "Optical Measuring or
Testing Classified Elsewhere.")
324, Electricity: Measuring and Testing, for electrical
indicating and measuring devices which may be part of optical
measuring systems. (See Lines With Other Classes, B,
"Testing and Measuring Subcombinations Provided for
Elsewhere.")
329, Demodulators, appropriate subclasses for a demodulator
of signals of less than infrared frequency which may contain
an optical device (e.g., an optical isolator).
330, Amplifiers, subclass 4.3 for lasers and similar devices
when they function as an amplifier of light in the visible
range and laser modulator, per se. (See Lines With Other
Clases, G, "Lasers snd Resonance Radiation.")
338, Electrical Resistors, subclass 15 for photoconductive
resistors responsive to infrared, ultraviolet or visible
light.
340, Communications: Electrical, subclass 146.2 for digital
comparator systems, subclasses 825.30+ for intelligence
comparison of information, subclasses 870.01+ for telemetric
signaling means useful in transmitting a measured quantity,
not limited to any particular measuring instrument provided
for in other classes, and also 870.01+ for quantitative
telemetering systems including subclasses 870.28+ whereby the
telemetering is transmitted by means of radiant energy,
subclasses 870.16+ wherein the telemetering system is
responsive to a condition, subclasses 500+ for condition
responsive indicating systems, particularly subclasses 577+
for a flame indicator; subclasses 603+ for a fluent material
indicator; subclass 670 for a velocity indicator; subclass
675 for a web, film, or strip indicator; subclass 678 for a
geometrical gauge indicator, and subclass 265 for geometrical
gage type responsive systems.. (See Lines With Other
Classes, B, "Testing and Measuring Subcombinations Provided
for Elsewhere," (1) Note.)
340, Communications: Electrical, for electrical indicating
and measuring devices which may be part of optical measuring
systems. (See Lines With Other Classes, B, "Testing and
Measuring Subcombinations Provided for Elsewhere.")
340, Communications: Electrical, for signal and indicating
apparatus which may involve optics. See, for example, 584,
600, 630, and 632, for temperature, radiant energy, smoke, or
gas indicators, respectively. (see Lines With Other Classes,
A, "Optical Measuring or Testing Classified Elsewhere.")
342, Communications: Directive Radio Wave, Systems and
(e.g., Radar, Radio Navigation), subclasses 1-205 for radar
systems involving electromagnetic radiation in the radio wave
frequency.
346, Recorders, for the generic class of recording the
movements of machines or making a record of any phenomenon,
particularly subclass 33 for recorders combined with
external recorder operating means, subclasses 150.1+ for
electric recording including spark and electrochemical,
subclasses 107.1+ for light or beam recording.
347, Incremental Printing of Symbolic Information, 112 for
electrostatic marking, particularly subclasses 129+ for photo
scanning; subclasses 224+ for light or beam marking processes
or apparatus.
348, Television, 135 for television systems utilized to
effect a measurement and subclasses 180+ for measuring and
testing devices utilized in television systems which may
include optical elements.
348, Television, 135 and 180+ for television systems for
measuring and testing which may include optical elements.
(See Lines With Other Classes, A, "Optical Measuring or
Testing Classified Elsewhere.")
351, Optics: Eye Examining, Vision Testing and Correcting,
subclass 204 for interpupillary distance measuring and lens
positioning examination instruments, and subclasses 239+ for
test charts and targets for the subjective testing of vision
for astigmatism and chromaticity.
351, Optics: Eye Examining, Vision Testing and Correcting,
200 for eye examining and testing instruments which may
include optical measuring or testing. (See Lines With Other
Classes, A, "Optical Measuring or Testing Classified
Elsewhere.")
352, Optics: Motion Pictures, appropriate subclasses for
methods and apparatus dealing with cameras for taking of
pictures and projectors which show the motion pictures,
especially subclass 39 for methods of utilizing motion
pictures for time and motion studies or for other uses other
than the creation of the illusion of motion.
353, Optics: Image Projectors, appropriate subclasses for
projection apparatus which may be used to facilitate optical
measuring and testing.
358, Facsimile and Static Presentation Processing, subclasses
1.1-1.18 for data processing for static presentation on
fixed medium (e.g., for printer).
359, Optics: Systems (Including Communication) and Elements,
350 for optical elements usable in the infrared or
ultraviolet range, subclasses 362+ for combpound lens systmes
including telescopes, microscopes, or periscopes, subclasses
396+ for microscope slides, subclasses 436+ for scale or
indicia reading, subclasses 483+ for polarization type
devices, subclasses 290+ for light control systems which
after an optical medium surface, or interface, subclasses
566+ for diffractions gratings subclasses 557+ for light
interference systems, subclass 615 for light dispersion
systems, subclasses 645+ lenses, particularly subclass 801
for lenses combined with illumination and a viewed object
support, subclasses 227+ for light control systems using an
opaque element or medium movable in or through the light
path, subclasses 831+ for prioms and their mounts, subclasses
838+ for reflectors, and subclasses 885+ for optical filters.
(See Lines With Other Classes, B, "Testing and Measuring
Subcombinations Provided for Elsewhere.")
359, Optics: Systems (Including Communication) and Elements,
for optical elements which may be used in measuring and
testing apparatus. The conventional optical elements such as
lenses, prisms, and mirrors are there. (See Lines With Other
Classes, B, "Testing and Measuring Subcombinations Provided
for Elsewhere.")
359, Optics: Systems (Including Communication) and Elements,
for optical elements which control light intensity or
direction on a molecular level, 246, 281+, and 301+ for
modulation involving polarized light, and subclasses 290+ for
light control by altering an optical medium or surface. (See
Lines With Other Clases, G, "Lasers and Resonance
Radiation.")
359, Optics: Systems (Including Communication) and Elements,
for utilizing a microscope to count particles, one by one,
such as blood particles or bacteria colonies, and for where
an optical element such as a lens for magnification is used
in combination with a support for counting bacteria colonies,
or particles such as dust; see Class 359 for one by one
counting. (See Lines With Other Classes, J, "Counting.")
361, Electricity: Electrical Systems and Devices, 173 and
211 for electric circuits for relays and electromagnets
controlled by a photosensitive device.
362, Illumination, appropriate subclasses for general purpose
lighting devices, particularly 3 for photographic lights,
subclasses 138+ for inspection lamps, and subclass 293 for
signal lanterns.
365, Static Information Storage and Retrieval, appropriate
subclass for static information storage and retrieval
systems, per se. Static storage systems which include
testing or measuring are excluded from this class.
372, Coherent Light Generators, for coherent light
generators, per se. (See Lines With Other Classes, G, "Lasers
snd Resonance Radiation.")
