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 [Search a list of Patent Appplications for class 702]   CLASS 702,DATA PROCESSING: MEASURING, CALIBRATING, OR TESTING
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SECTION I - CLASS DEFINITION

This class provides for apparatus and corresponding methods wherein the data processing system or calculating computer is designed for or utilized in an environment relating to a specific or generic measurement system, a calibration or correction system, or a testing system.

This class is structured into four main parts:

1. Data processing for a measurement system in a specific environment.

2. Data processing for a calibration or correction system.

3. Data processing for a testing system.

4. Data processing for a generic measurement system.

See Subclass References to the Current Class for these specific subclasses.

Scope of the class:

A. MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT

This class is limited to data processing and calculating computer apparatus and corresponding methods for measuring in a specific environment. There must be significant claim recitation of the data processing system, process or calculating computer and nominal recitation of the specific environment. When significant structure of the device or process pertinent to the specific environment is claimed, classification is in the appropriate device or process class. Control system for specific application adapted for a sole purpose of measuring is classified in this class. This class does not includes data processing in combination with a specific application control system for controlling a device or apparatus (see References To Other Classes below for a generic or specific electrical computers and data processing control systems).

B. CALIBRATION OR CORRECTION SYSTEM

This class includes subject matter directed to data processing for calibration or correction system disclosed or claimed in plural art devices such as geometrical instrument, mechanical system, timing apparatus, fluid flow or fluid measurement, etc. (see References To Other Classes below).

C. TESTING SYSTEM

This class includes subject matter directed to data processing for testing system disclosed in plural art devices such as electrical circuit and components testing, sensing apparatus testing, signal converting, shaping or generating (see References To Other Classes below).

This outdent excludes a mere monitoring system for determining performance of a device or process under normal operation without subjecting the device or process to a specific testing procedure or signal.

D. GENERIC MEASUREMENT SYSTEM

This class is limited to data processing and calculating computer apparatus and corresponding methods for measuring that are not strictly adapted to one particular environment. Such apparatus and corresponding methods for measuring could extend to several different applications. There must be significant claim recitation of the data processing system, process or calculating computer. A generic control system adapted for a sole purpose of measuring is classified in this class. This class does not includes data processing in combination with a generic control system for controlling a device or apparatus (see References To Other Classes below for a generic or specific electrical computers and data processing control systems).

SECTION II - SUBCLASS REFERENCES TO THE CURRENT CLASS

SEE OR SEARCH THIS CLASS, SUBCLASS:

1,through 84, for data processing for a measurement system in a specific environment.
85,through 107, for a calibration or correction system.
108,through 126, for data processing for a testing system.
127,through 199, for data processing for a generic measurement system.

SECTION III - REFERENCES TO OTHER CLASSES

SEE OR SEARCH CLASS:

