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| You are viewing a USPC Schedule. |
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| Class 702 | DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING |
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![[List of Pre Grant Publications for class 702 subclass 1]](../as.gif) | ![[List of Patents for class 702 subclass 1]](../ps.gif) | 1 | MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT |
| | 2 |  Earth science |
| | 3 |  Weather |
| | 5 | Topography (e.g., land mapping) |
| | 6 | Well logging or borehole study |
| | 7 |  By induction or resistivity logging tool |
| | 8 | By radiation (e.g., nuclear, gamma, X-ray) |
| | 9 | Drilling |
| | 10 | Dipmeter |
| | 11 | Formation characteristic |
| | 14 | Seismology |
| | 19 | Biological or biochemical |
| | 22 | Chemical analysis |
| | 23 | Quantitative determination (e.g., mass, concentration, density) |
| | 24 | Gaseous mixture (e.g., solid-gas, liquid-gas, gas-gas) |
| | 25 | Liquid mixture (e.g., solid-liquid, liquid-liquid) |
| | 26 | By particle count |
| | 27 | Molecular structure or composition determination |
| | 29 | Particle size determination |
| | 30 | Chemical property analysis |
| | 31 | Specific operation control system |
| | 32 | Specific signal data processing |
| | 33 | Mechanical measurement system |
| | 34 | Wear or deterioration evaluation |
| | 35 | Flaw or defect detection |
| | 36 | Location |
| | 38 | Electromagnetic (e.g., eddy current) |
| | 39 | Sound energy (e.g., ultrasonic) |
| | 40 | Radiant energy (e.g., X-ray, infrared, laser) |
| | 41 | Force or torque measurement |
| | 45 | Flow metering |
| | 50 | Fluid measurement (e.g., mass, pressure, viscosity) |
| | 51 | Leak detecting |
| | 52 | Capacitive sensor |
| | 53 | Resistive sensor |
| | 54 | Acoustic or vibration sensor |
| | 55 | Liquid level or volume determination |
| | 56 | Vibration detection |
| | 57 | Electrical signal parameter measurement system |
| | 58 | For electrical fault detection |
| | 60 | Power parameter |
| | 64 | Voltage or current |
| | 66 | Waveform analysis |
| | 67 | Display of waveform |
| | 69 | Signal quality (e.g., timing jitter, distortion, signal-to-noise ratio) |
| | 70 | Waveform extraction |
| | 71 | Waveform-to-waveform comparison |
| | 75 | Frequency |
| | 79 | Time-related parameter (e.g., pulse-width, period, delay, etc.) |
| | 80 | Specified memory location generation for storage |
| | 81 | Quality evaluation |
| | 85 | CALIBRATION OR CORRECTION SYSTEM |
| | 86 | Linearization of measurement |
| | 87 | Zeroing (e.g., null) |
| | 88 | Zero-full scaling |
| | 89 | Timing (e.g., delay, synchronization) |
| | 90 | Error due to component compatibility |
| | 92 | Direction (e.g., compass) |
| | 94 | Position measurement |
| | 96 | Speed |
| | 97 | Length, distance, or thickness |
| | 98 | Pressure |
| | 99 | Temperature |
| | 100 | Fluid or fluid flow measurement |
| | 101 | Weight |
| | 103 | Acoustic |
| | 104 | Sensor or transducer |
| | 105 | For mechanical system |
| | 106 | Signal frequency or phase correction |
| | 107 | Circuit tuning (e.g., potentiometer, amplifier) |
| | 108 | TESTING SYSTEM |
| | 109 | For transfer function determination |
| | 110 | Binary signal stimulus (e.g., pulse) |
| | 111 | Noise signal stimulus (e.g., white noise) |
| | 112 | Sinusoidal signal stimulus |
| | 113 | Of mechanical system |
| | 116 | Of sensing device |
| | 117 | Of circuit |
| | 118 | Testing multiple circuits |
| | 119 | Including program initialization (e.g., program loading) or code selection (e.g., program creation) |
| | 120 | Including input/output or test mode selection means |
| | 121 | Including multiple test instruments |
| | 122 | Including specific communication means |