374, Thermal Measuring and Testing, subclass 32 for thermal
measurement of total energy or power radiated from a source;
and subclasses 121+ for emitted radiation, in general.
374, Thermal Measuring and Testing, subclass 32 where the
total energy or power in a beam of radiation is measured by a
thermal detector; and subclasses 121+ where thermally emitted
radiation is measured to determine the temperature of
themitting source, except where the radiation is limited to
light, where the classification is in Class 356. (See Lines
With Other Classes, H., "Thermocouples And Bolometers.")
376, Induced Nuclear Reactions: Processes, Systems, and
Elements, 245 for the testing, sensing, measuring,
monitoring or detecting of a reactor condition including
control of the reactor as a result of the testing or
sensing.
377, Electrical Pulse Counters, Pulse Dividers, or Shift
Registers: Circuits and Systems, subclass 6 for article
counters of the electrical type.
377, Electrical Pulse Counters, Pulse Dividers, subclass 10
for counting of discrete particles such as blood particles,
bacteria colonies, or dust particles, one at a time by
numerical counting apparatus which registers the counts
corresponding to the respective particles. (See Lines With
Other Classes, J, "Counting.")
382, Image Analysis, appropriate subclasses for the
application of image analysis or pattern recognition
systems.
382, Image Analysis, for pattern or character recognition of
a document or a record. (See Lines With Other Classes, K,
"Reading and Recording.")
385, Optical Waveguides, appropriate subclasses for fiber
optics, per se.
395, Information Processing System Organization, 1 for
artificial intelligence processing, subclasses 118+ for
computer graphics processing, subclasses 200.01+ for digital
data processing, and subclasses 326+ for a computer operator
interface.
396, Photography, subclass 563 for a sensitometer which may
produce an optical wedge having varying light transmission
characteristics by the controlled exposure of a photographic
medium to light.
399, Electrophotography, 9 for diagnostics of
electrophotographic devices.
414, Material or Article Handling, appropriate subclasses for
the generic class of article handling, particularly 431 for
engaging an article between its ends for rotation and
advancement, and subclass 433 for article rotators, roller
type.
422, Chemical Apparatus and Process Disinfecting,
Deodorizing, Preserving, or Sterilizing, 50 for analytical
and analytical-control apparatus involving an optical test;
subclass 44 for viable blood-treating apparatus; and subclass
99 for laboratory apparatus. An alternative electronic
search of U.S. patents based upon a modification of the
European Patent Office Classification (ECLA) System for
certain subject matter in this subclass may also be found in
Class 422 Cross-Reference Art Collections 908-948. (There are
no definitions associated with these Cross-Reference Art
Collections. The most available disclosure as to the types of
documents contained herein is given in any notes associated
with the titles.)
423, Chemistry of Inorganic Compounds, for all combustion
reactions not provided for elsewhere. (See Lines With Other
Classes, I, "Burning.")
424, Drug, Bio-Affecting and Body Treating Compositions, 9.1
for compositions and methods of diagnosing a body condition
by an in vivo test.
427, Coating Processes, subclass 162 for processes of
coating, per se, wherein the product is an optical element.
428, Stock Material or Miscellaneous Articles, appropriate
subclasses, for a stock material product in the form of a
single or plural layer web or sheet which may possess a
critical light transmissive or reflective property; and
especially subclass 426 for nonstructural composite web or
sheet embodying a layer of glass.
430, Radiation Imagery Chemistry: Process, Composition, or
Product Thereof, subclass 24 for radiation imagery chemistry
process involving control feature responsive to a test or
measurement.
431, Combustion, subclass 13 for gas burners with signal,
alarm or indicator for controlling the combustion ingredients
or any other function relating to the burning of the gas, and
subclass 355 for laboratory type burners including those used
in sample excitations dealing with spectroscopy and flame
photometers of Class 356.
431, Combustion, subclass 4 for feeding a substance to the
flame additional to the normal fuel and oxidizing material to
act as a protective agent or to give the flame some special
characteristic, subclass 126 for apparatus with ornamental
forms, surface ornamentation or an additive or additive means
producing flame coloration, and subclass 355 for apparatus
comprising a vertical tube of constant cross section with a
fuel gas feed means and an opening for air admission at its
lower end, the fuel being fed upwardly and vertically into
the tube, mixing air, and discharging from the upper end to
burn thereabove. (See Lines With Other Classes, I,
"Burning.")
433, Dentistry, subclass 6 for the visual comparison of
tooth forms with the shape or coloring of a person's face or
teeth.
434, Education, Demonstration, and Cryptography, subclass 298
and 303 for apparatus and processes relating to chemistry
and physics which could include light testing devices,
subclasses 98+ for color comparison charts which are used for
display and instruction purposes, and subclasses 322+ for
examination devices and methods which may include as a part
thereof reflection and transmission tests similar to those
found in Class 356.
435, Chemistry: Molecular Biology and Microbiology, 4 for
the quantitative or qualitative testing of fermentation
processes.
436, Chemistry: Analytical and Immunological Testing, 1 for
analytical and analytical control methods which could involve
an optical test.
445, Electric Lamp or Space Discharge Component or Device
Manufacturing, subclass 4 and 64 for methods and apparatus
for adjusting electrodes by means of optical operations.
451, Abrading, 42 for a lens grinding process which may
include optical tests as part of the grinding process and
subclass 325 for a stationary tool type of lens grinder.
505, Superconductor Technology: Apparatus, Material,
Process, 150 for high temperature (T[subscrpt]c[end
subscrpt] > 30 K) superconducting devices, and particularly
subclasses 160+ for measuring or testing system or device.
600, Surgery, 310 for surgical diagnostic instruments which
may involve optical measuring or testing on or in the body,
including in vivo light examination of a body process,
including metabolism, spirometers, and endoscopes.. (See
Lines With Other Classes, A, "Optical Measuring or Testing
Classified Elsewhere.")
604, Surgery, 20 for subject matter relating to
administration or removal of material from the body by means
responsive to optical diagnostic means.
606, Surgery, 2 for subject matter relating to surgical
instruments, or their use, for applying light to the body.
607, Surgery: Light, Thermal, and Electrical Application, 1
for therapeutic instruments which utilize light.
700, Data Processing: Generic Control Systems or Specific
Applications, subclasses 90-306 for particular application
of data processing systems or calculating computers.
GLOSSARY:
DIFFRACTION
The bending of a light ray in passing the edge formed by
contiguous opaque and transparent edges.
DIFFUSE
Pertaining to the scattering or random deviation of
transmitted or reflected light.
ELECTROPHORESIS
The effect in which charged particles suspended in a liquid
are moved under the influence of an electrostatic field.
FIDUCIAL
A reference direction formed as by a light ray, level,
compass, or scale from which another direction is measured or
compared.