29Metal Working,   subclass 25.35 for the electrical measuring, testing or sensing of piezoelectric crystals combined with the manufacture thereof, and subclasses 25.41+ for the electrical measuring, testing or sensing of condensers combined with the manufacture thereof.
33Geometrical Instruments,   appropriate subclasses for geometrical instrument or calibration/correction thereof, subclasses 300+ for magnetic field direction sensing and indicating, and subclasses 700+ for the determination of distance.
73Measuring and Testing,   appropriate subclasses for nonelectrical measuring and testing, instrument calibrating, and for electrical measuring and testing of the following types: gas analysis by electrical thermal determination, subclasses 23.2+ ; moisture determination by conductivity, subclass 75; stress and strain gauge, subclass 760; surface and cutting edge determination by sliding pick-up subclasses 104+; subclasses 112.01 - 112.06 for turbine engine testing, 114.01 - 116.81 for internal combustion engine measuring and testing; liquid level gauge(immersible electrode type, subclass 304, float type, subclasses 305+); fluid pressure (e.g., Pirani type), subclass 755; and speed, subclasses 488+.
100Presses,   subclass 99 for presses having electrical measuring, testing, or sensing means.
166Wells,   appropriate subclasses for well processes or apparatus including measuring or testing means.
177Weighing Scales,   appropriate subclasses, particularly subclasses 25.11+ for weighing apparatus in combination with computer means.
178Telegraphy,   appropriate subclasses, particularly subclass 69 for telegraphy combined with electrical measuring, testing, or sensing.
181Acoustics,   appropriate subclasses for sound wave measurement.
198Conveyors,   subclasses 502.1+ for conveyor combined with alarm or indicator.
205Electrolysis: Processes, Compositions Used Therein, and Methods of Preparing the Compositions,   appropriate subclasses for electrolysis utilized for electrochemistry and especially subclasses 775+ as the residual home for a process of electrolytic analysis or testing, per se.
209Classifying, Separating, and Assorting Solids,   appropriate subclasses.
250Radiant Energy,   subclass 250 for wave meters for measuring the wavelength of radio or microwaves, subclass 281 for methods and apparatus for ionic separation or analysis, subclasses 302+ for fluorescent and radioactive tracer methods, subclasses 336.1+ for the detection of invisible radiation or the examination of material by invisible radiation using radiant energy responsive electric signalling means, subclasses 428+ for fluent material containing, support, or transfer means with or without an irradiating source or radiating fluent material, subclasses 453.11+ for supports for objects of irradiation, subclasses 458.1+ for luminophor irradiation, subclasses 472.1+ for nonelectric invisible radiation detectors, and subclasses 493.1+ for radiant energy generation and sources.
314Electric Lamp and Discharge Devices: Consumable Electrodes,   appropriate subclasses, particularly subclass 9 for the subject matter of that class combined with measuring, testing, or sensing.
320Electricity: Battery or Capacitor Charging and Discharging,   subclass 48 for battery charging and discharging systems having indicating, signaling, or testing means.
324Electricity: Measuring and Testing,   appropriate subclasses for testing to determine electrical properties by electrical means, or for determination of non-electrical properties by measuring electric properties, or for the measurement of electricity, per se, particularly subclasses 74+ for calibration of electric meters, subclass 130 for self-calibration, subclasses 200+ for magnetic measuring and testing, subclasses 500+ for fault testing in electrical circuits and components, and subclass 601 for calibration of impedance, admittance, or other quantities representative of electrical stimulus/response relationships.
327Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,   appropriate subclasses, particularly subclasses 100+ for signal converting, shaping, or generating, and subclasses 291+ for clock or pulse waveform generating.
330Amplifiers,   appropriate subclasses, for amplifiers, generally, which may be used in electrical measuring and testing circuits, particularly subclass 2 for amplifier condition testing or measuring.
331Oscillators,   subclass 44 for oscillator systems provided with frequency calibrating or testing means.
340Communications: Electrical,   appropriate subclasses for testing associated with a communication system.
342Communications: Directive Radio Wave Systems and Devices (e.g., Radar, Radio Navigation),   appropriate subclasses for reflected or otherwise returned radio wave energy measuring, testing, and sensing systems, such as radar and transponder systems.
348Television,   subclasses 180+ for monitoring, testing, or measuring television signals or apparatus.
356Optics: Measuring and Testing,   for measuring and testing light.
368Horology: Time Measuring Systems or Devices,   subclasses 155+ for time measuring by clocks having electrical features.
374Thermal Measuring and Testing,   appropriate subclasses for a measurement or test of a thermal quantity.
376Induced Nuclear Reactions: Processes, Systems, and Elements,   subclasses 245+ for processes or device for testing, measuring, etc., of a condition of a nuclear reactor during its operation.
378X-Ray or Gamma Ray System or Devices,   appropriate subclasses, particularly subclasses 44+ , 51+, or 70+ for X-ray systems used in testing.
379Telephonic Communications,   appropriate subclasses, particularly subclasses 1.01 through 35for telephone combined with electrical measuring, testing, or sensing.
429Chemistry: Electrical Current Producing Apparatus, Product and Process,   subclasses 90+ for battery having measuring, testing, and indicating means.
434Education and Demonstration,   appropriate subclasses, for electrical measuring, testing, or sensing in combination with education.
455Telecommunication,   appropriate subclasses for radio systems having electrical measuring, testing, or sensing means for indicating the operative condition of the radio system.
505Superconductor Technology: Apparatus, Material, Process,   subclasses 160+ for measuring or testing a system or device, and subclass 310 for a process of measuring or testing a superconductive property.
506Combinatorial Chemistry Technology: Method, Library, Apparatus,   for in silico screening of a chemical or biological library.
700Data Processing: Generic Control Systems or Specific Applications,   subclasses 1 through 89for a data processing generic control system, apparatus, or process; and subclasses 90-306 for a data processing specific application, apparatus, or process.
714Error Detection/Correction and Fault Detection/Recovery,   appropriate subclasses for error detection, correction, recovery or prevention in pulse code data or computers.