LIGHT, VISIBLE LIGHT
Visible light is radiation, which stimulates the optical
receptors of the eye, and has a wavelength from 3850 to 7600
Angstrom units. The term light in these definitions refers
to radiation in the above mentioned range, and when qualified
by the terms ultraviolet and infrared refers to the
corresponding radiation ranges adjacent the visible range.
MEASURING-TESTING
Measuring usually involves a more precise and quantitative
determination of the characteristic or property in question.
Testing may be a mere indication of the presence or absence
of the characteristic or property, and may involve only a
mere inspection or viewing of the phenomenon or specimen. It
should be recognized that the two terms overlap to some
extent in meaning.
MENSURATION
Measurement of lengths, areas, or volumes.
MONOCHROMATOR
An instrument for producing a narrow band of the spectrum by
dispersing a radiation beam into its components or colors,
and isolating the narrow band desired as by passing the
components or colors through a narrow slit.
OPTICAL ELEMENT
A structure which performs a basic optical function. See
Class 359 for a more specific definition.
OPTICAL SYSTEM
A combination of two or more similar or diverse optical
elements which are optically related, or an optical element
combined with nonoptical structure where the overall function
performed is optical in nature. The optical systems in this
class are for measuring or testing purposes.
OPTICS, OPTICAL
The science of light and vision and the construction of
optical instruments.
REFLECTION
The return of light striking a surface back into the medium
from which it came.
REFRACTION
The deviation of light which results when a ray of light
passes obliquely from a medium of one density to a medium of
another density.
SPECTRUM
The band of colors produced by separating white light into
its component frequencies. The term also denotes radiation
arrayed over a frequency range where the frequency of the
radiation continuously increases or decreases over the
range.
SUBCLASSES
Subclass:
2
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter including structure responsive to two
stereoscopic images as photographed or otherwise viewed at
spaced points over a surface (usually of the earth) and
furnishing a contour plot of the surface based on the
distinctions in these images.
(1) Note. The subject matter of this subclass usually
involves a photodetecting apparatus such as a photocell
system which scans or otherwise responds to the stereoscopic
images or records, together with apparatus to compare the
photocell outputs to operate some form of indicator such as a
recorder. If the indication is by a scriber, classification
is in Class 33; and if the output is an error signal as for
alignment purposes classification is in Class 250, especially
subclass 558.
SEE OR SEARCH THIS CLASS, SUBCLASS:
138 for general alignment inspection.
SEE OR SEARCH CLASS:
33, Geometrical Instruments, 20.1 for sight line controlled
geometrical scribers.
250, Radiant Energy, subclass 220 for photocell systems with
plural photocells responsive to plural related images where
the measuring is lacking.
348, Television, subclass 26 for television systems
including means to generate contours based on features in the
scene viewed.
353, Optics: Image Projectors, subclass 5 for projection
involving mapping or aerial photograph rectifying.
359, Optics: Systems (Including Communication) and Elements,
subclass 470 for stereoviewers with compensation for camera
positions, as of the plotting or mapping type.
Subclass:
3
![[Patents]](../gifs/ps.gif)
RANGE OR REMOTE DISTANCE FINDING:
This subclass is indented under the class definition.
Subject matter comprising instruments to measure the distance
between an observer and a remote point or to measure the
distance between two points remote from the observer.
(1) Note. Height is a distance that may be measured.
SEE OR SEARCH THIS CLASS, SUBCLASS:
496 for interferometric dimensional measurement of small
structure or spaces.
SEE OR SEARCH CLASS:
235, Registers, subclass 414 for means to calculate the
range of a target and not employing a particular sighting
means.
348, Television, 135 for television systems utilized to
determine range.
396, Photography, 89 for range finders which operate in
conjunction with camera structure.
Subclass:
3.01
![[Patents]](../gifs/ps.gif)
Triangulation ranging to a point with one projected beam:
This subclass is indented under subclass 3. Subject matter
including the following: (a) the distance to any single
remote target point is determined in accordance with the
principles of triangulation; (b) the target may include
several points requiring more than one beamed measurement;
and (c) a light beam or its reflection from the target point
is oriented and projected to form at least one side of a
triangle.
(1) Note. Triangulation involves, for example, establishing
a triangle where one side (i.e., the base) and the angles,
which the two other sides form with the base, are
determined.
(2) Note. This subclass does not necessarily require the
use of a photodetector, but requires a projected beam.
(3) Note. This subclass includes, for example, apparatus
that utilizes together a nonfixed axial source and a nonfixed
axial line of sight for the sensing that is not found
elsewhere, but that still requires only a single source for
each point.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.09 where scanning is required to achieve angular
measurement to a single point.
3.12 for photodetection remote from at least two source
locations that are transmitting beams to be received by a
photodetector.
9 for triangulation with no projected beam and no
photodetection.
372 for distance measurement to define the dimensions of an
adjacent, as opposed to remote, article that may involve
triangulation to any one point.
SEE OR SEARCH CLASS:
250, Radiant Energy, subclass 201.6 for triangulation used
to establish distance-related focus of the source onto a
triangulating photodetector.
342, Communications: Directive Radio Wave Systems and Devices
(e.g., Radar, Radio Navigation), for the use of similar
circuitry not requiring the same wavelength or radiation
distinctions.
367, Communications, Electrical: Acoustic Wave Systems and
Devices, for the use of similar circuitry not requiring the
same wavelength or radiation distinctions.
396, Photography, 89 where triangulation may be employed in
the focus of a separate photographic camera.
Subclass:
3.02
![[Patents]](../gifs/ps.gif)
Using photodetection with a fixed axial line of sight:
This subclass is indented under subclass 3.01. Subject
matter that determines an angle of the triangle with respect
to a known base line by establishing a fixed viewing
direction and field of view for a photodetector to generate
an electrical signal upon the coincidence of the target along
a photodetector's line of sight.
(1) Note. This subclass would include apparatus that
utilizes a moving detector with respect to a fixed optical
viewing axis to determine the direction of light from a
targeted source.
Subclass:
3.03
![[Patents]](../gifs/ps.gif)
Using a source beam with a fixed axial direction or plane:
This subclass is indented under subclass 3.01. Subject
matter that includes a beam or plane of light from the target
that has a fixed angular orientation with respect to a
baseline to establish an angle of the triangle.
(1) Note. The use of a photodetector is not required for
this subclass, but the use of a vidicon-type detector is
found here.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.05 for a system that includes a moving optical axis in the
receiver optics and a fixed detector.
Subclass:
3.04
![[Patents]](../gifs/ps.gif)
With a single staring photodetector having one element:
This subclass is indented under subclass 3.03. Subject
matter wherein a detector produces an electrical signal
related to the angular position of the source based on the
instantaneous output of or differential output across a
single detecting element that is not subdivided for its
operation.