SECTION IV - GLOSSARY

CALCULATING OPERATIONS

Arithmetic or some limited logic operations performed upon or with signals representing numbers or values.

DATA PROCESSING

For the purpose of this class, data processing is defined as a systematic operation on data in accordance with a set of rules which results in a significant change in the data.

SUBCLASSES

[List of Patents for class 702 subclass 1]    1MEASUREMENT SYSTEM IN A SPECIFIC ENVIRONMENT
 This subclass is indented under the class definition.  Subject matter wherein the data processing system or calculating computer includes a measurement system or process designed for or utilized in a particular art device or application.

SEE OR SEARCH THIS CLASS, SUBCLASS:

85+,for data processing in a calibration or correction of a measurement system.
108+,for data processing in a testing system.
127+,for data processing in a generic measurement system.

SEE OR SEARCH CLASS:

33Geometrical Instruments,   appropriate subclasses.
73Measuring and Testing,   appropriate subclasses for measuring and testing apparatus or processes not found elsewhere.
324Electricity: Measuring and Testing,   appropriate subclasses for measuring or testing electricity, per se.
356Optics: Measuring and Testing,   appropriate subclasses.
358Facsimile and Static Presentation Processing,   subclass 504 for measuring, testing and calibration of natural color facsimile.
368Horology: Time Measuring System or Devices,   appropriate subclasses.
374Thermal Measuring and Testing,   appropriate subclasses.
  
[List of Patents for class 702 subclass 2]    2Earth science:
 This subclass is indented under subclass 1.  Subject matter wherein the measurement system or process is designed for or utilized in an area directed to the earth or its related sciences.

SEE OR SEARCH CLASS:

73Measuring and Testing,   subclass 784 for earth stresses measuring and testing.
405Hydraulic and Earth Engineering,   appropriate subclasses, particularly subclass 258.1 for earth treatment or control.
434Education and Demonstration,   subclasses 130+ for subject matter relating to the teaching of geography.
  
[List of Patents for class 702 subclass 3]    3Weather:
 This subclass is indented under subclass 2.  Subject matter including the study of an atmospheric phenomenon of a region (e.g., rain, storm, snow, wind, etc.).
(1) Note. This subclass includes weather forecasting.

SEE OR SEARCH CLASS:

73Measuring and Testing,   subclasses 170.16+ for meteorology.
  
[List of Patents for class 702 subclass 4]    4Lightning:
 This subclass is indented under subclass 3.  Subject matter wherein the atmospheric phenomenon is the flashing of light produced by electricity discharged in the air.

SEE OR SEARCH CLASS:

73Measuring and Testing,   subclass 170.24 for meteorologic electric disturbance (e.g., lighting).
324Electricity: Measuring and Testing,   subclasses 72+ for testing potential in specific environment (e.g., lighting stroke).
  