(1) Note. A one-element photodetector may consist of a
lateral effect or photoresistive element.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.03 for vidicon-type detection.
3.06 for use of detectors that define the position of
incidence of received light by the difference in the outputs
of more than two detector elements (e.g., at least three
separate photodetectors).
Subclass:
3.05
![[Patents]](../gifs/ps.gif)
Having moving receiver optics:
This subclass is indented under subclass 3.04. Subject
matter wherein an image of the source is moved with respect
to the detector's axial line of sight to achieve an effective
movement of the photodetector's angular field of view across
the source.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.02 for systems that may include a moving detector element
with respect to a fixed optical line of sight.
Subclass:
3.06
![[Patents]](../gifs/ps.gif)
With a single photodetector having multiple elements:
This subclass is indented under subclass 3.03. Subject
matter wherein a detector produces an electrical signal
related to the angular position of the source based on the
output of a particularly positioned one of an array of at
least three subelements in the focused field of view of a
single detector structure.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.03 for vidicon-type detection.
3.07 for CCD-type multi-element detectors that are
electronically scanned.
3.08 for two separated detectors that are paired.
Subclass:
3.07
![[Patents]](../gifs/ps.gif)
Having electronic scanning of the photodetector:
This subclass is indented under subclass 3.06. Subject
matter that includes electronic regular sampling through time
of the elements of the detector array in order to determine
the position or angle associated with a particular element
illuminated by the target.
(1) Note. This subclass includes, for example, CCD-type
detectors.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.03 for vidicon-type detection.
Subclass:
3.08
![[Patents]](../gifs/ps.gif)
With at least one paired set of staring photodetectors:
This subclass is indented under subclass 3.03. Subject
matter wherein any two separated detectors produce electrical
signals related to two angular positions detected from the
single source.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.06 for a single detector subdivided into at least three
subelements.
Subclass:
3.09
![[Patents]](../gifs/ps.gif)
Requiring scanning of a source beam:
This subclass is indented under subclass 3.01. Subject
matter wherein the source comprises a beam of light that is
moved at some angular rate that can be detected and
associated with any one target's angular position.
(1) Note. The target may be at the source position or
reflected by the source, but scanning is required to generate
the angular information.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.02 for moved but not necessarily spatially scanned sources
that define a target with respect to a fixed axial line of
sight of a photodetector.
Subclass:
3.1
![[Patents]](../gifs/ps.gif)
Triangulation ranging to a point with two or more projected
beams:
This subclass is indented under subclass 3. Subject matter
wherein a target distance is determined in accordance with
the principles of triangulation, and two light beams,
separated by a known baseline distance, are oriented and
projected to define the other two legs of the triangle.
(1) Note. The two beams may be scanned over angularly
related time across the target or moved at least once to
orient their coincidence on the target.
(2) Note. Triangulation involves, for example, establishing
a triangle where one side (i.e., the base) and the angles,
which the two other sides form with the base, are
determined.
(3) Note. This subclass does not necessarily require the
use of a photodetector, but requires projected beams.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.09 where scanning is required to achieve angular
measurement to a single point.
3.12 for photodetection remote from at least two source
locations transmitting beams to be received by a
photodetector.
9 for triangulation with no projected beam and no
photodetection.
372 for distance measurement to define the dimensions of an
adjacent, as opposed to remote, article that may involve
triangulation to any one point.
SEE OR SEARCH CLASS:
250, Radiant Energy, subclass 201.6 for triangulation used
to establish distance-related focus of the source onto a
triangulating photodetector.
342, Communications: Directive Radio Wave Systems and
Devices (e.g., Radar, Radio Navigation) for the use of
similar circuitry not requiring the same wavelength or
radiation distinctions.
367, Communications, Electrical: Acoustic Wave Systems and
Devices, for the use of similar circuitry not requiring the
same wavelength or radiation distinctions.
396, Photography, 89 where triangulation may be employed in
the focus of a separate photographic camera.
Subclass:
3.11
![[Patents]](../gifs/ps.gif)
Using photodetection at the source station(s):
This subclass is indented under subclass 3.1. Subject matter
wherein an electrical signal is generated based on the
reflection of the two beams from the target back to the
plane, platform, or station(s) that supports the beams and
the photodetector.
Subclass:
3.12
![[Patents]](../gifs/ps.gif)
Using photodetection remote from the source station(s):
This subclass is indented under subclass 3.1. Subject matter
wherein an electrical signal is generated based on the
incidence of the two sources onto a photodetector that is not
located on the same plane, platform, or station(s) as the two
sources.
(1) Note. The detector may be located at the target to
receive direct unreflected directional beams of illumination
from the sources.
Subclass:
3.13
![[Patents]](../gifs/ps.gif)
Triangulation ranging with photodetection, but with no
projected beam:
This subclass is indented under subclass 3. Subject matter
wherein the distance to any single remote target point is
determined in accordance with the principles of
triangulation, wherein at least one passive image of a target
point (which may be formed by arbitrary target point
illumination) forms at least one side of a triangle.
(1) Note. Triangulation involves, for example, establishing
a triangle where one side (i.e., the base) and the angles,
which the two other sides form with the base, are
determined.
(2) Note. The target point may be an active omnidirectional
beacon source or may be actively illuminated where the active
beam does not form one side of the triangle measured.
(3) Note. Sequential views of a moving target with a known
speed may comprise the target.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.12 for photodetection remote from at least two source
locations transmitting directed beams to be received by a
photodetector.
9 for triangulation with no projected beam and no
photodetection.
372 for distance measurement to define the dimensions of an
adjacent, as opposed to remote, article that may involve
triangulation to any one point.
SEE OR SEARCH CLASS:
250, Radiant Energy, subclass 201.6 for triangulation used
to establish distance-related focus of the source onto a
triangulating photodetector.
342, Communications: Directive Radio Wave Systems and
Devices (e.g., Radar, Radio Navigation), for the use of
similar circuitry not requiring the same wavelength or
radiation distinctions.
367, Communications, Electrical: Acoustic Wave Systems and
Devices, for the use of similar circuitry not requiring the
same wavelength or radiation distinctions.
396, Photography, 89 where triangulation may be employed in
the focus of a separate photographic camera.
Subclass:
3.14
![[Patents]](../gifs/ps.gif)
Using at least a pair of viewing axes:
This subclass is indented under subclass 3.13. Subject
matter which includes two optical axes relating to the target
directed to at least two photodetectors or detector arrays in
the generation of a pair of electrical signals related to the
triangle that defines the distance to the target.