[List of Patents for class 702 subclass 5]    5Topography (e.g., land mapping):
 This subclass is indented under subclass 2.  Subject matter wherein the related sciences including the study of set of data related to natural or man-made features of an area (e.g., gravity data, terrain data, sea floor, etc.) to present, usually on maps or charts, their relative positions and elevations.

SEE OR SEARCH CLASS:

434Education and Demonstration,   subclasses 130+ for geography, particularly subclasses 150+ for map or terrain model.
  
[List of Patents for class 702 subclass 6]    6Well logging or borehole study:
 This subclass is indented under subclass 2.  Subject matter including a drill rigging apparatus or measuring tool for penetrating an earth formation to form a well bore or for investigating physical condition or a parameter related to the apparatus, the tool, the well bore or the earth formation.

SEE OR SEARCH CLASS:

73Measuring or Testing,   subclasses 152.01+ for bore hole and drilling testing in general.
166Wells,   subclasses 250.01+ for well processes which includes indicating, testing, measuring, or locating, and subclass 66 for well apparatus including electrical signaling means.
175Boring or Penetrating the Earth,   subclasses 40+ for a process or means of measuring combined with an earth boring means.
250Radiant Energy,   subclass 253 for invisible radiant energy detection in geological testing.
324Electricity: Measuring and Testing,   subclasses 323+ for electrical well bore testing.
340Communications: Electrical,   subclasses 853.1+ for telemetering a well bore environment.
367Communication, Electrical: Acoustic Wave Systems and Devices,   subclasses 25+ for well logging, subclasses 81+ for wellbore telemetering, and subclass 86 for borehole testing.
703Data Processing: Structural Design, Modeling, Simulation, and Emulation,   subclass 5 for analog simulator of physical phenomenon and subclass 10 for the simulation of well logging.
  
[List of Patents for class 702 subclass 7]    7By induction or resistivity logging tool:
 This subclass is indented under subclass 6.  Subject matter comprising means having transmitter and receiver coils or electrodes arranged for taking measurements, at various depth of the borehole, representing electrical characteristic of the earth formations or planar layers surrounding the borehole (e.g., conductivity, resistivity, dielectric constant).

SEE OR SEARCH CLASS:

324Electricity: Measuring and Testing,   subclasses 339+ for induction logging within a borehole.
  
[List of Patents for class 702 subclass 8]    8By radiation (e.g., nuclear, gamma, X-ray):
 This subclass is indented under subclass 6.  Subject matter comprising (a) means for irradiating the earth formation with rays containing radiation particles (i.e., alpha, beta, gamma, neutrons, photon, etc.) such as those in nuclear, gamma, X-ray, etc. and (b) means for detecting and processing resultant signals for logging measurements.

SEE OR SEARCH THIS CLASS, SUBCLASS:

28,for molecular structure or composition determination using radiant energy.
40,for flaw or defect detection using radiant energy.
49,for flow metering using radiant energy.
134+,for a temperature measuring system using radiant energy.
172,for a thickness or width measurement system using radiant energy.

SEE OR SEARCH CLASS:

250Radiant Energy,   appropriate subclasses.
324Electricity: Measuring and Testing,   subclasses 332+ and 344+ for measuring and testing of geophysical surface or subsurface with radiant energy or non-conductive type transmitter and receiver, respectively.
  
[List of Patents for class 702 subclass 9]    9Drilling:
 This subclass is indented under subclass 6.  Subject matter including borehole equipment having a movable tool for penetrating through the subterranean formations of the earth to make a long cylindrical hollow to obtain particular parameters of interest.
(1) Note. This subclass includes measuring-while-drilling (MWD) apparatus in which measurements are received during drilling.