(1) Note. The detector(s) may be mono- or multi-element,
and further scanned or staring.
(2) Note. This subclass includes passive image correlation
of two images from a single target source in establishing two
angles to the target.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.08 for a pair of staring mono- or multi-element detectors
used where a single source maintains a fixed axial
direction.
3.15 for image correlation where a photodetector views
images of a target and where one of the images is established
along a fixed line of sight.
4.04 for split-image separation detection of "focus" quality
where there is no baseline separation between the separate
image viewing axes as here in subclass 3.14.
SEE OR SEARCH CLASS:
348, Television, subclass 139 for triangulation of range
derived from two or more picture images generated and
compared based on their baseline separation.
Subclass:
3.15
![[Patents]](../gifs/ps.gif)
With one viewing axis fixed:
This subclass is indented under subclass 3.14. Subject
matter wherein one optical axis that views the target is
fixed relative to the other one of the pair of viewing axes.
Subclass:
3.16
![[Patents]](../gifs/ps.gif)
With moving optical elements in all viewing axes:
This subclass is indented under subclass 3.14. Subject
matter that includes movement of each viewing axis in order
to achieve measurement of the target point.
Subclass:
4.01
![[Patents]](../gifs/ps.gif)
With photodetection:
This subclass is indented under subclass 3. Subject matter
that includes the generation of an electrical signal in
response to light associated with the distance being
measured.
(1) Note. This subclass includes first any apparatus or
method that includes a generic capability applicable to any
one of pulse, phase, or frequency ranging systems.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.01 for a system that involves triangulation, even though
that term is not mentioned, but is evidenced by a baseline or
trigonometric technique and contains either photodetection
and/or the use of a projected light beam.
9 for a system that uses neither a pro jected beam nor
photodetection.
372 for distance measurement to define the dimensions of an
adjacent, as opposed to remote, article that may involve
similar ranging techniques to any one point.
SEE OR SEARCH CLASS:
342, Communications: Directive Radio Wave Systems and Devices
(e.g., Radar, Radio Navigation), for the use of similar
circuitry not requiring the same wavelength or radiation
distinctions.
367, Communications, Electrical: Acoustic Wave Systems and
Devices, for the use of similar circuitry not requiring the
same wavelength or radiation distinctions.
Subclass:
4.02
![[Patents]](../gifs/ps.gif)
Of a simulation or test:
This subclass is indented under subclass 4.01. Subject
matter that includes a predefined range path for the light
used to measure range in order to calibrate or test a range
finder.
(1) Note. The simulation in this subclass is not considered
the same as the alternate reference path used in subclasses
5.12 and 5.13 used during the regular operation of those
range finders.
SEE OR SEARCH THIS CLASS, SUBCLASS:
72 for other optical tests not specifically dedicated to
range or distance finders.
Subclass:
4.03
![[Patents]](../gifs/ps.gif)
Of focused image size or dimensions:
This subclass is indented under subclass 4.01. Subject
matter that includes a determination of the distance of or to
an observed object by the relative focused size of the object
or dimensional spread of reference points on the focal plane
of the photodetector with respect to a calibrated size and
corresponding distance.
(1) Note. The image size must be derived from a focused
image as opposed to a blur circle size.
SEE OR SEARCH THIS CLASS, SUBCLASS:
4.04 for blur circle size or edge detection.
21 for the same, but without photodetection.
SEE OR SEARCH CLASS:
348, Television, subclass 140 where a picture image signal
is analyzed for size.
Subclass:
4.04
![[Patents]](../gifs/ps.gif)
Of degree of defocus:
This subclass is indented under subclass 4.01. Subject
matter that includes a determination of the distance of a
remote point or observed object by the degree of image focus
through relative characteristics of in-and-out-of-focus
intensity, blur circle size, lateral split image
displacement, etc., of an image generated at some fixed
location from focusing optics along its optical axis relative
to the same characteristic under a focused condition at the
same location along the optical axis.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3.14 for split images of a single object directed to two
detectors separated by a baseline, unlike split-image focus
detection here in subclass 4.04 where there is no baseline
separation.
4.03 for a focused image feature measurement(s).
4.05 for mechanically searching for the focal point based on
the same or other characteristics as in subclass 4.04.
22 for split images without photodetection.
Subclass:
4.05
![[Patents]](../gifs/ps.gif)
Of focal point search:
This subclass is indented under subclass 4.01. Subject
matter that includes a way to mechanically, or otherwise,
sample the "image" along the optical axis of a fixed focus
lens or scan the focus of a transmitted beam to determine the
point of maximum focus of the image or reflection of the
source which is proportional to the distance to the targeted
remote point.
SEE OR SEARCH THIS CLASS, SUBCLASS:
4.04 for determining range based on the focus
characteristics of an image at some fixed point from the
focusing lens.
Subclass:
4.06
![[Patents]](../gifs/ps.gif)
Of differential amplitude at two source or detector
distances:
This subclass is indented under subclass 4.01. Subject
matter that includes either two sources at different
distances from a target alternately illuminating the target
at the remote point that a fixed detector views or includes
two detectors at different distances receiving focused images
of the target illuminated by a single source from which
distance is determined based on the relative intensities
detected.
Subclass:
4.07
![[Patents]](../gifs/ps.gif)
Of intensity proportional to distance:
This subclass is indented under subclass 4.01. Subject
matter that includes a measure of the relative intensity of
the received focused target image from which distance may be
determined by the fact that intensity varies by the inverse
square of the distance or the like.
Subclass:
4.08
![[Patents]](../gifs/ps.gif)
Of height relative to a light plane:
This subclass is indented under subclass 4.01. Subject
matter that includes some apparatus between two remote points
being measured that defines the height between the ground and
a detector or reflector moved to intersect a light beam or
beam plane that may be scanned or fanned.
(1) Note. The apparatus may define a path for the light
beam to traverse from the mirror intersecting the plane to
the ground.
Subclass:
4.09
![[Patents]](../gifs/ps.gif)
Of light interference fringes:
This subclass is indented under subclass 4.01. Subject
matter wherein the photodetection is in response to an
interference pattern formed by the interaction of coherent
light waves which relate to range by a fringe pattern or
fringe count.
SEE OR SEARCH THIS CLASS, SUBCLASS:
5.09 for a system that detects frequency of modulation to
determine range where the beat frequency of a mixed or
compared beam is not directly related to a coherent
interference fringe count.
5.11 for phase change counting between known frequencies of
modulation that are unrelated to coherent carrier mixing in
the production of fringes.
5.15 for a system that demodulates a return beam by coherent
or incoherent mixing in order to shift the return to a
different IF operating frequency unrelated to counting of
fringes.