SEE OR SEARCH CLASS:

73Measuring or Testing,   subclass 152.03 for formation logging during drilling, and subclasses 152.43+ for measuring and testing during drilling.
166Wells,   subclasses 250.01+ for well processes which include indicating, testing, measuring, or locating, and subclass 66 for well apparatus including electrical signaling means.
175Boring or Penetrating the Earth,   subclasses 40+ for a process or means of measuring combined with an earth boring means.
  
[List of Patents for class 702 subclass 10]    10Dipmeter:
 This subclass is indented under subclass 6.  Subject matter comprising means for determining a dip angle or dip direction of subsurface formations intercepted by a well borehole.

SEE OR SEARCH THIS CLASS, SUBCLASS:

11,for the determination of physical property related to earth formation.
  
[List of Patents for class 702 subclass 11]    11Formation characteristic:
 This subclass is indented under subclass 6.  Subject matter comprising detail of means for determining physical properties (temperature, pressure, fracture, etc.) related to the earth formations.

SEE OR SEARCH THIS CLASS, SUBCLASS:

10,for dipmeter.

SEE OR SEARCH CLASS:

73Measuring or Testing,   subclasses 152.02+ for formation logging.
166Wells,   subclasses 250.01+ for well processes which include indicating, testing, measuring, or locating, and subclass 66 for well apparatus including electrical signaling means.
175Boring or Penetrating the Earth,   subclass 50 for indicating, testing, or measuring a condition of formation.
  
[List of Patents for class 702 subclass 12]    12Fluid flow investigation:
 This subclass is indented under subclass 11.  Subject matter comprising means for evaluating fluid flow controlling parameters or properties (e.g., porosity, permeability, etc.) related to the nature and movement of a flowing fluid in the well bore or from a potential producing zone in the earth formations.

SEE OR SEARCH THIS CLASS, SUBCLASS:

45+,for flow metering.
50+,for fluid measurement.
100,for calibration of fluid or flow measurement.
114,for testing of a pneumatic or hydraulic system.

SEE OR SEARCH CLASS:

73Measuring or Testing,   subclass 38 for porosity or permeability, and subclasses 152.18+ for flow study in borehole or drilling.
166Wells,   subclass 252.5 for well processes which include determination of permeability or viscosity.
175Boring or Penetrating the Earth,   subclass 50 for indicating, testing, or measuring a condition of formation.
700Data Processing: Generic Control Systems or Specific Applications,   subclass 281 for fluid level or volume control and subclasses 282-285 for flow control.
  
[List of Patents for class 702 subclass 13]    13Hydrocarbon prospecting:
 This subclass is indented under subclass 12.  Subject matter wherein means for evaluating includes means for determining the location or volume of an accumulation of hydrocarbon deposits within the potential producing zone.
  
[List of Patents for class 702 subclass 14]    14Seismology:
 This subclass is indented under subclass 2.  Subject matter comprising means for detecting and recording a seismic reflected or refracted signal representative of earth vibrations.

SEE OR SEARCH CLASS:

181Acoustics,   subclasses 108+ for mechanical seismic sources and detectors and subclass 113 for seismic wave generation.
250Radiant Energy,   subclasses 253+ for geophysical exploration or irradiation by the use of invisible radiant energy.
324Electricity: Measuring and Testing,   subclasses 323+ for geophysical surface or subsurface exploration in situ which includes electrical testing.
367Communication, Electrical: Acoustic Wave Systems and Devices,   subclasses 14+ for geophysical exploration by the use of seismic waves, subclasses 87+ for geophysical exploration by the use of compressional waves and subclasses 140+ for geophysical vibration transducers.
703Data Processing: Structural Design, Modeling, Simulation, and Emulation,   subclass 5 for analog simulator of physical phenomenon.
  
[List of Patents for class 702 subclass 15]    15Earthquake or volcanic activity:
 This subclass is indented under subclass 14.  Subject matter including a seismic strong-motion recording means for monitoring or exploring shaking of the earth or a volcanic phenomenon.

SEE OR SEARCH CLASS:

73Measuring and Testing,   subclass 784 for measuring and testing of earth stress.
  
[List of Patents for class 702 subclass 16]    16Specific display (e.g., mapping, profiling):
 This subclass is indented under subclass 14.  Subject matter including (a) means for carrying out a series of steps in a sequence (e.g., mapping, profiling, etc.) to generate a visual presentation of data or (b) structural details of means for displaying data.

SEE OR SEARCH THIS CLASS, SUBCLASS:

5,for topography (e.g.,land mapping).
67+,for display of a measured waveform.

SEE OR SEARCH CLASS:

345Computer Graphics Processing and Selective Visual Display Systems,   appropriate subclasses.
367Communications, Electrical: Acoustic Wave Systems and Devices,   subclasses 68+ for display systems in land-reflection type seismic prospecting.
  
[List of Patents for class 702 subclass 17]    17Filtering or noise reduction/removal:
 This subclass is indented under subclass 14.  Subject matter comprising means for removing certain frequency components of the seismic signal or means for lessening or eliminating disturbance in the seismic signal.

SEE OR SEARCH THIS CLASS, SUBCLASS:

111,for a testing system having noise signal stimulus.
191+,for signal extraction or separation including filtering or noise eliminating, and particularly subclass 195 for noise removal or extraction by subtracting noise component.

SEE OR SEARCH CLASS:

327Miscellaneous Active Electrical Nonlinear Devices, Circuits, and Systems,   subclasses 551+ for unwanted signal suppression.
367Communications, Electrical: Acoustic Wave Systems and Devices,   subclasses 43+ for filters in land-reflection type seismic prospecting.
  
[List of Patents for class 702 subclass 18]    18Velocity of seismic wave:
 This subclass is indented under subclass 14.  Subject matter comprising means for measuring seismic wave parameter over time to compute speed of propagation of seismic wave.
  
[List of Patents for class 702 subclass 19]    19Biological or biochemical:
 This subclass is indented under subclass 1.  Subject matter wherein the data processing system or calculating computer is designed for or utilized in a measurement system directed to an environment of life or chemical compound or process in a living system.

SEE OR SEARCH THIS CLASS, SUBCLASS:

22+,for measurement system in chemical environment.

SEE OR SEARCH CLASS:

435Chemistry: Molecular Biology and Microbiology,   appropriate subclasses.
504Plant Protecting and Regulating Compositions,   appropriate subclasses.
506Combinatorial Chemistry Technology: Method, Library, Apparatus,   for in silico screening of a chemical or biological library.
700Data Processing: Generic Control Systems or Specific Applications,   subclasses 266 through 274for chemical process control or monitoring systems.
  
[List of Patents for class 702 subclass 20]    20Gene sequence determination:
 This subclass is indented under subclass 19.  Subject matter including a chemical process which determines genetic information including the chains of a set of sequencing fragments (e.g., DNA sequence information) used to define identity of biological species.

SEE OR SEARCH CLASS:

935Genetic Engineering: Recombinant DNA Technology, Hybrid or Fused Cell Technology, and Related Manipulations of Nucleic Acids,   appropriate subclasses.
  
[List of Patents for class 702 subclass 21]    21Cell count or shape or size analysis (e.g., blood cell):
 This subclass is indented under subclass 19.  Subject matter comprising a measuring means for determining quantity, geometric, or proportional dimensions of a particular biological particle.

SEE OR SEARCH CLASS:

382Image Analysis,   subclasses 133+ for cell analysis, classification, or counting.
  
[List of Patents for class 702 subclass 22]    22Chemical analysis:
 This subclass is indented under subclass 1.  Subject matter including means for analyzing a sample through study of its chemical aspect.

SEE OR SEARCH THIS CLASS, SUBCLASS:

19+,for measurement system in biological or biochemical application.