28.5 for a system where frequency is detected from the
mixing of coherent waves that produce a moving, interference
pattern or just a difference frequency, which is related to
velocity.
Subclass:
4.1
![[Patents]](../gifs/ps.gif)
Having different frequency sources:
This subclass is indented under subclass 4.09. Subject
matter that includes at least two light beams from the same
or different sources, but which have different frequencies.
Subclass:
5.01
![[Patents]](../gifs/ps.gif)
Of pulse transit time:
This subclass is indented under subclass 4.01. Subject
matter including means for measuring the time delay of a
discrete light pulse in its time of flight (transit time)
from an observing station to a remote point and back to the
observing station.
Subclass:
5.02
![[Patents]](../gifs/ps.gif)
Having return coincide with swept display or detector:
This subclass is indented under subclass 5.01. Subject
matter wherein the return pulse's reception time is related
to transit time by reference to where it appears in time on a
calibrated sweep of a display screen, detector, or film which
begins a sweep at the instant of transmission.
Subclass:
5.03
![[Patents]](../gifs/ps.gif)
Having one or more return pulse gates or windows:
This subclass is indented under subclass 5.01. Subject
matter including means at the receiver for accepting return
signals to be processed if they occur during specified (gate
or window) periods after the transmission of a light pulse.
Subclass:
5.04
![[Patents]](../gifs/ps.gif)
Including a displayed image:
This subclass is indented under subclass 5.03. Subject
matter wherein the return pulse includes image data of a
reflecting object at the remote point and is displayed as at
least a two-dimensional image that does not include
reflection signals outside the gate period.
SEE OR SEARCH CLASS:
348, Television, subclass 31 for backscatter reduction of an
image that may involve range gating, but does not involve
range indicating.
Subclass:
5.05
![[Patents]](../gifs/ps.gif)
Having pulse transmission trigger significance:
This subclass is indented under subclass 5.01. Subject
matter including details of the manner in which the
transmitted pulse instant is determined for measuring the
transit time of the light pulse.
Subclass:
5.06
![[Patents]](../gifs/ps.gif)
Including optical pick-off of transmission start:
This subclass is indented under subclass 5.05. Subject
matter wherein the instant of pulse transmission is
determined by optically detecting the transmission pulse in
order to begin measuring the transit time.
Subclass:
5.07
![[Patents]](../gifs/ps.gif)
With specific counter type timing of returns:
This subclass is indented under subclass 5.06. Subject
matter including an electronic element that counts timing
pulses associated with travel of the optical pulse to and
from the target.
Subclass:
5.08
![[Patents]](../gifs/ps.gif)
Including specific counter type timing of returns:
This subclass is indented under subclass 5.05. Subject
matter including an electronic element that counts timing
pulses associated with travel of the optical pulse to and
from the target.
(1) Note. This subclass includes electrical initiation of
the counter controlled independently of the optical pulse
itself.
Subclass:
5.09
![[Patents]](../gifs/ps.gif)
Of frequency difference:
This subclass is indented under subclass 4.01. Subject
matter that either sends a defined frequency beam or
frequency modulates an outgoing pulse or continuous wave
optical beam in order to compare the detected return
frequency to the transmitted frequency for determining range
calibrated frequency differences.
SEE OR SEARCH THIS CLASS, SUBCLASS:
4.09 where frequency is detected from the mixing of coherent
waves that produce an interference pattern, which includes
moving or static fringes which are counted.
5.15 where optical demodulation by heterodyning or
homodyning is used to reduce the processed signal frequency.
28.5 where frequency is detected from the mixing of coherent
waves that produce a moving interference pattern or just a
difference frequency, which is related to velocity.
Subclass:
5.1
![[Patents]](../gifs/ps.gif)
Of CW phase delay:
This subclass is indented under subclass 4.01. Subject
matter that incorporates a continuous wave (CW) of modulated
or unmodulated optical signal that is transmitted to and
reflected from a target, such that the relative phase
position of the returned wave is compared to the phase of the
transmitted wave in order to determine the
distance-proportional transit time to and from the target.
(1) Note. Phase nulling techniques are included in this
subclass.
Subclass:
5.11
![[Patents]](../gifs/ps.gif)
Having multiple carrier or modulation frequencies:
This subclass is indented under subclass 5.1. Subject matter
including more than one frequency of modulation or carrier
frequency for the transmitted optical signal to further
define the distance-proportional phases comparison.
Subclass:
5.12
![[Patents]](../gifs/ps.gif)
Including an alternating reference path:
This subclass is indented under subclass 5.11. Subject
matter that incorporates a path of known distance through
which the transmitted signal is alternately sent in order to
phase calibrate the receiver circuity for the received
measuring signal from the target.
Subclass:
5.13
![[Patents]](../gifs/ps.gif)
Having an alternating reference path:
This subclass is indented under subclass 5.1. Subject matter
that incorporates a path of known distance through which the
transmitted signal is alternately sent in order to phase
calibrate the receiver circuity for the received measuring
signal from the target.
Subclass:
5.14
![[Patents]](../gifs/ps.gif)
Having polarization discrimination:
This subclass is indented under subclass 5.1. Subject matter
that incorporates polarized optical elements in the optical
path.
Subclass:
5.15
![[Patents]](../gifs/ps.gif)
Having specific IF mixing of returns:
This subclass is indented under subclass 5.1. Subject matter
that incorporates demodulation by optically or electrically
heterodyning the received signals to an intermediate
frequency (IF) for further processing.
SEE OR SEARCH THIS CLASS, SUBCLASS:
4.09 for systems that mix the return with another beam to
produce a fringe pattern to be counted and frequency analyzed
as a direct measurement of range.
5.09 for systems that detect frequency of modulation to
determine range where the beat frequency of a mixed or
compared beam is not directly related to a coherent
interference fringe count or to CW phase delay.
Subclass:
6
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 3. Subject matter
comprising means for testing or indicating the condition of
the range or height finder with regard to its adjustment,
alignment, or calibration.
SEE OR SEARCH THIS CLASS, SUBCLASS:
124 for lens or reflective image former testing generally.
Subclass:
7
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 3. Subject matter
wherein the instrument has two axis which are offset from
each other in a direction perpendicular to the base line so
that the device may function as a periscope.
SEE OR SEARCH CLASS:
359, Optics: Systems (Including Communication) and Elements,
540 for periscopes, per se.
Subclass:
8
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 3. Subject matter
wherein the range or height finder is combined with a view
finder.
(1) Note. Where the operation of the range finder is
coordinated with the operation of some other element of the
camera (usually the objective lens) classification is not
here but in Class 396, subclasses 148+.
SEE OR SEARCH CLASS:
396, Photography, 148 for camera structure combined with a
rangefinder and viewfinder; see also (1) Note above.