SEE OR SEARCH CLASS:

71Chemistry: Fertilizers,   appropriate subclasses.
204Chemistry: Electrical and Wave Energy,   appropriate subclasses.
260Chemistry of Carbon Compounds,   appropriate subclasses.
423Chemistry of Inorganic Compounds,   appropriate subclasses.
436Chemistry: Analytical and Immunological Testing,   appropriate subclasses.
506Combinatorial Chemistry Technology: Method, Library, Apparatus,   for in silico screening of a chemical or biological library.
700Data Processing: Generic Control Systems or Specific Applications,   subclasses 266 through 274for chemical process control or monitoring systems.
  
[List of Patents for class 702 subclass 23]    23Quantitative determination (e.g., mass, concentration, density):
 This subclass is indented under subclass 22.  Subject matter comprising means to determine an amount or proportion of a component in the sample.
  
[List of Patents for class 702 subclass 24]    24Gaseous mixture (e.g., solid-gas, gas-liquid, gas-gas):
 This subclass is indented under subclass 23.  Subject matter wherein the component is a constituent in a solid-gas, gas-liquid, or gas-gas mixture.
(1) Note. The constituent may include solid, liquid, or agent gas.

SEE OR SEARCH CLASS:

73Measuring or Testing,   subclasses 23.2+ for gas analysis, and subclasses 19.01+ for gas content of a liquid or solid.
  
[List of Patents for class 702 subclass 25]    25Liquid mixture (e.g., solid-liquid, liquid-liquid):
 This subclass is indented under subclass 23.  Subject matter wherein the component is a constituent that a solid-liquid or a liquid-liquid mixture.
(1) Note. The constituent may include solid or liquid.

SEE OR SEARCH CLASS:

73Measuring or Testing,   subclasses 53.01+ for liquid analysis or analysis of the suspension of solids in a liquid.
  
[List of Patents for class 702 subclass 26]    26By particle count:
 This subclass is indented under subclass 23.  Subject matter wherein the amount or proportion of the component is determined by totalizing quantity of particles in the component.

SEE OR SEARCH CLASS:

377Electrical Pulse Counters, Pulse Dividers, or Shift Registers: Circuits And Systems,   subclasses 1+ for application, particularly subclasses 10+ for field of view contains plural entities or entities scanned plural times, and subclasses 19+ for measuring or testing.
  
[List of Patents for class 702 subclass 27]    27Molecular structure or composition determination:
 This subclass is indented under subclass 22.  Subject matter comprising means to determine structure of a sample on the molecular level or means to identify different components making up an unknown sample.
  
[List of Patents for class 702 subclass 28]    28Using radiant energy:
 This subclass is indented under subclass 27.  Subject matter comprising a radiation source (e.g., X-ray, infrared light source, spectrophotometer) for irradiating the sample with a beam to determine its structure or composition.

SEE OR SEARCH THIS CLASS, SUBCLASS:

8,for well logging or borehole by radiation.
40,for flaw or defect detection by radiant energy.
49,for flow metering using radiant energy.
134+,for temperature measuring system by radiant energy.
172,for thickness or width measurement system using radiant energy.

SEE OR SEARCH CLASS:

250Radiant Energy,   subclasses 339.12+ for invisible radiant energy responsive electric signalling using sample absorption for chemical composition analysis.
  
[List of Patents for class 702 subclass 29]    29Particle size determination:
 This subclass is indented under subclass 22.  Subject matter wherein means for analyzing the sample includes means for generating signals having amplitude proportional to the size of respective particles of the sample.

SEE OR SEARCH CLASS:

377Electrical Pulse Counters, Pulse Dividers, or Shift Registers: Circuits and Systems,   subclasses 1+ for application, particularly subclass 11 for field of view contains plural entities or entities scanned plural times including particle size determination variations, and subclasses 19+ for measuring or testing.
  
[List of Patents for class 702 subclass 30]    30Chemical