Subclass:
9
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 3. Subject matter
wherein the range or height finder includes a base line as a
part of the instrument with plural lines of sight directed
from the extremeties of the base line to the point whose
range is to be measured, at least one of the lines of sight
being deviated.
Subclass:
10
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
wherein filters or light valves are employed to aid the eye
as in determining coincidence of the right and left images.
SEE OR SEARCH CLASS:
359, Optics: Systems (Including Communication) and Elements,
227 for diaphragms and shutters, and subclasses 885+ for
filters of the color and neutral density type.
Subclass:
11
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
wherein the range finder is combined with means to determine
the height of the object whose range has been determined.
Subclass:
12
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
wherein the observer sees the field of view in three
dimensions, the range being determined by comparing the depth
of the object whose range is to be measured with the apparent
depth of a mark or marks superimposed upon the field of
view.
SEE OR SEARCH CLASS:
359, Optics: Systems (Including Communication) and Elements,
462 for stereoscopic systems generally.
Subclass:
13
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 12. Subject matter
where the observer sees an image in true perspective and also
one in reverse perspective.
Subclass:
14
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 12. Subject matter
where the measuring mark or marks are stationary.
Subclass:
15
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
wherein the range measurement is made by varying the length
of the base line.
Subclass:
16
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
wherein the range measurement is made by deviating one of the
lines of sight by means of an adjustable refracting element.
Subclass:
17
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
wherein the range measurement is made by deviating one of
lines of sight by means of the rotation of a reflecting
element.
Subclass:
18
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
comprising structural details including means for mounting,
supporting or adjusting the range finder or its components.
SEE OR SEARCH THIS CLASS, SUBCLASS:
6 for testing the alignment or calibration of the
instrument.
Subclass:
19
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 9. Subject matter
including prism structure for displacing relative to each
other the two images of a coincidence type range finder.
(1) Note. Such prism structure is appropriately classified
here as a pertinent subcombination even though no other range
finder structure is recited.
Subclass:
20
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 3. Subject matter
wherein the complete measurement requires the knowledge of
some distance or interval external to the measuring
instrument.
SEE OR SEARCH CLASS:
33, Geometrical Instruments, appropriate subclasses,
particularly subclass 262, 276, and 284, for similar subject
matter with no significant optical feature.
Subclass:
21
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 20. Subject matter
where there is an interval of known size (e.g., height of an
object) at a remote point, the distance to which point is to
be determined; or where the distance to a remote point is
known and the size of some interval at the remote point is to
be determined.
Subclass:
22
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 21. Subject matter
where the instrument provides two displaced images of the
same object for viewing by the observer.
Subclass:
23
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter comprising means whereby the relationship
between periodic changes in light intensity or direction and
the motion of a body are utilized in observing the body or
performing some measurement with regard to the body or some
means controlling the light source.
(1) Note. Where a specific test is provided for in another
class, classification is in that class even though the
subject matter may include a stroboscope. See Search Class
notes below.
SEE OR SEARCH CLASS:
73, Measuring and Testing, subclass 1.56 for timing
apparatus for watches, camera shutters and the like which may
utilize stroboscopic principles.
315, Electric Lamp and Discharge Devices: Systems,
appropriate subclasses for electric lamp and discharge device
systems in general.
324, Electricity: Measuring and Testing, subclass 75 for
calibration of electric meters using stroboscopic principles,
and subclasses 76.11+ for measuring electric properties using
stroboscopes.
Subclass:
24
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 23. Subject matter
including reflecting or refracting means which are moved
periodically to vary the direction of a light beam.
SEE OR SEARCH CLASS:
359, Optics: Systems (Including Communication) and Elements,
197 for scanning means in general which use a periodically
moving reflecting or refracting element.
Subclass:
25
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 23. Subject matter
wherein the periodic motion of an element containing
alternate opaque and transparent areas is used to interrupt a
light source.
SEE OR SEARCH CLASS:
359, Optics: Systems (Including Communication) and Elements,
227 for light valves utilzing an opaque element movable
through a light path.
Subclass:
26
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 25. Subject matter
where the opaque element vibrates or oscillates.
Subclass:
27
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter including means to measure the velocity or the
velocity to altitude ratio of a vehicle by sighting from the
vehicle on a remote object, or including means to measure the
velocity or the velocity to altitude ratio of a moving object
remote from an observer by sighting on the object.
(1) Note. The vehicle may be a surface vehicle or an
aircraft. The term "sighting" includes aiming an optical
instrument with a photocell. This subject matter includes
timing the passage of a sighted object over grids.
SEE OR SEARCH THIS CLASS, SUBCLASS:
459 for interferometric measurement of angular velocity.
SEE OR SEARCH CLASS:
235, Registers, subclass 413 for means to calculate the
velocity of an object and not employing a particular sighting
means.
Subclass:
28
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 27. Subject matter
wherein the measuring system includes means responsive to the
received light.
SEE OR SEARCH THIS CLASS, SUBCLASS:
3 for range or height finders with light detectors.
139.01 for devices measuring the angle with respect to a
remote point having specified applications with
photodetection.
141.1 for devices measuring the apex of an angle at a
photodetection station with respect to a remote point.
152.1 for devices measuring the apex of an angle at a point
remote from a photodetection station.
SEE OR SEARCH CLASS:
343, Communication: Radio Wave, subclass 8 for systems for
measuring velocity by means of reflected radio wave energy.
Subclass:
28.5
![[Patents]](../gifs/ps.gif)
Of light interference (e.g., interferometer):
This subclass is indented under subclass 28. Subject matter
wherein the detection means is responsive to an interference
pattern formed by the interaction of coherent light waves.
(1) Note. This subclass includes heterodyne interferometers
which measure a doppler-shifted beam reflected from a moving
object.
SEE OR SEARCH THIS CLASS, SUBCLASS:
4.09 and 4.1, for light interference measurement of
displacement or distance over large distances.
35.5 for material strain analysis by light interference
measurement.
450 for light interference measuring and testing, per se.
SEE OR SEARCH CLASS:
73, Measuring and Testing, subclass 71.3 for vibration
sensing with a light beam indicator.
Subclass:
29
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter comprising means whereby a device for
determining a line of sight relative to a remote point
includes an optical element or reticle which is moved
relative to the device in accordance with the relative
velocities of the device and remote point.
(1) Note. This subclass includes in general sighting
devices containing optical elements which move relative to
the device as a whole for the purpose of tracking a
relatively moving object and also optical elements or
reticles which are moved in accordance with information
obtained by tracking the object by means of moving the
sighting device as a unit.
SEE OR SEARCH THIS CLASS, SUBCLASS:
27 for optical devices which actually measure velocity.
Subclass:
30
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter including a support for a crystal or gem for
examination by visible light, a light source passing light
through or reflecting light from the crystal or gem and
usually structure to view, mark, or locate the light patterns
correlated to some condition of the crystal or gem.
(1) Note. Included in this subclass are apparatus and
method claims which include nominal cutting or etching
structure or steps to prepare the crystal for examination in
addition to the claimed test.
(2) Note. The optical testing of piezoelectric and
semiconductor crystals are included in this subclass.
SEE OR SEARCH THIS CLASS, SUBCLASS:
36 for sample preparation wherein the novelty is in the
preparation of the sample for an optical test and not
provided for elsewhere.
72 for an optical test combined with another are device and
not provided for elsewhere.
SEE OR SEARCH CLASS:
29, Metal Working, subclass 25.35 for piezoelectric device
making methods, which include cutting and etching steps.
125, Stone Working, subclass 12 and 13.01 for apparatus and
methods for cutting crystals which include the step of first
examining optically and marking the crystal for axis
orientation. Also, see subclass 35 for work supports for
cutting the crystal.
156, Adhesive Bonding and Miscellaneous Chemical Manufacture,
625 for methods including a chemical etching step.
378, X-Ray or Gamma Ray Systems or Devices, 73 for methods
and apparatus for X-ray analysis of crystals which may
include a support for the crystal.
Subclass:
31
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 30. Subject matter
wherein the properties of crystals or gems are examined for
one of the three principle axis of the crystal, the left or
right handedness of the crystal, the polarity or the crystal
faces, or twinning, if present, in the crystal.
SEE OR SEARCH CLASS:
216, Etching a Substrate: Processes, for the etching of a
crystal or gem.
Subclass:
32
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter for examining an article or material by noting
the effect of the strain in the stressed article on light
associated with the article or material.
(1) Note. The light may be passed through or reflected from
the article or material, or may be modified by changes in the
contour or the position of markings thereon. The
modification of the light may be in intensity, direction,
polarization, color, or interference patterns produced
thereby.
(2) Note. Stress strain measuring generally is provided for
elsewhere (see the Search Class notes below). However, where
the changes in the material tested operate to modify the
characteristics of the light associated with the test, absent
intentional loading of the specimen, classification is in
this Class 356.
SEE OR SEARCH CLASS:
33, Geometrical Instruments, subclass 125 for
extensiometers. See the (2) note of this subclass.
73, Measuring and Testing, 763 for testing the stress or
strain of material, particularly subclass 800 for optical
stress analysis with intentional loading of the specimen, and
subclasses 862+ for dynamometers which are not provided for
elsewhere and which do not involve the modification of the
associated light. See also (2) Note above.
Subclass:
33
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 32. Subject matter
wherein the light utilized in the examination or analysis is
polarized light, or is polarized as a result of the
examination or analysis.
(1) Note. Class 359, subclasses 240+ and 483 provides for
polarizing structure generally whose light polarizing
properties are modified by mechanical stress; while the
subject matter of this subclass is restricted to the
measuring or analyzing of the strain in the stressed article
or material from the effect of the strain on polarized light
or from the polarizing effect of light.
(2) Note. This Class 356 provides for stress-strain
determinations in articles or materials where the light is
directly or indirectly associated with the article or
material stressed as by direct reflection from or
transmission through the articles or materials, and for
transmissions of the light through detectors attached to
articles or materials which are naturally or forced by stress
to be light birefringent as a result of the strain on the
articles or materials; while Class 73, subclasses 760+,
provides for stress-strain determinations generally.
SEE OR SEARCH THIS CLASS, SUBCLASS:
30 for crystal or gem examination wherein polarized light
testing may be involved.
SEE OR SEARCH CLASS:
73, Measuring and Testing, subclass 133 and 763+ for
stress-strain testing apparatus and dynamometers generally
where no polarized light is involved. See also (2) Note
above.
Subclass:
34
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 33. Subject matter
wherein the test apparatus utilized in examining articles or
materials includes a detector which is naturally birefringent
or forced by stress to be birefringent, and means to attach
the detector to the articles or materials so that the strain
placed on the articles or materials is imparted to the
detector so that the modification of the light associated
with the detector is indicative of the strain in the stressed
article or material.
SEE OR SEARCH THIS CLASS, SUBCLASS:
51 where infrared and ultraviolet light is involved in the
test.
364 for polarized light examination apparatus which produces
interference patterns created by the interaction of beams of
polarized light.
SEE OR SEARCH CLASS:
359, Optics: Systems (Including Communication) and Elements,
483 for polarizing structure generally. See also (1) Note
of subclass 33.
Subclass:
35
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 33. Subject matter
wherein there is means to support transparent sheet material,
statically or in motion, which exhibits birefringent
properties naturally or when under strain, means to direct
polarized light through the sheet material, and generally
polarized light analyzing means to examine the sheet
material.
SEE OR SEARCH THIS CLASS, SUBCLASS:
429 for monitoring of webs for optical properties or flaws.
Subclass:
35.5
![[Patents]](../gifs/ps.gif)
By light interference detector (e.g., inter-ferometer):
This subclass is indented under subclass 32. Subject matter
including means responsive to an interference pattern
produced by the interaction of coherent light waves with the
stressed article or material.
SEE OR SEARCH THIS CLASS, SUBCLASS:
4.5 for light interference measurement of displacement or
distance over large distances.
28.5 for light interference measurement of velocity.
450 for light interference measurement, per se.
Subclass:
36
![[Patents]](../gifs/ps.gif)
This subclass is indented under the class definition.
Subject matter involving preparation or conditioning of an
article or substance or a sample of the article or substance
to facilitate or enable the later optical test and in
combination with such an optical test, wherein the
preparation or conditioning is significant and is not
provided for in any other class.
SEE OR SEARCH CLASS:
73, Measuring and Testing, particularly subclass 23 for gas
analysis and 53.01+ for the testing of liquid or liquid
suspension of solids, and subclass 421 for samplers and
tollers for gases and liquids including closed conduit type
samplers.
422, Chemical Apparatus and Process Disinfecting,
Deodorizing, Preserving, or Sterilizing, 50 for
analyticalcontrol apparatus and apparatus which use sorbents
or in which chemical reactions are produced.
436, Chemistry: Analytical and Immunological Testing, 1 for
processes involving analytical control and use of sorbents or
chemical reactions.
Subclass:
37
![[Patents]](../gifs/ps.gif)
This subclass is indented under subclass 36. Subject matter
wherein moisture or other liquids are deposited on particles
to enlarge them or optically modify them (e.g., improve
reflection) to facilitate optical study of the particles.
(1) Note. Generally the apparatus includes pump structure
to deliver a gas sample containing p